Lightweight hardware fingerprinting solution using inherent memory in off-the-shelf commodity devices

0.93 MB·

by  Mohd Syafiq Mispan,  Aiman Zakwan Jidin, Muhammad Raihaan Kamaruddin, Haslinah Mohd Nasir

IndonesianJournalofElectricalEngineeringandComputerScience
Vol. 25,No. 1,January2022,pp. 105∼112
ISSN:2502-4752,DOI:10.11591/ijeecs.v25.i1.pp105-112 ❒ 105
Lightweight hardware fingerprinting solution using
inherent memory in off-the-shelf commodity devices
MohdSyafiqMispan1,4,5,AimanZakwanJidin1,4,5,MuhammadRaihaanKamaruddin2,4,5,
HaslinahMohdNasir3,4,5
1MicroandNanoElectronics(MiNE),Melaka,Malaysia
2MachineLearningandSignalProcessing(MLSP),Melaka,Malaysia
3AdvanceSensorsandEmbeddedControlsSystem(ASECs),Melaka,Malaysia
4CentreforTelecommunicationResearchandInnovation(CeTRI),Melaka,Malaysia
5FakultiTeknologiKejuruteraanElektrikdanElektronik,UniversitiTeknikalMalaysiaMelaka,Melaka,Malaysia
ArticleInfo ABSTRACT
Articlehistory: AnemergingtechnologyknownasPhysicalunclonablefunction(PUF)canprovide
ahardwareroot-of-trustinbuildingthetrustedcomputingsystem. PUFexploitsthe
ReceivedMar9,2021
intrinsicprocessvariationsduringtheintegratedcircuit(IC)fabricationtogeneratea
RevisedOct22,2021 uniqueresponse. ThisuniqueresponsediffersfromonePUFtotheothersimilartype
AcceptedNov16,2021 of PUFs. Static random-access memory PUF (SRAM-PUF) is one of the memory-
basedPUFsinwhichtheresponseisgeneratedduringthememorypower-upprocess.
Keywords: Non-volatilememory(NVM)architecturelikeSRAMisavailableinoff-the-shelfmi-
crocontrollerdevices. ExploitingtheinherentSRAMasPUFcouldwide-spreadthe
ATMega2560 adoptionofPUF.Therefore,inthisstudy,weevaluatethesuitabilityofinherentSRAM
Hardwaresecurity availableinATMega2560microcontrolleronArduinoplatformasPUFthatcanpro-
Physicalunclonablefunction vide a unique fingerprint. First, we analyze the start-up values (SUVs) of memory
SRAM-PUF cells and select only the cells that show random values after the power-up process.
Subsequently,westatisticallyanalyzethecharacteristicoffifteenSRAM-PUFswhich
include uniqueness, reliability, and uniformity. Based on our findings, the SUVs of
fifteenon-chipSRAMsachieve42.64%uniqueness, 97.28%reliability, and69.16%
uniformity. Therefore, weconcludedthattheavailableSRAMinoff-the-shelfcom-
modityhardwarehasgoodqualitytobeusedasPUF.
ThisisanopenaccessarticleundertheCCBY-SAlicense.
CorrespondingAuthor:
MohdSyafiqMispan
FakultiTeknologiKejuruteraanElektrikdanElektronik,UniversitiTeknikalMalaysiaMelaka
TamanTasikUtama,75450AyerKeroh,Melaka,Malaysia
Email: [email protected]
1. INTRODUCTION
Physicalunclonablefunction(PUF)isapromisingtechnologyasahardwarefingerprintingsolution
foratrustedcomputingsystembyprovidingaroot-of-trust. PUFexploitstheintrinsicmanufacturingprocess
variations during integrated circuit (IC) fabrication. The intrinsic process variations embodied in the silicon
chip acts as a random function for a PUF which can uniquely map a set of challenges to a set of responses,
knownaschallenge-responsepairs(CRPs). TheseCRPsarerandomandshowadevice-specificpropertythat
canbeappliedinICidentificationandauthentication,andcryptographickeygenerationapplication[1].
