Table Of ContentProgress in Optical Science and Photonics
Euth Ortiz Ortega · Hamed Hosseinian ·
Ingrid Berenice Aguilar Meza ·
María José Rosales López ·
Andrea Rodríguez Vera ·
Samira Hosseini
Material
Characterization
Techniques and
Applications
Progress in Optical Science and Photonics
Volume 19
SeriesEditors
JavidAtai,Sydney,NSW,Australia
RongguangLiang,CollegeofOpticalSciences,UniversityofArizona,Tucson,
AZ,USA
U.S.Dinish,InstituteofBioengineeringandBioimaging,A*STAR,Singapore,
Singapore
The purpose of the series Progress in Optical Science and Photonics is to provide
a forum to disseminate the latest research findings in various areas of Optics and
its applications. The intended audience are physicists, electrical and electronic
engineers, applied mathematicians, biomedical engineers, and advanced graduate
students.
Moreinformationaboutthisseriesathttps://link.springer.com/bookseries/10091
· ·
Euth Ortiz Ortega Hamed Hosseinian
·
Ingrid Berenice Aguilar Meza
·
María José Rosales López
·
Andrea Rodríguez Vera Samira Hosseini
Material Characterization
Techniques and Applications
EuthOrtizOrtega HamedHosseinian
SchoolofEngineeringandSciences SchoolofEngineeringandSciences
TecnologicodeMonterrey TecnologicodeMonterrey
Monterrey,Mexico Monterrey,Mexico
IngridBereniceAguilarMeza MaríaJoséRosalesLópez
SchoolofEngineeringandSciences SchoolofEngineeringandSciences
TecnologicodeMonterrey TecnologicodeMonterrey
Monterrey,Mexico Monterrey,Mexico
AndreaRodríguezVera SamiraHosseini
SchoolofEngineeringandSciences SchoolofEngineeringandSciences
TecnologicodeMonterrey TecnologicodeMonterrey
Monterrey,Mexico Monterrey,Mexico
ISSN2363-5096 ISSN2363-510X (electronic)
ProgressinOpticalScienceandPhotonics
ISBN978-981-16-9568-1 ISBN978-981-16-9569-8 (eBook)
https://doi.org/10.1007/978-981-16-9569-8
©TheEditor(s)(ifapplicable)andTheAuthor(s),underexclusivelicensetoSpringerNature
SingaporePteLtd.2022
Thisworkissubjecttocopyright.AllrightsaresolelyandexclusivelylicensedbythePublisher,whether
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Thepublisher,theauthorsandtheeditorsaresafetoassumethattheadviceandinformationinthisbook
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ThisSpringerimprintispublishedbytheregisteredcompanySpringerNatureSingaporePteLtd.
The registered company address is: 152 Beach Road, #21-01/04 Gateway East, Singapore 189721,
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Tothetruespiritofscience,
Andtoscientistswhoservebeyondthe
notionsof“I”and“mine”.
Preface
Newlydevelopedmaterialsrequireathoroughcharacterizationofbulkandsurface
propertiesforanyapplicationtheymayserve.Thematerialscharacterizationdomain
involvesawidevarietyofcharacterizationtechniqueseachpromotingadifferentlevel
of understanding of the materials, their features, and functions. The present book
offersdetailedinformationaboutthecommonlyappliedcharacterizationtechniques
inmaterialscience,theirbriefhistoryandorigins,theirmechanismofoperation,the
advantagesanddisadvantages,theirapplications,andatroubleshootingsectionfor
eachtechniquethataddressesthechallengesresearchersmayfacewhenworkingwith
thesetechniques,inadditiontothepossiblecausesandtherecommendedsolutions
to counteract the errors. This book lends its focus to a profound understanding of
thenatureofmaterialsincludinganalysesofmorphology,topography,mass,aswell
as the characterization of elemental, structural, thermal, wettability, electrochem-
ical,andchromatographypropertiesofsamples.Additionally,thebookfeaturesthe
benefits of using characterization techniques simultaneously by covering some of
thewidelyappliedcoupledanalyticalmethods.
