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About Power-Constrained Testing of VLSI Circuits (Frontiers in Electronic Testing)
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Detailed Information
Author: | Nicola Nicolici, Bashir M. Al-Hashimi |
---|---|
Publication Year: | 2000 |
ISBN: | 9781402072352 |
Pages: | 191 |
Language: | English |
File Size: | 10.56 |
Format: | |
Price: | FREE |
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