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Soft Errors in Modern Electronic Systems PDF

330 Pages·2011·3.679 MB·English
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by Tino Heijmen (auth.), Michael Nicolaidis (eds.)| 2011| 330 pages| 3.679| English

About Soft Errors in Modern Electronic Systems

Soft Errors in Modern Electronic Systems describes the state-of-the-art developments and open issues in the field of soft errors. This work not only highlights a comprehensive presentation of soft errors related issues and challenges but also presents the most efficient solutions, methodologies and tools. The eleven chapters written by highly qualified experts provide a comprehensive description of the complex chain of the physical processes leading to the occurrence of soft errors, as well as of the numerous techniques and tools enabling the SER qualification of electronic systems during the design phase and after production, including: nuclear reactions of cosmic rays with the atmosphere (neutron and proton generation at ground level); nuclear reactions of atmospheric neutrons and protons with die atoms (secondary particles generation); coulomb interaction (ionization); device physics (charge collection); electrical simulation; event driven simulation; logic domain simulation; RTL simulation; hardware emulation, and radiation testing. The book also provides a comprehensive description of various hardware and software techniques enabling soft-error mitigation at moderate cost. Soft Errors in Modern Electronic Systems is a useful book for circuit and system designers, researchers, students and professors.

Detailed Information

Author:Tino Heijmen (auth.), Michael Nicolaidis (eds.)
Publication Year:2011
ISBN:9781441969927
Pages:330
Language:English
File Size:3.679
Format:PDF
Price:FREE
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