Monterrey,Mexico EuthOrtizOrtega
HamedHosseinian
IngridBereniceAguilarMeza
MaríaJoséRosalesLópez
AndreaRodríguezVera
SamiraHosseini
Acknowledgments Theauthorswouldliketoacknowledgethefinancialandtechnicalsupport
ofWritingLab,InstitutefortheFutureofEducation(IFE),TecnologicodeMonterrey,Mexico.
Additionally,theauthorswouldliketoexpresstheiramplegratitudefortherelentlessworkand
supportofMichelleAlejandraEspinosa-HernandezandKatiaDonjuanineditingthefinaldraftof
thebook.
vii
Contents
1 CharacterizationTechniquesforMorphologyAnalysis ............. 1
EuthOrtizOrtega,HamedHosseinian,MaríaJoséRosalesLópez,
AndreaRodríguezVera,andSamiraHosseini
1.1 OpticalMicroscopyforMaterialCharacterization ............... 2
1.1.1 HistoryofOpticalMicroscopy ......................... 2
1.1.2 MechanismofOperationofOpticalMicroscopy .......... 5
1.1.3 AdvantagesandDisadvantagesofOpticalMicroscopy .... 11
1.1.4 ApplicationsofOpticalMicroscopy .................... 13
1.2 ScanningElectronMicroscopyforMaterialCharacterization ..... 19
1.2.1 HistoryofScanningElectronMicroscopy ............... 19
1.2.2 Mechanism of Operation of Scanning Electron
Microscopy ......................................... 20
1.2.3 AdvantagesandDisadvantagesofScanningElectron
Microscopy ......................................... 24
1.2.4 ApplicationsofScanningElectronMicroscopy ........... 25
1.3 Transmission Electron Microscopy for Material
Characterization ............................................ 29
1.3.1 HistoryofTransmissionElectronMicroscopy ............ 29
1.3.2 MechanismofOperationofTransmissionElectron
Microscopy ......................................... 31
1.3.3 Advantages and Disadvantages of Transmission
ElectronMicroscopy ................................. 33
1.3.4 ApplicationsofTransmissionElectronMicroscopy ....... 35
1.4 TroubleshootingofMorphologyAnalysisTechniques ............ 37
References ..................................................... 41
2 CharacterizationTechniquesforMassSpectrometryAnalysis ...... 47
HamedHosseinian,EuthOrtizOrtega,MaríaJoséRosalesLópez,
AndreaRodríguezVera,andSamiraHosseini
2.1 MassSpectrometryforMaterialCharacterization ............... 48
2.1.1 HistoryofMassSpectrometry ......................... 48
ix
x Contents
2.1.2 MechanismofOperationofMassSpectrometry .......... 49
2.1.3 AdvantagesandDisadvantagesofMassSpectrometry ..... 52
2.1.4 ApplicationsofMassSpectrometry ..................... 52
2.2 Matrix-AssistedLaserDesorptionIonizationTime-of-Flight
MassSpectrometryforMaterialCharacterization ............... 56
2.2.1 History of Matrix-Assisted Laser Desorption
IonizationTime-of-FlightMassSpectrometry ............ 56
2.2.2 Mechanism of Operation of Matrix-Assisted
LaserDesorptionIonizationTime-of-FlightMass
Spectrometry ........................................ 58
2.2.3 AdvantagesandDisadvantagesofMatrix-Assisted
LaserDesorptionIonizationTime-of-FlightMass
Spectrometry ........................................ 60
2.2.4 ApplicationsofMatrix-AssistedLaserDesorption
IonizationTime-of-FlightMassSpectrometry ............ 62
2.3 TroubleshootingofMassSpectrometryAnalysisTechniques ...... 64
References ..................................................... 67
3 CharacterizationTechniquesforTopographyAnalysis ............. 71
HamedHosseinian,EuthOrtizOrtega,MaríaJoséRosalesLópez,
AndreaRodríguezVera,andSamiraHosseini
3.1 AtomicForceMicroscopyforMaterialCharacterization ......... 72
3.1.1 HistoryofAtomicForceMicroscopy ................... 72
3.1.2 MechanismofOperationofAtomicForceMicroscopy .... 73
3.1.3 Advantages and Disadvantages of Atomic Force
Microscopy ......................................... 75
