Top 569 cen tc 124 ds PDF Book Page 12

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Characterization of High Tc Materials and Devices by Electron Microscopy

Nigel D. Browning, Stephen J. Pennycook
·407 Pages
·2000
·13.472 MB

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Discovery Science: 14th International Conference, DS 2011, Espoo, Finland, October 5-7, 2011. Proceedings

Yoshua Bengio, Olivier Delalleau (auth.), Tapio Elomaa, Jaakko Hollmén, Heikki Mannila (eds.)
·391 Pages
·2011
·10.476 MB

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