Table Of Content12 United States Patent (10) Patent No.: US 7,876,423 B1
( )
Roth (45) Date of Patent: Jan. 25, 2011
(54) SIMULTANEOUS NONCONTACT PRECISION 6,853,926 132 2/2005 Alfano et al.
IMAGING OF MICROSTRUCTURAL AND 7,038,208 132 5/2006 Alfano et al.
THICKNESS VARIATION IN DIELECTRIC
7,119,339 132 10/2006 Ferguson et al.
MATERIALS USING TERAHERTZ ENERGY
7,145,148 132 12/2006 Alfano et al.
(75) Inventor: Donald J Roth, Rocky River, OH (US) 7,174,037 132 2/2007 Arnone et al.
(73) Assignee: The United States of America as
represented by the National
Aeronautics and Space (Continued)
Administration, Washington, DC (US)
OTHER PUBLICATIONS
(*) Notice: Subject to any disclaimer, the term of this
"Simultaneous Non-Contact Precision Measurement of
patent is extended or adjusted under 35
Microstructural and Thickness Variation in Dielectric Materials
U.S.C. 154(b) by 154 days. Using Terahertz Energy" NASA TM-2008-2148997, Mar. 2008,
2008-214997, NASA STI, http://www.sti.nasa.gov, NASA Center
(21) Appl. No.: 12/163,382 for Aerospace Information (CASI) 7115 Standard Drive, Hanover,
MD 21076-1320.
(22) Filed: Jun. 27, 2008
(Continued)
(51) Int. Cl.
GOIN 21100 (2006.01) Primary Examiner Sang Nguyen
GOIB 11128 (2006.01) (74) Attorney, Agent, or Firm Ruth H. Earp, III; Kenneth
(52) U.S. Cl . ......................................... 356/27; 356/630 Mitchell
(58) Field of Classification Search ................. 356/497,
(57) ABSTRACT
356/502, 630-636, 27-28.5; 73/655, 629,
73/622, 597, 593
See application file for complete search history.
A process for simultaneously measuring the velocity of tera-
(56) References Cited hertz electromagnetic radiation in a dielectric material
U.S. PATENT DOCUMENTS sample without prior knowledge of the thickness of the
sample and for measuring the thickness of a material sample
4,056,970 A * 11/1977 Sottish ........................ 73/629 using terahertz electromagnetic radiation in a material sample
4,533,829 A 8/1985 Miceli et al.
without prior knowledge of the velocity of the terahertz elec-
4,563,898 A * 1/1986 Kanda et al . .................. 73/606
tromagnetic radiation in the sample is disclosed and claimed.
5,307,680 A * 5/1994 Drescher-Krasicka ........ 73/606
5,549,003 A * 8/1996 Drescher-Krasicka ........ 73/606 The process evaluates, in a plurality of locations, the sample
5,623,145 A 4/1997 Nuss for microstructural variations and forthickness variations and
5,710,430 A 1/1998 Nuss maps the microstructural and thickness variations by loca-
5,883,720 A * 3/1999 Akiyama et al . ............ 356/632 tion. A thin sheet of dielectric material may be used on top of
5,939,721 A 8/1999 Jacobsen et al. the sample to create a dielectric mismatch. The approximate
5,974,886 A * 11/1999 Carroll et al . ................. 73/598 focal point of the radiation source (transceiver) is initially
6,495,833 B1 12/2002 Alfano et al.
determined for good measurements.
6,810,742 132 * 11/2004 Sauerland .................... 73/597
6,828,558 B1 12/2004 Arnone et al.
6,849,852 132 2/2005 Williamson 20 Claims, 15 Drawing Sheets
1400
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US 7,876,423 B1
Page 2
U.S. PATENT DOCUMENTS A NASA Lewis Research Center Technology Transfer Case History,"
Materials Evaluation, vol. 58, No. 4, Apr. 2000.
7,214,940 B2 5/2007 Cluff et al. Roth, D.J. Hendricks, L., Whalen. M.F. and Martin, K: Commercial
2004/0026622 Al 2/2004 DiMarzio et al. Implementation of Ultrasonic Velocity Imaging Methods via Coop-
2004/0095147 Al 5/2004 Cole erative Agreement Between NASA Lewis Research Center and
2004/0113103 Al 6/2004 Zhilkov Sonix. Inc. NASA TM-107138, 1996.
2007/0090294 Al 4/2007 Safai et al. Winfree, W.P. and Madaras, E.I., "Detection and Characterization of
2007/0145276 Al 6/2007 Zhang et al. Flaws in Sprayed on Foam Insulation with Pulsed Terahertz Fre-
2007/0228280 Al 10/2007 Mueller quency Electromagnetic Waves," Proceedings Proceedings of the
2007/0235658 Al 10/2007 Zimdars et al. 41st AIAA/ASME/SAE/ASEE Joint Propulsion Conference &
Exhibit, Tuscon. Arizona, Jul. 10-13, 2005.