3.1.4 ApplicationsofAtomicForceMicroscopy ............... 75
3.2 RamanSpectroscopyforMaterialCharacterization .............. 78
3.2.1 HistoryofRamanSpectroscopy ........................ 78
3.2.2 MechanismofOperationofRamanSpectroscopy ......... 79
3.2.3 Advantages and Disadvantages of Raman
Spectroscopy ........................................ 82
3.2.4 ApplicationsofRamanSpectroscopy ................... 82
3.3 TroubleshootingofTopographyAnalysisTechniques ............ 84
References ..................................................... 88
4 Characterization Techniques forChemical andStructural
Analyses ....................................................... 93
EuthOrtizOrtega,HamedHosseinian,MaríaJoséRosalesLópez,
AndreaRodríguezVera,andSamiraHosseini
4.1 RamanSpectroscopyforMaterialCharacterization .............. 95
4.1.1 HistoryofRamanSpectroscopy ........................ 95
4.1.2 MechanismofOperationofRamanSpectroscopy ......... 96
4.1.3 Advantages and Disadvantages of Raman
Spectroscopy ........................................ 98
4.1.4 ApplicationsofRamanSpectroscopy ................... 99
Contents xi
4.2 Fourier Transform Infrared Spectroscopy for Material
Characterization ............................................ 100
4.2.1 HistoryofFourierTransformInfraredSpectroscopy ....... 100
4.2.2 Mechanism of Operation of Fourier Transform
InfraredSpectroscopy ................................ 101
4.2.3 AdvantagesandDisadvantagesofFourierTransform
InfraredSpectroscopy ................................ 103
4.2.4 Applications of Fourier Transform Infrared
Spectroscopy ........................................ 104
4.3 Ultraviolet–Visible Spectroscopy for Material
Characterization ............................................ 107
4.3.1 HistoryofUltraviolet–VisibleSpectroscopy ............. 107
4.3.2 Mechanism of Operation of Ultraviolet–Visible
Spectroscopy ........................................ 109
4.3.3 AdvantagesandDisadvantagesofUltraviolet–Visible
Spectroscopy ........................................ 110
4.3.4 ApplicationsofUltraviolet–VisibleSpectroscopy ......... 111
4.4 X-Ray Photoelectron Spectroscopy for Material
Characterization ............................................ 114
4.4.1 HistoryofX-RayPhotoelectronSpectroscopy ............ 114
4.4.2 MechanismofOperationofX-RayPhotoelectron
Spectroscopy ........................................ 115
4.4.3 Advantages and Disadvantages of X-Ray
PhotoelectronSpectroscopy ........................... 116
4.4.4 ApplicationsofX-RayPhotoelectronSpectroscopy ....... 117
4.5 DiffuseReflectanceInfraredFourierTransformSpectroscopy
forMaterialCharacterization ................................. 119
4.5.1 History of Diffuse Reflectance Infrared Fourier
TransformSpectroscopy .............................. 119
4.5.2 Mechanism of Operation of Diffuse Reflectance
InfraredFourierTransformSpectroscopy ................ 119
4.5.3 AdvantagesandDisadvantagesofDiffuseReflectance
InfraredFourierTransformSpectroscopy ................ 122
4.5.4 ApplicationsofDiffuseReflectanceInfraredFourier
TransformSpectroscopy .............................. 122
4.6 X-RayDiffractionforMaterialCharacterization ................ 124
4.6.1 HistoryofX-RayDiffraction .......................... 124
4.6.2 MechanismofOperationofX-RayDiffraction ........... 126
4.6.3 AdvantagesandDisadvantagesofX-RayDiffraction ...... 128
4.6.4 ApplicationsofX-RayDiffraction ...................... 129
4.7 NuclearMagneticResonanceforMaterialCharacterization ....... 132
4.7.1 HistoryofNuclearMagneticResonance ................. 132
4.7.2 Mechanism of Operation of Nuclear Magnetic
Resonance .......................................... 133
