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b2530 International Strategic Relations and China’s National Security: World at the Crossroads
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Published by
World Scientific Publishing Co. Pte. Ltd.
5 Toh Tuck Link, Singapore 596224
USA office: 27 Warren Street, Suite 401-402, Hackensack, NJ 07601
UK office: 57 Shelton Street, Covent Garden, London WC2H 9HE
Library of Congress Control Number: 2021936018
British Library Cataloguing-in-Publication Data
A catalogue record for this book is available from the British Library.
PRACTICAL ELECTRON MICROSCOPY OF LATTICE DEFECTS
Copyright © 2021 by World Scientific Publishing Co. Pte. Ltd.
All rights reserved. This book, or parts thereof, may not be reproduced in any form or by any means,
electronic or mechanical, including photocopying, recording or any information storage and retrieval
system now known or to be invented, without written permission from the publisher.
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is not required from the publisher.
ISBN 978-981-123-469-9 (hardcover)
ISBN 978-981-123-470-5 (ebook for institutions)
ISBN 978-981-123-471-2 (ebook for individuals)
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Preface
Transmission electron microscopy (TEM) is now well established as
a powerful tool for material characterization. Therefore, it is too
natural that many textbooks on TEM for material characterization
have been published. However, these textbooks are not necessarily
suitable for beginners because it is presumed that their readers are
familiar with dislocation theory and crystallography. Textbooks on
crystallography are very comprehensive and it is neither easy nor
necessary for ordinary readers of material science and engineering to
understand crystallography in general. Similar thing can be said for
dislocation theory.
The main aim of this book is to explain standard knowledge of
diffraction contrast to characterize material defects, especially dis-
locations by transmission electron microscopy to those who have no
knowledgeofcrystallographynordislocationtheory.Therefore,those
readers who have knowledge of crystallography and dislocation the-
ory can skip Chapters 1 to 3.
For these reasons, I have tried to explain basis of diffraction con-
trast as simply as possible, at the cost of strictness. Dynamical the-
ory of diffraction is mentioned only briefly. On the other hand, scan-
ningtransmissionelectronmicroscopy(STEM),whichwasdeveloped
over thepastdecades,hasgained importanceincharacterizing mate-
rial defects. However, most of the textbooks dealing with STEM are
devoted to ultra-high-resolution observation of individual atoms (or
v
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vi Preface
atom columns) and very few textbooks deal with theory of diffrac-
tion contrast in STEM. Furthermore, large area convergent beam
electron diffraction (LACBED) is an important technique to deter-
mine absolute values of Burgers vectors, the most important issue
in dislocation theory, and has been applied to 4H-SiC and GaN suc-
cessfully. Therefore, LACBED is described in some detail.
It is emphasized that the readers would be able to publish their
papers in internationally renown scientific journals with knowledge
they obtain from this book.
Hiroyasu Saka
Nagoya 2020
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About the Author
Hiroyasu Saka is Professor Emeritus of
Nagoya University since 2005. He is currently
a visiting Professor at Aichi Institute of Tech-
nology since 2011. He was Professor of Quan-
tumEngineeringatNagoya University between
1988 and 2005. He received his Ph.D. degree
in Metallurgical Engineering from Nagoya Uni-
versity in 1972. He is an Emeritus Fellow of
the Japan Institute of Metals and Materials
since2005. HeisalsoamemberoftheJapanese
Society of Microscopy since 1966.
vii
b2530 International Strategic Relations and China’s National Security: World at the Crossroads
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Acknowledgments
The original Japanese versions of this textbook ( ;
Editions 1 and 2) have been published by Uchida-Rokakuho
( ). I am indebted to Uchida-Rokakuho ( )
for kindly permitting the English version to be published by World
Scientific Publishing Co.
I am particularly grateful to Hiroyuki Iwata of Aichi Insti-
tute of Technology without whose contribution it would have been
impossible to write Chapters 10 and 11. Experiments described in
these two chapters were carried out using an electron microscope
JEM-2100plus, which was installed in Aichi Institute of Technol-
ogy through the Ministry of Education, Culture, Sports,Science and
Technology of Japan. I am also indebted to D. Cherns and K. Tsuda
for the discussion on LACBED.
Finally, I am indebted to H. Fujita, N. Sumida, M. Nemoto,
Y. Miura, F. Nagata, K. Kuroda,U. Enokido, K. Sasaki, Y. Kaneko,
Moon-Hi HONG, J. van Landuyt, S. Onda and E. Johnson for pro-
viding and permitting publishing of TEM micrographs.
ix