Several PUFs have been proposed in the past [2], [3]. Static random-access memory PUF (SRAM-
PUF) is one of the previously proposed PUFs and it is categorized as memory-based PUF [4], [5]. Further,
Journalhomepage: http://ijeecs.iaescore.com
106 ❒ ISSN:2502-4752
SRAM-PUF has been sub-categorized as Weak-PUF due to limitations in its CRPs. The terminology of
‘Strong’ and ‘Weak’ PUF is not meant to indicate that one PUF is superior to the other PUFs, rather it is
toindicatethecorrespondingCRPsnumberofonePUFabletogenerate[4],[6],[7]. TypicalSRAMcellscon-
sistofacross-coupledinverterandtwoaccesstransistors. Thecross-coupledinverterisverysusceptibletothe
processvariations,henceleadtothethresholdvoltage,V mismatchesbetweenn-channelmetal-oxidesemi-
th
conductor(nMOS)andp-channelmetal-oxidesemiconductor(pMOS)transistors. DuetotheV mismatch,a
th
racingconditiontochargetheloadingcapacitancesofcross-coupledinverteroccursduringthepower-uppro-
cess[8]. AninverterthathasastrongpMOS(i.e.,lowV )drivesmorecurrentandturnsthenMOSofanother
th
inverter to ON state. Eventually, the load capacitance corresponding to the strong pMOS being pulled-up to
V andanotherloadcapacitancebeingpulled-downto0V.
dd
ThephenomenonmentionedabovecauseseachSRAMcelltosettlesatarandomstart-upvalue(SUV)
either‘1’or‘0’duringthepower-upprocess. TheSUVsacrossdifferentmemoryblockswithinanSRAMand
acrossmultipleSRAMsshowdevice-specificandrandompatterns. Hence,itissuitabletobeusedasPUFas
proposedearlierin[4],[5]. Nevertheless,thequestionremainsisthesuitabilityofon-chiporinherentSRAM
inanycomputingdevicetobeusedasaPUF.Exploitingtheon-chipSRAMasPUFcanfurtherreducethetotal
costofbuildingthehardwareroot-of-trustfeatureandcouldwide-spreadtheadoptionofPUFinacomputing
system[9].
Motivated by the cost reduction and potential wide-spread adoption of PUF in computing systems,
the focus of this paper is to analyze and evaluate the suitability of on-chip SRAM as PUF. We used the AT-
Mega2560microcontrollerontheArduinoplatformasacasestudytoevaluatetheperformanceofSRAM-PUF.
Themaincontributionsofthisworkarehighlightedbelow:
i We study the SUVs of on-chip 8kB SRAM in ATMega2560 microcontroller device. We show that the
SUVsinthememoryaddressrangeof0x0281to0x20D0arerandomandsuitabletobeusedasPUF.
ii WeevaluatethequalityofPUFwhichincludesuniqueness,reliability,anduniformityonfifteenon-chip
8kBSRAMsbyrandomlyselecting4096bitsfromtheaforementionedmemoryaddressrangeforeach
SRAM.Theon-chipSRAMshowsgoodqualityandsufficiententropyofPUFwhichachieve42.64%,
97.28%,and69.16%,respectivelyforuniqueness,reliability,anduniformity.
Therestofthepaperisorganizedasfollows. Section2describesthebackgroundwhichrelatedtothis
work. Section3describesthemethodsusedinthisstudy. Theexperimentalanalysisandresultsarepresented
insection4. Finally,conclusionsaredrawninsection5.
2. RELATEDWORK
A dual function of SRAM as memory and PUF has been suggested in the previous studies [10]–
[12]. Hoffmannetal.,[11],[12]werefocusedonreusingtheon-chipcacheasPUF,whileMispanetal.,[10]
proposedtheageingmitigationtechnique(i.e.,toimprovethereliabilityofSUVs)experiencesbytheSRAM
cells when it is being used as memory and PUF. Other studies have been focusing on using on-chip SRAM
as PUF in ARM-based low-end commodity microcontroller devices [13], [14]. These studies show that the
inherent SRAM in ARM-based microcontroller contains sufficient entropy to be exploited as PUF. In other
studies, Platonov et al., [15] and Aung et al., [16] investigate the entropy of SUVs in an on-chip memory in
ATMega1284PandATMega328Pmicrocontrollers, respectively. Theresultsfrombothstudiesshowthatthe
SUVs have a good entropy that can uniquely distinguish each chip. Elsewhere, microcontrollers in Arduino
platforms have been used for a proof-of-concept of internet-of-things (IoT) device authentication [17]–[19].
Besides,theon-chipSRAMinATMega328Pmicrocontrollerdeviceshavebeenusedasacasestudytoperform
invasiveattacksasdiscussedin[20], [21]. Alloftheabovestudiesshowthatthefeasibilityofusingon-chip
SRAMinATMega256microcontrolleronArduinoplatformasPUFhasneverbeenstudied. Inourstudy,we
focusonevaluatingthePUFentropyofon-chip8kBSRAMinanATMega256microcontrollerdeviceandwe
specifywhichmemoryaddresscanbeusedtogenerateauniqueidentifier.