OTHER PUBLICATIONS Allan, H., Huang, F., Federici. J.F., Lan, A., and Grebel, H., "Char-
acteristics of Nano-scale Composite Materials using THz spectros-
Columbia Accident Investigation Board (CAIB) Report, vol. 1, Aug. copy," Proc. SPIE 5268, pp. 53-60, (2004).
2003. Amone, D.D.; et al. Application of trahertz (THz) technology to
Generazio, E.R.. Roth, D.J., and Stang, D.B.: "Ultrasonic Imaging of medical imaging. In Proc. SPZE Terahertz Spectroscopy. Applica-
Porosity Variations Produced During Sintering," J. Am. C'ertrm. Soc. tions II; International Society for Optical Engineering: Bellingham,
vol. 72, No. 7, 1989. WA, 1999; pp. 209-219.
Hu, B.B. andNuss, M.C., "Imagingwith trahertz waves," Opt. Lett., Bashyam. M.: Thickness Compensation and Dynamic Range
vol. 20, p. 1716 (1995). Improvement for Ultrasonic Imaging of Composite Materials. Proc.
Hsu. D.K.. et al.: Simultaneous determination of ultrasonic velocity, Of the 17th Annual Review of Progress in Qualitative Nondestructive
plate thickness i—nd wedge angle using one-sided contact measure- Evaluation, La Jolla. CA, Jul. 15-20. 1090. vol. 10.4. Plenum Press.
ments. NDT&E International 1994 vol. 27, No. 2, pp. 75-82. 1901, pp. 1035-1042.
Hull. D.R.; Kautz, H.E.; and Vary. A.: Measurement of Ultrasonic Bevington R.P. Data Reduction and Uncertainty Analysis for the
Velocity Using FS-Slope and Cross-Correlation Methods, Mater, Physical Sciences, Chapter 4, 1069. McGraw-Hill: New York, NY
Eval. vol. 43,. No. 11, 1985, pp. 1455-1460. Jensen, A. and Ia Cour-Harbo, A.; Ripples in Mathematics. 157-160.
Mittleman, D.M., Jacobsen, R.H., and Nuss, M.C., "T-ray imaging," (2001).Berlin: Springer, ISBN 3-540-41662-5.
IEEE J.Sel.Top. Quant. Elec., vol. 2, p. 679 (1996). Roth, D.J., Stang, D.B., Swickard, S.M., DeGuire, M.R., and
Mittleman D.M., Gupta, M. Neelamani, R.G., Baraniuk, J.V., Rudd Dolhert, L.E. "Review, Modeling and Statistical Analysis of Ultra-
and Koch, M., "Recent advances in terahertz imaging," Appl. Phys- sonic Velocity-Pore Fraction Relations in Polycrystalline Materials,"
ics. B vol. 68. pp. 1085-1094 (1999). Materials Evaluation, vol. 49, No. 7, Jul. 1991, pp. 883-888.
Piche, L.: Ultrasonic velocity measurement for the determinination Roth, D.J., "Using a Single Transducer Ultrasonic Imaging Method
of density in polyethylene. Polymer Engineering and Science, vol. to Eliminate the Effect of Thickness Variation in the Images of
24, No. 17, Mid-Dec. 1984 oo 1354-1358. Ceramic and Composite Plates," Journal of Nondestructive Evalua-
Roth, D.J., Kiser, J.D., Swickard, S.M., Szatmary, S., and Kerwin, D. tion, vol. 16, No. 2, Jun. 1997.
"Quantitative Mapping of Pore Fraction Variations in Silicon Nitride Roth, D.J., Seebo, J.P. Trinh, L.B., Walker, J.L., Aldrin, J.C., "Signal
Using an Ultrasonic Contact Scan Technique," Research in Nonde- processing approaches for trahertz data obtained from inspection of
structive Evaluation, vol. 6, No. 3, 1995. the shuttle external tank thermal protection system foam," Procceed-
ings of the 33rd Annual Review of Progress in Quantitative Nonde-
Roth, D.J., Carney, D.V., Baaklim, G.Y., Bodis, James R., Rauser,
Richard W., "A Novel Method for Nondestructive Characterization of structive Evaluation. Hilton Portland & Executive Tower Portland,
Oregon Jul. 30-Aug. 4, 2006.
Tubular and Curved Components," Materials Evaluation, vol. 56, No.
10, Sep. 1998, pp. 1053-1061. Dayal, V "An Automated Simultaneous Measurement of Thickness
and Wave Speedby Ultrasound," Experimental Mechanics, 32(3), pp.
Roth, D.J. and Farmer, D.A., "Thickness-Independent Ultrasonic
197-202,1992.
Imaging Applied to Abrasive Cut-off Wheels: An Advanced Aero-
space Materials Characterization Method for the Abrasives Industry: * cited by examiner
U.S. Patent
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