Handbook of Speckle Interferometry

121 Pages·2022·33.183 MB·English

by  Abundio Dávila

Handbook of H
a
n
Speckle
d
b
o
o
Interferometry k

o
f

S
p
e
c
k
l
e
Abundio Dávila I
n
t
e
r
f
e
r
o
m Handbook of
e
This handbook is an introduction to speckle techniques to help nonspecialists t
r Speckle
y
understand the basic principles of speckle interferometry. The book mainly
focuses on the use of speckle patterns with direct phase-measuring methods that
produce an instantaneous phase. The major electronic speckle pattern Interferometry
interferometry (ESPI) techniques are presented using simplified mathematical
notation that includes rigid-body and standard-body displacements to estimate
object pose changes with six degrees of freedom. Additionally, the adoption of
temporal phase unwrapping instead of spatial phase unwrapping is promoted.
This handbook also includes a summary of recent industrial applications, with an
update on current research in the ESPI field.
D
Á
V
IL
A
P.O. Box 10 Abundio Dávila
Bellingham, WA 98227-0010
ISBN: 9781510645387
SPIE Vol. No.: TT122
TT122

Tutorial Texts Series Related Titles
(cid:129) Interferometry for Precision Measurement, Peter Langenbeck, Vol. TT94
(cid:129) Modulation Transfer Function in Optical and Electro-Optical Systems, Second
Edition, Glenn D. Boreman, Vol. TT121
(cid:129) Practical Optical Dimensional Metrology, Kevin G. Harding, Vol. TT119
(ForacompletelistofTutorialTexts,seehttp://spie.org/publications/books/tutorial-texts.)
Other Related SPIE Press Titles
SPIE Field Guides:
(cid:129) InterferometricOpticalTesting,EricP.GoodwinandJamesC.Wyant,Vol.FG10
(cid:129) Displacement Measuring Interferometry, Jonathan D. Ellis, Vol. FG30
SPIE Press Monographs:
(cid:129) Analog and Digital Holography with MATLAB®, Georges T. Nehmetallah, Rola
Aylo, and Logan Williams, Vol. PM256
(cid:129) Digital Shearography: New Developments and Applications, Lianxiang Yang and
Xin Xie, Vol. PM267
(cid:129) Digital Shearography: Theory and Application of Digital Speckle Pattern Shearing
Interferometry, Wolfgang Steinchen and Lianxiang Yang, Vol. PM100
(cid:129) Robust Speckle Metrology Techniques for Stress Analysis and NDT, Matias R.
Viotti and Armando Albertazzi, Jr., Vol. PM251
(cid:129) Selected Papers on Electronic Speckle Pattern Interferometry: Principles and
Practice, Peter Meinlschmidt, Klaus D. Hinsch, and Rajpal S. Sirohi, Eds.,
Vol. MS132
(cid:129) SpecklePhenomenainOptics:TheoryandApplications,SecondEdition,JosephW.
Goodman, Vol. PM312
(cid:129) Tissue Optics: Light Scattering Methods and Instruments for Medical Diagnostics,
Third Edition, Valery V. Tuchin, Vol. PM254

