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About Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications
Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry.From a Review of the First Edition (edited by Bubert and Jenett)"... a useful resource..."(Journal of the American Chemical Society)
Detailed Information
| Author: | Gernot Friedbacher, Henning Bubert |
|---|---|
| Publication Year: | 2011 |
| ISBN: | 9783527320479 |
| Pages: | 559 |
| Language: | English |
| File Size: | 12.597 |
| Format: | |
| Price: | FREE |
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