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About Radiation effects and soft errors in integrated circuits and electronic devices
This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal–oxide–semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.
Detailed Information
| Author: | Daniel M. Fleetwood, R. D. Schrimpf |
|---|---|
| Publication Year: | 2004 |
| ISBN: | 9789812389404 |
| Pages: | 297 |
| Language: | English |
| File Size: | 16.734 |
| Format: | |
| Price: | FREE |
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