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About X-ray diffraction imaging: technology and applications
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Detailed Information
| Author: | Greenberg, Joel Alter; Iniewski, Krzysztof |
|---|---|
| Publication Year: | 2019 |
| ISBN: | 1138387029 |
| Pages: | 279 |
| Language: | English |
| File Size: | 11.811 |
| Format: | |
| Price: | FREE |
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