Library of Congress Cataloging-in-Publication Data
Names: Dávila, Abundio, author.
Title: Handbook of speckle interferometry / Abundio Dávila.
Description: Bellingham, Washington : SPIE, [2022] | Includes bibliographical
references and index.
Identifiers: LCCN 2021021942 (print) | LCCN 2021021943 (ebook) | ISBN
9781510645387 (paperback) | ISBN 9781510645394 (pdf)
Subjects: LCSH: Holographic interferometry. | Speckle metrology.
Classification: LCC TA1555 .D38 2021 (print) | LCC TA1555 (ebook) | DDC
621.36/75–dc23
LC record available at https://lccn.loc.gov/2021021942
LC ebook record available at https://lccn.loc.gov/2021021943
Published by
SPIE
P.O. Box 10
Bellingham, Washington 98227-0010 USA
Phone: [phone]
Fax: [phone]
Email: [email protected]
Web: http://spie.org
Copyright © 2022 Society of Photo-Optical Instrumentation Engineers (SPIE)
All rights reserved. No part of this publication may be reproduced or distributed in
any form or by any means without written permission of the publisher.
Thecontentofthisbookreflectstheworkandthoughtoftheauthor.Everyefforthas
been made to publish reliable and accurate information herein, but the publisher is
notresponsibleforthevalidityoftheinformationorforanyoutcomesresultingfrom
reliance thereon.
Printed in the United States of America.
First printing
For updates to this book, visit http://spie.org and type “TT122” in the search field.
Introduction to the Series
The Tutorial Text series provides readers with an introductory reference text
to a particular field or technology. The books in the series are different from
other technical monographs and textbooks in the manner in which the
material is presented. True to their name, they are tutorial in nature, and
graphical and illustrative material is used whenever possible to better explain
basic and more-advanced topics. Heavy use of tabular reference data and
numerous examples further explain the presented concept. A grasp of the
material can be deepened and clarified by taking corresponding SPIE short
courses.
The initial concept for the series came from Jim Harrington (1942–2018)
in 1989. Jim served as Series Editor from its inception to 2018. The Tutorial
Texts have grown in popularity and scope of material covered since 1989.
They are popular because they provide a ready reference for those wishing to
learnaboutemergingtechnologiesorthelatestinformationwithinanewfield.
Thetopicsintheserieshavegrownfromgeometricaloptics,opticaldetectors,
and image processing to include the emerging fields of nanotechnology,
biomedical optics, engineered materials, data processing, and laser technolo-
gies. Authors contributing to the series are instructed to provide introductory
material so that those new to the field may usethe book as a starting point to
get a basic grasp of the material.
The publishing time for Tutorial Texts is kept to a minimum so that the
bookscanbeastimelyandup-to-date aspossible.Whenaproposalforatext
is received, it is evaluated to determine the relevance of the proposed topic.
This initial reviewing process helps authors identify additional material or
changes in approach early in the writing process, which results in a stronger
book. Once a manuscript is completed, it is peer reviewed by multiple experts
in the field to ensure that it accurately communicates the key components of
the science and technologies in a tutorial style.
It is my goal to continue to maintain the style and quality of books in the
series and to further expand the topic areas to include new emerging fields as
they become of interest to our readers.
Jessica DeGroote Nelson
Optimax Systems, Inc.
v

Contents
Preface ix
Acknowledgements ix
Motivation x
Objectives xi
1 Fundamentals of Interference 1
1.1 Interference 1
1.1.1 Interference by two wavefronts 2
1.2 Coherence Length 2
1.3 Laser Properties 3
1.4 Speckle Fundamentals 3
1.4.1 Subjective speckle 5
1.4.2 Objective speckle 6
1.4.3 Speckle with partially coherent light 6
2 Speckle Interference and Displacement 9
2.1 Rigid Body Movement 10
2.2 Intensity Correlation for Open or Closed Fringes 12
2.3 Carrier Fringe Patterns in Speckle Interferometry for Open-Fringe
Generation 14
2.4 Practical Removal of Environmental Instabilities 18
3 Electronic Speckle Pattern Interferometers 19
3.1 Out-of-Plane Electronic Speckle Pattern Interferometer 19
3.2 In-plane Electronic Speckle Pattern Interferometer 22
3.2.1 Generation of carrier fringes by rotation only (g) 23
3.2.2 Contouring 26
3.3 Shearography 27
3.3.1 Carriers in shearography 29
3.3.2 Contouring in shearography 31
4 Illumination and Displacement Detection 33
4.1 Illumination Using Two Simultaneous Light Sources 33
4.2 Three Sequential Illuminations Using a Single Light Source 34
4.2.1 L-shaped sequential illumination 35
4.2.2 Triangular sequential illuminations: Inverted T and equal angles 37
vii
viii Contents
5 Transient Displacement Analysis 41
5.1 Recording of Transient Events 42
5.1.1 Recording a simple fast event 42
5.2 Recording Interferometric Events 43
5.3 Camera Acquisition and Synchrony Methods Using Pulsed Lasers 46
5.3.1 Method 1: Single pulse per camera frame 46
5.3.2 Method 2: Single-pulse time delay per camera frame 47
5.3.3 Method 3: Twin pulses per two camera frames 49
5.3.4 Method 4: Twin pulses per frame 51
6 Phase Detection 53
6.1 Carriers in Single-Shot Phase Detection 53
6.1.1 Spatial synchronous detection 54
6.1.2 Fourier transform method for difference of phase 57
6.1.3 Carrier phase limits 59
6.1.3.1 Carrier frequency precision 59
6.1.3.2 Bandwidth 60
6.1.3.3 Signal-to-noise ratio and speckle size 60
6.1.3.4 Filtering and sampling 61
6.2 Spatial Phase Shifting Using Carriers 61
6.3 Phase Shifting Using Four Quadrants in the Image Plane 64
6.4 Phase Shifting in Adjacent Pixels Using Polarization 65
6.5 Heterodyne Interferometry 67
6.6 Phase Shifting and Vortex Singularity Location 68
6.7 Temporal Phase Unwrapping 68
7 Overview of Applications 75
Appendix: Speckle Statistics 77
References 79
Index 103