Residual Phase Noise and AM Noise Measurement Techniques

118 Pages·2017·13.61 MB·English

Residual Phase Noise
and AM Noise
Measurement Techniques
F/,"JI
HEWLETT
~~ PACKARD
Printed in USA
(D Cop.Hight: .1!)90 Hewl<'tt-Packa.rcl Cornpan_,· . .'\II riµ;h1s n•sN,·Pd
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Acknowledgements
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This manual is based on the technical paper "Residual Phase Noise and AM Noise
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Measurement Techniques" by Thomas R. Faulkner and Robert E. Temple.
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Contents
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from tex.if on Fri Mar 02 16:04:55 1990 , HP Tag, version A.0l.20K (0215)
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"" 1. General Information
~ What is residual two-port noise? . . . . . . . . . . . 1-1
~ Why are residual and AM noise measurements important? 1-2
~ HP 3048A Description . . . . . . . . . . . . . . . . 1-3
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2. Residual Phase Noise Measurement
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Basic Phase Noise Measurement Theory 2-1
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Region of Validity of @L(f) S<f>(f)/2 . . 2-2
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Conversion Between Sef>(f) and Sv(f) . . . . . . . 2-3
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Residual Phase Noise Measurement: Ba.sic Assumptions . . . . 2-5
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Steps for Making Residual Phase Noise Measurements . . . . . 2-6
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Choosing a Calibration Method . . . . . . . . . . 2-7
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Method 1: User entry of phase detector constant 2-7
~ Method 2: Measured + /- de peak voltage 2-8
~ Method 3: Measured Beatnote 2-9
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~ . Method 4: Double-Sided Spur . . . . . 2-10
~ Method 5: Single-Sided Spur . . . . . . . ... 2-11
~ Calibration and Measurement General Guidelines . 2-11
Calibration and Measurement Procedures 2-14
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Method 1: User entry of phase detector constant 2-14
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Method 2: Measured+/- DC Peak Voltage 2-17
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Method 3: Measured Beatnote Method 2-18
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Method 4: Double-sided Spur . . . . . . . 2-21
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Method 5: Single-Sided Spur Method . . . . 2-24
~ Residual Phase Noise Measurement Examples 2-27
~ System Noise Floor Measurement 2-27
~ Initial Setup 2-27
(l?I Conditions . . . . . . . . . 2-28
~ Results . . . . . . . . . . 2-28
Amplifier Noise and Dynamic Noise Figure Measurement . 2-30
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Initial Setup 2-30
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Conditions . . . . . . . . . . . . . . . . . . . 2-31
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Results . . . . . . . . . . . . . . . . . ... 2-31
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Measurement of a Device with Large Time Delay ( T) 2-33
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Initial Setup 2-33
~ Conditions . . . . . . . . . .. 2-34
~ Results . . . . . . . . . . . . 2-35
~ lVIea.surement of a Crystal Resonator 2-37
~ Initia.1 Setup . . . . . . . . . . 2-:J,
~ Condit.ions . . . . . . . . . . . 2-:JX
~ rvieas11ring th<• Nois<' Floor of I h<' Test SC't.11p. 2-:Jx
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Measuring the Crystal Resonator . . . . . . 2-39
Results of the Setup Noise Floor Measurement 2-39 ~ ~
Results of the Crystal Resonator Measurement .. 2-39 ~
Measurement of a Low-Noise Phase Modulator 2-42 ~
Initial Setup 2-42 ~
Conditions . . . . . . . . . . . . . 2-42 ~
Results . . . . . . ............. . 2-43
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Residual Noise of a Frequency Synthesizer 2-45
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Initial Setup . . . . . . 2-45
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Conditions . . . . . . . . . . . . . 2-46
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Results . . ........... . 2-46
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Residual Noise of a Comb Generator Multiplier 2-48
Initial Setup . . . . 2-48 ~
Conditions . . . . . . . . . . . . . . . . . . . 2-49 ~
Results . . . . . . . . . . . . . . . . 2-49 ~
Measurement of a Device Using an External Phase Detector 2-51 ~
Initial Setup . . . . . . . . 2-51 ~
Conditions . . . . . 2-52 ~
Results .... 2-52
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3. AM-Source Noise Measurement
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AM-Noise Measurement Theory of Operation .. 3-1
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Basic Noise Measurement 3-1
Phase Noise Measurement . . . . . . . . . 3-1 ~
Amplitude Noise Measurement . . . . . . . 3-2 ~
AM Noise Measurement System Block Diagram . 3-2 ~ ~
AM Detector . . . . . . . . . . . . . 3-3 ~
AM Detector Specifications . . . . . . . . . 3-3 ~
AM Detector Considerations . . . . . . . . . 3-3 ~
Steps for Making AM Noise Measurements . 3-4
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Choosing a Calibration Method . . . . . . 3-6
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Method 1: User entry of phase detector constant 3-6
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Method 1, Example 1 ... 3-6
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Method 1, Example 2 . . . . 3-6
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Method 2: Double Sided Spur 3-7
Method 2, Example 1 ... . 3-7 ~
Method 2, Example 2 .. . 3-7 ~
Method 3: Single-Sided-Spur Method 3-7 ~
Calibration and Measurement General Guidelines . 3-8 ~
Calibration and Measurement Procedures . . . . 3-9 ~
Method 1: User Entry of Phase Detector Constant 3-9
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Method 1, example 1 . . . . . . . 3-9
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Method 1, Example 2 . . . . . . . . 3-11
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Method 2: Double-Sided Spur Method . 3-12
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Method 2, Example 1 ..... . 3-12
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Method 2, Example 2 . . . . . . 3-13
Method :3: Single-Sided-Spur Met.hod :3-15 ~
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Contents-2
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3. Measurement Techniques
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Dummy page . 3-16
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Examples of AM Noise Measurements 3-17
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Measurement of a Source with AM 3-17
~ Initial Setup 3-17
~ Conditions 3-18
~ Results 3-18
~ Measurement Of A Source Without AM 3-20
"' Initial Setup . . 3-20
Conditions . . 3-20
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Results 3-21
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Measurement of a Microwave Source without AM Modulation 3-23
~ Initial Setup . 3-23
~ Conditions . . 3-24
~ Results . 3-24
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~ 4. Baseband Noise Measurements
~ Measurement Considerations 4-1
Steps for Making Baseband Noise Measurements 4-1
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A. Calculation of Source Noise Attenuation
~ Source Noise Attenuation versus Carrier Offset and Time Delay . . . A-1
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,f,f.". B. Noise Figure Versus Dynamic Noise Figure
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D. Carrier-to-Sideband Modulation Equations
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AM Carrier-to-Modulation Sideband Ratio . D-1
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Example ............. . D-1
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M Carrier-to-Modulation Sideband Ratio D-1
~ Example .............. . D-1
