Inorganic Mass Spectrometry Fundamentals and Applications

517 Pages·2000·71.779 MB·English

by  Christopher Barshick, Douglas Duckworth, David Smith

IS
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MARCELD EKKERIN, C. NEWY ORK BASEL
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TE ICA
The aim of this book is twofold: to introduce the topic of inorganic mass spec-
trometry to the nonpractitioner of the technique and to familiarize those conver-
sant with it with recent developments in some of the foremost laboratories in the
world. The book should be of value to industry, academia, and government labora-
tory staff and should appeal to both national and inte~ationau~d iences. It is
written so that a college senior majoring in the sciences can follow the discussion
but has enough technical sophistication to keep it the benchmark for books in this
field for the next decade.
This book describes the fundamental operating characteristics of the most
common inorganic mass spectrometers. At the heart of this discussion is a descrip-
tion of the various ionization sources that generate a representative analyte popu-
lation for mass analysis. The initial chapters introduce the mass spectromet~c
hardware that separates the ionized fractions of analytes, one mass from another.
The detection schemes used to measure this ion population, and the data process-
ing systems that permit this information to be of value to the chemical analyst, are
also discussed.
Modern mass spectrometers are usually one of four types: magnetic sector,
quadrupole, time-of-flight, or ion trap. A brief introduction to each is provided.
Classical applications are discussed to illustrate how these devices have shaped
the landscape of elemental and isotopic chemical analysis.
The first two chapters were written by members of the research staff of Oak
Ridge National Laboratory, Because each type of inorganic mass spectrometer has
been extensively reviewed in the literature, only short discussions of the funda-
mentals, ins~mentationa, nd classical applications are given. Theory is covered
to an appropriate extent.
The balance of the book is composed of chapters authored by some of the
leading experts in the field of inorganic mass spectrometry. The focus of this
section is specialized topics, with emphasis on new developments in the field in
the last 10 years. The final chapters focus on what we believe will be the future of
inorganic mass Spectrometry.
iii
iv Preface
This book is appropriate for anyone with an interest in elemental or isotopic
chemical analysis. Among the anticipated readership are those from the industrial
cornunity who are not involved in research per se, but rely heavily on inorganic
mass spectrometers to make chemical measurements important to their respective
industries, including semiconductors, aluminum, steel, and materials fabrication.
Academics and government staff scientists will see this book as an. opportunity to
learn about current developments in the field without having to spend weeks
sorting through the literature. Professors of graduate-school courses in mass
spectrometry will find this a valuable reference for their students.
Christophe~M . ~arshi~k
Douglas C. Duc~orth
David H. S~ith
Preface iii
Contri~utors vii
1. Thermai Io~~ationa ss Spectrometry 1
David H. S~ith
2. Glow Discharge Mass S~ectrometry 31
Christopher M. ~arshick
3. Inductively Coupled Plasma Mass Spectrometry 7
John Tjv: Olesik
4. Secondary Ion Mass Spectrometry 159
Stephen S. Cristy
5. tion Mass SpectrQmetry 223
ith
6. The Emission of Ions from ~i~h-TemperatuCreo ndense
7, Analysis of a on conductive Sample Types by Glow
ass ~~ectrometry 261
arcu us
R, ~enneth
.
Multi ector Inductively Coupled Plasma Mass
Sped 1.
Alex N. Halliday, John N. Christensen, Der-Chuen Lee,
Chris M. Hall, Xiaozhong Luo, and ark Rehka~per
9. s and Their A~plicationt o Elemental Analysis 9
Douglas C. Du~~ortJho,~ nR. Eyler, and Cli~ordH . ats son
11
Contents
eme~taSl ~eciatiob~y l ~ o r ~ a ~ c 373
Karen L. Sutton, Kuthryn L. Ackley,
~ ~ o ~ i~c~pallic ationofs Secon~ar~ ass ~pect~ometry 415
Lee R. Ri~iputi
ass S~ectromet~ 4 ~ 7
David l? Myers, Steven J. Ray, and Gary M. Hieftje
Index 507
ey University of Cincinnati, Cincinnati, -Ohio
arshick Oak Ridge ~ationahl boratory, Oak Ridge, Tennessee
Josep ~ULSO University of Cincinnati, Cincinnati, Ohio
r~stense~U niversity of ~ichiganA, nn Arbor, ~ichigan
hen S. Cristy Lmkheed arti in Energy Systems, Oak Ridge, Tennessee
e~more Idaho ~ationael ngineer in^ and Environmental tabora-
tory, Idaho Falls, Idaho
ck~ortO~a k Ridge National kboratory, Oak Ridge, Tennessee
University of Florida, ~ainesvilleF, lorida
1 University of ~ichiganA, nn Arbol; ~ichigan
ay ETH Zentrum, Ziirich, Switz~rland
e Indiana University, ~loomingtonI,n diana
UL~ILL ee University of Michigan, Ann Arbor, Michigan
University. of ~ichiganA, nn Arbor, ~ichigan
rcus Clemson University, Clemson, South Carolina
yers Leco Corporation, St. Joseph, ~ichigan
vii
viii Contri~uto~s
John VV. Olesik The Ohio State Univer~iC~o,l umbus, Ohio
Stephen J. Ray ~ndianaU niversi~~, loomington~, ndiana
~ aRehrkam~per Universitaet ~uenste~~u ensteG~er many
Lee R. ~ ~ ~ O~ak Ruidget Naitio nal ~boratoryO, ak Ridge, Tennessee
avid H. Smith Oak Ridge ~ationaLl aboratory, Oak Ridge, Tennessee
arm L. Sutton Universi~of ~incinnatiC, in€inna~iO, hio
.
Watson Universi~of Florida, Gainesville, Florida