3. METHODOLOGY
Theavailableon-chipmemoryof8kBSRAMinATMega2560microcontrollerontheArduinoplat-
formisusedinthisstudy. Theon-chipSRAMinATMega2560isdividedinto4allocationsofmemorieswhich
aretheRegisterFile,theI/Omemory,ExtendedI/Omemory,andtheinternaldataSRAM[22]. Eachaddress
isusedtostoreabyte(i.e.,8-bit)ofdata. Thefirst32locationsaddresstheregisterfile,thenext64locations
IndonesianJElecEng&CompSci,Vol. 25,No. 1,January2022: 105–112
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the standard I/O memory, then 416 locations of extended I/O memory, and the next 8,192 locations address
theinternaldataSRAM.Allmemorylocationaddressesareanalyzedinsearchingforuniqueandrandompat-
ternsofSUVsduringthepower-upprocess. ToreadtheSUVsofSRAM-cells,wemodifiedthestart-upcode
(i.e., setup()function)todisplaytherawSUVsviauniversalasynchronousreceiver-transmitter(UART)(i.e.,
Arduino on-board USB-to-Serial) before the SRAM gets initialized. The start-up code is essential to every
microcontrollerasitinitializesvariables, pinmodes, andlibraries. TomeasurethereliabilityofSUVsunder
differentpower-upcycles,fivepower-upprocesseshavebeenconductedoneachoffifteendeviceswithatime
interval of 5 minutes before the next power-up process takes place to eliminate the effect of data remanence
inSRAMcells[23]. Itisassumedthatthesupplyvoltageandsurroundingtemperatureremainconstantdur-
ing the power-up experiment. All SUVs extracted from the on-chip SRAM are recorded in a CSV file and
MATLABR2016bisusedasapost-processingsoftwaretoevaluatetheuniqueness,reliability,anduniformity
performances.
4. SIMULATIONRESULTSANDANALYSIS
Inthissection,therelevantsimulationandanalysisarediscussedbasedonthedescribedmethodology
insection3. First,therandomnessoftheSUVsintheATMEGA2560’sSRAMisanalyzed. Subsequently,the
qualityofSRAM-PUFsuchasuniqueness,reliability,anduniformityisevaluatedaccordingtothemathemati-
calformulationdescribedin[24],[25].
4.1. AnalysisoftheATMEGA2560’sSRAM
We evaluated the SUVs patterns of ATMega2560 microcontroller device on Arduino platform that
integratesanon-chip8kB(i.e.,rangeofaddress: 0x0000to0x21FF)ofSRAM.TherandomnessofSUVsof
SRAMcellsisassessedusingfifteenATMega2560devicesbyextractingtheSUVsineachmemorylocation.
Figure 1 illustrates the bitmap of SUVs measurement of all the addresses in an 8 kB on-chip SRAM in the
ATMega2560microcontroller. Thebitmaphasbeenillustratedsuchthateachrowconsistsof16-byteofdata
(i.e., 128-bit). As can be seen in Figure 1, the bitmap indicates that there are repeating patterns in the low
address(0x0000to0x027F)andhighaddress(0x20D0to0x21FF)regionsforallfifteendevices.
Figure1. BitmapofSUVsmeasurementofanATMEGA2560on-chip8kBSRAM
Lightweighthardwarefingerprintingsolutionusinginherentmemory... (MohdSyafiqMispan)
108 ❒ ISSN:2502-4752
Asmentionedinsection3thefirst512locationsaddressedtheregisterfile,thestandardI/Omemory,
andtheExtendedI/Omemory. Therefore,weassumethattheobservedrepeatingpatternsrepresentstructures
used by the on-board ROM code embedded with every Arduino board. Another observation of repeating
patternsisatthehighaddressregionwhichcorrespondingtotheaddressofinternaldataSRAMthatcouldbe
causedbytheapplicationprogramminginterface(API).ThemostimportantobservationistheSUVsgenerated
bytheSRAMcellswithintheaddressregionof0x0280to0x20CFwhichshowsrandomnessanduniqueness
characteristics.Hence,thesubsequentanalysisofPUFqualityisbasedontheSUVsextractedfromthisaddress
region.
