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About Scanning Probe Microscopy (2 vol. set): Electrical and Electromechanical Phenomena at the Nanoscale
Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography.
Detailed Information
| Author: | Sergei V. Kalinin |
|---|---|
| Publication Year: | 2006 |
| ISBN: | 3019753597 |
| Pages: | 1002 |
| Language: | English |
| File Size: | 37.696 |
| Format: | |
| Price: | FREE |
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