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Pattern Recognition: 32nd DAGM Symposium, Darmstadt, Germany, September 22-24, 2010. Proceedings PDF

590 Pages·2010·22.322 MB·English
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Author:David Gallup, Marc Pollefeys, Jan-Michael Frahm (auth.), Michael Goesele, Stefan Roth, Arjan Kuijper, Bernt Schiele, Konrad Schindler (eds.)
Publication Year:2010
ISBN:9783642159862
Pages:590
Language:English
File Size:22.322
Format:PDF
Price:FREE
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