~ FM Carrier-to-Modulation Sideband Ratio . D-2
~ Example .............. . D-2
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fl" E. Common Equipment Used in RF Noise Measurements
-Sources . . . . . . . . ... E-1
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Spectrum Analyzers . . E-1
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Modulation Analyzers . E-2
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Power Meters . . . E-2
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Diode Detectors E-2
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AM Detector . E-2
~ DC Block E-2
~ Attenuators E-3
(t!Jti Amplifiers . E-3
~ Phase Shifters E-3
~ 0° Power Splitters . E-~1
Couplers . . . . . E-4
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Instrument. Suppliers I·>I
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F. Components of the Phase Noise Accessory Kits
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Components for Residual Measurements . F-1 ~
Miscellaneous Components . . . . . F-3 ~
Cables . . . . .... F-3 ~
Adapters ........ . F-4 ~
Case Layout . . . . . . . F-5 ~
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G. HP 3048A Options K21, K22, and K23 Specifications
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HP 3048A Option K21 AM Detector Filter . . . G-1
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HP 3048A Option K22 AM Dual RF Amplifier . G-2
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HP 3048A Option K23 AM DC Blocking Filter . G-3
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Contents-4
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General Information
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What is residual two-port noise?
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Residual two-port noise is the noise added to a signal when the signal is processed by a
~ two-port device. Such devices include: amplifiers, dividers, filters, mixers, multipliers,
~ phase-locked loop synthesizers and any other two-port electronic network. Residual two-port
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Residual two-port noise is the sum of two basic noise mechanisms:
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1. Additive noise: This noise is generated by the two-port device, at or near the signal
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frequency, which adds in a linear fashion to the signal.
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~ Figure 1-1. Additive Noise Components
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2. Multiplicative noise: This noise has at least two mechanisms. The first is an intrinsic,
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direct, phase modulation with a } spectral density, the origin of which is unknown.
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The second, in the case of amplifiers or multipliers, is noise which may modulate an RF
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signal by the multiplication of baseband noise with the signal. -This mixing is due to
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non-linearities in the two-port network. The baseband noise may be produced by the active
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devices of the internal network, or ma.y come from low-frequency noise on the signal or
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power supply.
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General Information 1-1
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DEVICE ~
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SOURCE
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· MIXED AROUNO
TH£ SIGNAL
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BAS£ BAND
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Figure 1-2. Multiplicative Noise Components ~
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Why are residual and AM noise measurements important?
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• In recent years it has become apparent to primary contractors that to ensure overall system
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noise performance, residual noise must be specified for all subsystems.
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• The absolute noise of an oscillator is set by the residual noise of the active device, the
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residual noise of the resonator, and the bandwidth of the resonator.
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• Oscillator noise is degraded by the residual noise of all the devices that follow it: amplifiers, I ~
dividers, filters, mixers, multipliers, phase-locked loops, synthesizers, and so forth.
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• AM noise is important in generators for residual phase-noise testing or adjacent-channel ~
receiver testing. ~
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• Any active or non-linear device produces some level of AM to ~M noise conversion. This
AM can contribute to the residual phase noise. This includes AM noise in phase detectors. ~
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• When troubleshooting unsatisfactory phase noise performance, it may be necessary to
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measure both the AM noise and the residual ~ M noise of the system components to locate
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the problem.
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1-2 General Information
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HP 3048A Description
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The HP 3048A provides you standard process for measuring phase noise. It allows you to
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measure sources of many types with a flexible system configuration.
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The HP 3048A Phase Noise Measurement System includes the following instruments and
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accessories.
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~ • The HP 11848A Phase Noise Interface, an interface box specifically designed for high
performance phase noise measurements. The HP 11848A supports several measurement
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techniques for phase noise and AM noise measurement. Built into the interface are phase
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detectors, amplifiers, filters, and switches necessary to measure phase noise over a frequency
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range of 5 MHz to 18 GHz. An input for an external phase detector outside the above
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mentioned frequency range is also provided. Internal sources are provided to allow the
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system to functionally check all of its signal handling circuits ensuring proper operation
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• The HP 3561A Dynamic Signal Analyzer, a Fast Fourier Transform analyzer of a wide
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frequency range (125 µHz to 100 kHz). The HP 3561A has built-in data averaging
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capabilities, large dynamic range, and fast measurement speed which make it ideal for
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quantifying demodulated phase noise (noise voltages).
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• Measurement software, a program that includes all drivers necessary to run both standard
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and optional instruments of the HP 3048A system.
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(!!' • Operator's Training, a training course that explains all of the operating modes and
measurement techniques of the HP 3048A, when each technique is appropriate, and how to
~~ analyze the measured data.
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General Information 1-3
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