Table Of ContentImpact of Electron and Scanning Probe Microscopy
on Materials Research
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Series E: Applied Sciences - Vol. 364
Impact of Electron and
Scanning Probe Microscopy on
Materials Research
edited by
David G. Rickerby
European Community Joint Research Centre,
Ispra, Italy
Giovanni Valdre
Department of Earth and Geo-Environmental SCiences,
University of Bologna,
Bologna, Italy
and
Ugo Valdre
Department of Physics,
University of Bologna,
Bologna, Italy
.....
"
Springer-Science+Business Media, B.V.
Proceedings of the NATO Advanced Study Institute on
Impact of Electron and Scanning Probe Microscopy on Materials Research
Erice,ltaly
ApriI14-25, 1998
A C.I.P. Catalogue record for this book is available from the Library of Congress.
ISBN 978-0-7923-5940-1 ISBN 978-94-011-4451-3 (eBook)
DOI 10.1007/978-94-011-4451-3
Printed on acid-free paper
AII Rights Reserved
© 1999 Springer Science+Business Media Dordrecht
Originally published by Kluwer Academic Publishers in 1999
Softcover reprint of the hardcover 1st edition 1999
No part of the material protected by this copyright notice may be reproduced or utilized in
any form or by any means, electronic or mechanical, including photocopying, recording or
by any information storage and retrieval system, without written permission from the
copyright owner.
TABLEOFCONTENTS
Preface
Vll
Participantsphotos IX
ListofContributors xiii
ListofParticipants xvii
Theimpactofelectronmicroscopyonmaterials research
G. THOMAS
Microstructuraldesignandtayloringofadvancedmaterials 25
G. THOMAS
Nanostructuredmaterials 41
V. PROVENZANO
Characterization of heterophase transformation interfaces by high-
resolutiontransmissionelectronmicroscopetechniques 63
J.M.HOWE
High resolution scanning electron microscopy observations of nano-
ceramics 109
J.TH.M. DEHOSSON, M. DEHAAS andD.H.J. TEEUW
Metal-ceramicinterfacesstudiedwithhighresolution
transmissionelectronmicroscopy 135
J.TH.M. DEHOSSON, RB. GROEN, BJ. KOOI and
W.P. VELINGA
Z-contrastscanningtransmissionelectronmicroscopy 161
S.J. PENNYCOOKand P.D. NELLIST
Electronenergylossspectrometryintheelectronmicroscope- Part I:
Introduction 209
L.M.BROWN
Electronenergylossspectrometryintheelectronmicroscope- Part2:
EELSinthecontextofsolidstatespectroscopies 231
L.M.BROWN
Electronenergylossspectrometryintheelectronmicroscope- Part3:
Interfacesandlocalisedspectrometry 251
L. M. BROWN
EELS near edge structures. Application to intermetallic alloys and
othermaterials 265
G.A. BOTION
VI
Surface chemistIy and microstructure analysis of novel technological 301
materials
M.L. TRUDEAU
Convergentbeamelectrondiffraction 325
C.J. HUMPHREYS
Newdevelopmentsinscanningprobemicroscopy 339
E. MEYER, M. GUGGISBERG, CH. LOPPACHER, F. BATTISTON,
T. GYALOG, M. BAMMERLIN, R. BENNEWITZ,1. LV,
T. LEHMANN, A. BARATOFF, H.-1. GUNTHERODT, R. LUTHI,
CH.GERBER,R. BERGER,J. GIMZEWSKIandL. SCANDELLA
Low-energyscanningelectronmicroscopefornanolithography 359
A. ZLATKINandN. GARCiA
ApplicationoflowvoltageScanningElectronMicroscopyandenergy 367
dispersivex-rayspectroscopy
D. G. RICKERBY
EnvironmentalSEMandrelatedapplications. Historyoftheenvironmental 387
SEMandbasicdesignconcepts
T. A.HARDT
EnvironmentalSEMandrelatedapplications. Gasinteractionsand 397
gaseousamplification
T. A. HARDT
EnvironmentalSEMandrelatedapplications. Applications 407
T.A.HARDT
ESEM imagecontrastandapplicationsto wetorganic materials 415
ATHENEM. DONALDand B.L. TIITEL
Advancedelectronandscanningprobemicroscopyondentalandmedical
materialsresearch 445
G. VALDRE
Correlativemicroscopyandprobing in materialsscience 455
G. VALDRE
Epilogue 473
Subjectindex 477
PREFACE
The Advanced Study Institute provided an opportunity for researchers in universities,
industryandNational and International Laboratories, from the disciplines ofmaterials
science, physics, chemistry and engineering to meet together in an assessment ofthe
impact of electron and scanning probe microscopy on advanced material research.
