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Transmission Electron Microscopy: Physics of Image Formation, 5th ed. (Springer Series in Optical Sciences 36) PDF

602 Pages·2008·5.205 MB·English
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by L. Reimer, H. Kohl| 2008| 602 pages| 5.205| English

About Transmission Electron Microscopy: Physics of Image Formation, 5th ed. (Springer Series in Optical Sciences 36)

Transmission Electron Microscopy presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray micronanalysis and electron energy-loss spectroscopy are treated as analytical methods. Specimen damage and contamination by electron irradiation limits the resolution for biological and some inorganic specimens. This fifth edition includes discussion of recent progress, especially in the area of aberration corrector, and energy filtering; moreover the new topics of the fourth edition have been updated again.

Detailed Information

Author:L. Reimer, H. Kohl
Publication Year:2008
ISBN:387400931
Pages:602
Language:English
File Size:5.205
Format:PDF
Price:FREE
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