4.2. Uniqueness
UniquenessmeasurestheabilityofaPUFtogeneratearesponsethatdifferfromtheotherresponses
generated by the other similar types of PUFs when a challenge C is applied. Ideally, the uniqueness should
bedistributedaround50%withaverysmallstandarddeviation. Uniquenesscanbeevaluatedusinghamming
distance(HD)asdefinedin(1):
m−1 m
Inter−HD= 2 (cid:88) (cid:88) HD(Ri(n),Rj(n)) ×100% (1)
m(m−1) n
i=1 j=i+1
whereiandj representtwoPUFinstancesunderevaluationthatgeneratesn-bitofresponse. mrepresentsthe
totalnumberofsimilartypesofPUFs.
BasedonthefindingsofrandomSUVspatternsasdiscussedinsection4.1,only4096-bitisselected
randomlywithintheaddressregionof0x0280to0x20CFforeachdevice. Figure2depictstheuniquenessfor
fifteenSRAM-PUFinstanceswitha4096-bitofresponseisextractedforeachSRAM-PUF.Theuniquenessof
0.4264 (42.64%) with a standard deviation of 0.0102 is obtained. The uniqueness and its standard deviation
areclosedtoanidealvalueof50%withaverysmallstandarddeviation.
Inter-HD (Uniqueness)
45
40
35
30
s
e
c
n
a
cur25
c
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0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1
Hamming Distance (HD)
Figure2. UniquenessoffifteenSRAMPUFinstances
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4.3. Reliability
ReliabilityisameasureofreproducibilityofthePUFresponse. Ideally,a100%reliabilityisdesired
forPUFcircuits. However, becauseofthenoiseexperiencedbythePUFcircuit, itisnotpossibletoachieve
100% reliability. The SUVs for reliability evaluation have been extracted according to the methodology de-
scribedinsection3. Subsequently,thereliabilityiscomputedusing(2),definedas:
 
Reliability=1− 1 (cid:88)m HD(Ri(n),Ri′,j(n))×100% (2)
m n
j=1
whereirepresentsPUFunderevaluationwhichgeneraten-bitresponse,R (n)atreferencepower-up,R′ (n)
i i,j
istheresponseatdifferentcondition(i.e.,nextpower-upprocess),andmrepresentsthetotalnumberofpower-
upprocesses. TheSUVswhichwasgeneratedforuniquenessevaluationinSection4.2. issetasaresponseat
thereferencepower-up.
Figure3depictsthereliabilityforeachoftheSRAM-PUFsthathasbeensubjectedtofivepower-up
processes. Based on the reliability evaluation, one device shows reliability of 93.29%, lower as compared to
thereliabilityoftheotherfourteendevices.Despiteanoutlier,itcanbeobservedthattheSRAM-PUFsachieve
high reliability under different power-up processes, on average of about 97.28%, close to an ideal value of
100%.
100
98
)
%
( 96
y
bilit
a 94
eli
R
92
90
0 2 4 6 8 10 12 14 16
#SRAM-PUF
Figure3. ReliabilityoffifteenSRAM-PUFssubjectedtofivepower-upprocesses
4.4. Uniformity
Uniformity measures the number of 1’s and 0’s distribution in a binary response of a PUF. A bal-
anceddistributionof1’sand0’sisrequiredwhichindicatestherandomnessinaresponse. Uniformitycanbe
evaluatedusinghammingweight(HW)asdefinedin(3):
m n
1 (cid:88)(cid:88)
Uniformity= r ×100% (3)
m×n i,j
i=1j=1
wherer isthej-thbinarybitofann-bitresponsefromaPUFi,foratotalofmPUFs. Figure4depictsthe
i,j
uniformity distribution of fifteen SRAM-PUFs with 4096-bit extracted from each PUF. The SUVs extracted
fromfifteenSRAM-PUFsachieve0.6916(69.16%)ofuniformitywithastandarddeviationof0.0182.
TheSUVsareskewedtowardsone,thereforetheuniformityvalueismorethan50%ascanbeseenin
Figure4whichindicatesmore1’sthan0’sinthePUFresponses.Asimilarobservationofastrongbiastowards
oneinanotherATMegafamilyisdescribedin[26]. Despitethisobservation, theuniquenesswhichhasbeen
evaluatedearlierinSection4.2. isclosedtoanidealvalueof50%(i.e.,abletodistinguishaPUFfromagroup
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ofsimilarPUFs). Hence,on-chipSRAMintheATMega2560microcontrollerstillholdsagoodqualitytobea
PUF.