Since these researchers have traditionally relied upon different approaches, due to
their different scientific background, to advanced materials problem solving,
presentations and discussion within the Institute sessions were initially devoted to
developingasetofmutually understood basic concepts, inherentlyrelated to different
techniquesofcharacterizationbymicroscopyandspectroscopy.
Particular importance was placed on Electron Energy Loss Spectroscopy (EELS),
Scanning Probe Microscopy (SPM), High Resolution Transmission and Scanning
Electron Microscopy (HRTEM, HRSTEM) and Environmental Scanning Electron
Microscopy(ESEM).
It was recognized that the electronic structure derived directly from EELS analysis as
well as from atomic positions in HRTEM or High Angle Annular Dark Field STEM
can be used to understand the macroscopic behaviour of materials. The emphasis,
however, was upon the analysis ofthe electronic band structure ofgrain boundaries,
fundamental for the understanding of macroscopic quantities such as strength,
cohesion, plasticity, etc.
Similarly, it was recognised that scanning probe microscopy can be used to
understand at the atomic level modification ofthe surfaces of materials as well as
physical properties such as magnetic and electric fields, and chemical reactions and
transformations at the surface. In addition, ESEM recovered the importance as a
methodology useful for in-situ transformation study well above the water vapor
pressureatroomtemperature.
The foci were upon recent advances in real space imaging by transmission electron
microscopyand inspatially-resolved spectrometrywhich allow atomic resolution and
the acquisition of EEL spectra from areas ofabout 0.2 nm diameter with energy
resolution<0.5 eV.
The versatility ofthe scanningelectron microscope (SEM) has been further enhanced
by the development ofenvironmental SEM and the widespread use offield emission
electron guns to allow high resolution imaging at low accelerating voltages (1-5 kV),
particularly of semiconductors and non-conductors such as ceramics, glasses and
vii
Vlll
polymers. Improved precision in spatial resolution and computation is obtained in
energydispersive x-raymicroanalysis.
At the same time, scanning probe microscopy has provided atomic resolution
capability on both conducting and non-conducting surfaces, while a variety ofnovel
scanning probe techniques, such as magnetic force, electric force, thermal probe and
frictional force microscopy have emerged as alternative or complementarytechniques
for non-destructive surface studies and localized measurements of physical material
properties in variousenvironments: air, liquidsorultrahigh vacuum.
These techniques were shown to provide a formidable arsenal for materials
researchers by case studies in areas such as electronics device fabrication, thin film
technology, sensors, aerospace alloys, petrochemicals, metallurgical engineering,
materials for conventional and nuclear power plants, corrosion and wear resistant
coatings, structural ceramics, ceramics and metal matrix composites, polymers and
textiles, biomaterials, nanostructured materials, recordingmedia.
Finally, the progress made toward an understanding of the key-role that spatially
resolved diagnostic methods play in the design ofnew materials and more often in the
recyclingofoldoneswassubjectofconsideration.
We acknowledge the sponsorship ofNATO Scientific Affairs Division, the European
Commission DG XII, TMRProgram, the Italian Ministry ofUniversity and Scientific
Research, the Sicilian Regional Government, the Ettore Majorana Centre for
Scientific Culture, Erice and the patronage of the Italian Society of Electron
Microscopy (SIME). Thanks are due to FEI-Philips Electron Optics, Italy, Digital
Instruments Inc., USA and LOT Oriel Italia for the provision ofinstrumentation and
assistance for practicaldemonstrations.
DavidG. Rickerby, Giovanni Valdreand UgoValdre
Erice,25 April 1998
