Table Of ContentOPTICS FOR
MATERIALS SCIENTISTS
OPTICS FOR
MATERIALS SCIENTISTS
Myeongkyu Lee, PhD
Apple Academic Press Inc. Apple Academic Press Inc.
3333 Mistwell Crescent 1265 Goldenrod Circle NE
Oakville, ON L6L 0A2 Palm Bay, Florida 32905
Canada USA
© 2020 by Apple Academic Press, Inc.
Exclusive worldwide distribution by CRC Press, a member of Taylor & Francis Group
No claim to original U.S. Government works
International Standard Book Number-13: 978-1-77188-757-1 (Hardcover)
International Standard Book Number-13: 978-0-42942-535-6 (eBook)
All rights reserved. No part of this work may be reprinted or reproduced or utilized in any form or by any
electric, mechanical or other means, now known or hereafter invented, including photocopying and record-
ing, or in any information storage or retrieval system, without permission in writing from the publisher or its
distributor, except in the case of brief excerpts or quotations for use in reviews or critical articles.
This book contains information obtained from authentic and highly regarded sources. Reprinted material is
quoted with permission and sources are indicated. Copyright for individual articles remains with the authors
as indicated. A wide variety of references are listed. Reasonable efforts have been made to publish reliable
data and information, but the authors, editors, and the publisher cannot assume responsibility for the validity
of all materials or the consequences of their use. The authors, editors, and the publisher have attempted to
trace the copyright holders of all material reproduced in this publication and apologize to copyright holders
if permission to publish in this form has not been obtained. If any copyright material has not been acknowl-
edged, please write and let us know so we may rectify in any future reprint.
Trademark Notice: Registered trademark of products or corporate names are used only for explanation
and identification without intent to infringe.
Library and Archives Canada Cataloguing in Publication
Title: Optics for materials scientists / Myeongkyu Lee, PhD.
Names: Lee, Myeongkyu, author.
Description: Includes bibliographical references and index.
Identifiers: Canadiana (print) 20190088117 | Canadiana (ebook) 20190088125 |
ISBN 9781771887571 (hardcover) | ISBN 9780429425356 (ebook)
Subjects: LCSH: Optics. | LCSH: Materials science.
Classification: LCC QC355.3 .L44 2019 | DDC 535.02/462011—dc23
Library of Congress Cataloging-in-Publication Data
Names: Lee, Myeongkyu, author.
Title: Optics for materials scientists / Myeongkyu Lee, PhD.
Description: Toronto ; New Jersey : Apple Academic Press, 2020. | Includes bibliographical
references and index.
Identifiers: LCCN 2019014399 (print) | LCCN 2019017540 (ebook) | ISBN 9780429425356
(ebook) | ISBN 9781771887571 (hardcover : alk. paper)
Subjects: LCSH: Optics. | Optical materials.
Classification: LCC QC355.3 (ebook) | LCC QC355.3 .L44 2020 (print) | DDC 535--dc23
LC record available at https://lccn.loc.gov/2019014399
Apple Academic Press also publishes its books in a variety of electronic formats. Some content that appears
in print may not be available in electronic format. For information about Apple Academic Press products, visit
our website at www.appleacademicpress.com and the CRC Press website at www.crcpress.com
About the Author
Myeongkyu Lee, PhD
Myeongkyu Lee, PhD, is currently a professor in the Department of Materials
Science and Engineering at Yonsei University in Seoul, Korea. Formerly, he
was a researcher at the National Institute for Materials Science, Japan, and
a Postdoctoral Fellow in the Department of Electrical Engineering, Stanford
University, California, where he received his PhD. Dr. Lee’s research inter-
ests include dye-sensitized solar cell, non-lithographic thin-film patterning
for electronics, transparent electrode, diffractive optics and holography, and
laser materials processing. He is a member of several academic societies,
including the Materials Research Society (MRS), the European Materials
Research Society (E-MRS), and the Optical Society of America (OSA), and
he is the former editor of Electronic Materials Letters (2013–2014).
Contents
About the Author ...............................................................................................v
Abbreviations ...................................................................................................ix
Preface .............................................................................................................xi
1. Electromagnetic Waves ...................................................................................1
2. Reflection and Refraction .............................................................................45
3. Superposition of Waves ................................................................................83
4. Interference..................................................................................................109
5. Diffraction ....................................................................................................141
6. Light Propagation in Anisotropic Media ..................................................187
7. Polarization ..................................................................................................209
8. Thin-Film Optics and Reflectance Control ...............................................239
9. Interference Lithography ...........................................................................273
10. Metal Plasmonics ........................................................................................307
Index .....................................................................................................................363
Abbreviations
1D one-dimensional
AR antireflection
BCC body-centered cubic
DDA discrete dipole approximation
DPI dots per inch
EMF electromotive force
EMT effective medium theory
FCC face-centered cubic
FDTD finite-difference time‐domain
FEM finite element method
FOM figure of merit
FTIR frustrated total internal reflection
IR infrared
ITO indium tin oxide
LSPRs localized surface plasmon resonances
LSPs localized surface plasmons
OPL optical path length
PMMA polymethylmethacrylate
PS polystyrene
PVA polyvinyl alcohol
RCWA rigorous coupled-wave analysis
SERS surface-enhanced Raman spectroscopy
s-Si single-crystalline Si
SPP surface plasmon polariton
SPR surface plasmon resonance
SPs surface plasmons
TA transmission axis
TE transverse electric
TEM transmission electron microscope
TIR total internal reflection
TM transverse magnetic
UV ultraviolet
