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X-Ray Microscopy and Spectromicroscopy: Status Report from the Fifth International Conference, Würzburg, August 19–23, 1996

W. Meyer-Ilse, H. Medecki, J. T. Brown, J. M. Heck, E. H. Anderson, A. Stead, T. Ford (auth.), Dr. Jürgen Thieme, Professor Dr. Günter Schmahl, Dr. Dietbert Rudolph, Professor Dr. Eberhard Umbach (eds.)
·382 Pages
·1998
·24.444 MB

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Calculated K, L and M-shell X-ray line intensities for light ion impact on selected targets from Z=6 to 100

Jagoda Crawford, David Cohen, Greg Doherty, Armand Atanacio
·78 Pages
·2011
·0.639 MB