Inter-HD (Uniqueness)
45
40
35
30
s
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cur25
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0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1
Hamming Distance (HD)
Figure4. UniformityoffifteenSRAMPUFinstances
5. CONCLUSION
SRAM-PUFisoneofthepreviouslyproposedmemory-basedPUFs. SRAMmemoryisavailablein
anycomputingsystem,henceitisinterestingtoinvestigatethesuitabilityofusingon-chipmemoryinoff-the-
shelfcommoditydevices. Inthisstudy, theon-chipmemoryof8kBSRAMinATMega2560microcontroller
on the Arduino platform has been used as a case study. Our findings show that the uniqueness is distributed
closetoanidealvalueof50%withasmallstandarddeviation. TheaveragereliabilityoffifteenSRAM-PUFs
underfivedifferentpower-upcyclesisapproximatelyabout97.28%. TheuniformityofSUVsextractedfrom
fifteenSRAM-PUFsshowsbiasingtowardsonewherebytheuniformityisdistributedaround69.16%. Despite
theskeweduniformity,on-chipSRAMintheATMega2560microcontrollerstillshowinggooduniquenessand
reliability. Hence, it can be concluded that the on-chip SRAM in the ATMega2560 microcontroller on the
Arduinoplatformissuitabletobeusedasahardwareroot-of-trustsolutionknownasPUF.
ACKNOWLEDGEMENT
The authors would like to thank Universiti Teknikal Malaysia Melaka and the Ministry of Higher
EducationMalaysiaforthefinancialfundingunderGrantNo.FRGS/1/2020/TK0/UTEM/02/56forcompleting
thisproject.
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IndonesianJElecEng&CompSci ISSN:2502-4752 ❒ 111
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BIOGRAPHIESOFAUTHORS
MohdSyafiqMispan receivedB.EngElectrical(Electronics)andM.EngElectrical(Com-
puterandMicroelectronicSystem)fromUniversitiTeknologiMalaysia,Malaysiain2007and2010
respectively. Hehadexperiencedworkinginsemiconductorindustriesfrom2007until2014before
pursuinghisPh.D.degree. HeobtainedhisPh.D.degreeinElectronicsandElectricalEngineering
fromUniversityofSouthampton,UnitedKingdomin2018.HeiscurrentlyaseniorlecturerinFakulti
TeknologiKejuruteraanElektrikdanElektronik,UniversitiTeknikalMalaysiaMelaka. Hiscurrent
researchinterestsincludehardwaresecurity,CMOSreliability,VLSIdesign,andElectronicSystems
Design.Hecanbecontactedatemail:[email protected].
Aiman Zakwan Jidin obtained his M.Eng in Electronic and Microelectronic System
EngineeringfromESIEEEngineeringParisFrancein2011. Hehas2yearsofworkingexperience
indesigningdigitalICanddigitalsysteminFPGAatAlteraCorporationMalaysia,beforejoining
UniversitiTeknikalMalaysiaMelakaaslecturerandresearcher,inElectronicsandComputerEngi-
neering.HisresearchinterestsincludeFPGADesignandDigitalSystemDesign.Hecanbecontacted
atemail:[email protected].
MuhammadRaihaanKamaruddin receivedtheB.Eng(ElectronicsandComputerSys-
tems)andM.Eng(ElectronicsandInformationScience)degreesfromTakushokuUniversity,Japan,
HeisworkingtowardthePhDdegreeinElectronicsandComputerEngineeringwiththeUniversiti
TeknikalMalaysiaMelaka(UTeM).HisPhDisontheImplementationofbio-inspiredroboticnaviga-
tionsystemusingstochasticcomputing.HehasworkingexperienceaslecturerinUniversitiTeknikal
MalaysiaMelaka(UTeM)for10years(2010-present).Hisresearchinterestincludesmachinelearn-
ing,roboticandstochasticcomputing.Hecanbecontactedatemail:[email protected].
HaslinahMohdNasir receivedherBachelorDegreeinElectrical-ElectronicEngineering
(2008)fromUniversitiTeknologiMalaysia(UTM),MSc(2016)andPhD(2019)inElectronicEngi-
neeringfromUniversitiTeknikalMalaysiaMelaka(UTeM).Shehad5years(2008-2013)experience
workinginindustryandcurrentlyalecturerinUTeM.Herresearchinterestincludesmicroelectronics,
artificialintelligenceandbiomedical.Shecanbecontactedatemail:[email protected].
IndonesianJElecEng&CompSci,Vol. 25,No. 1,January2022: 105–112