Table Of ContentFast Electrical and Optical Measurements
Volume I
NATO ASI Series
Advanced Science Institutes Series
A Series presenting the results of activities sponsored by the NA TO Science
Committee, which aims at the dissemination of advanced scientific and technological
knowledge, with a view to strengthening links between scientific communities.
The Series is published by an international board of publishers in conjunction with the
NATO Scientific Affairs Division
A Life Sciences Plenum Publishing Corporation
B Physics London and New York
C Mathematical and D. Reidel Publishing Company
Physical Sciences Dordrecht and Boston
D Behavioural and Martinus Nijhoff Publishers
Social Sciences DordrechtiBoston/Lancaster
E Applied Sciences
F Computer and Springer-Verlag
Systems Sciences Berlin/Heidelberg/New York
G Ecological Sciences
Series E: Applied Sciences - No. 108
Fast Electrical and
Optical Measurements
Volume I - Current and Voltage
Measurements
edited by
James E. Thompson, PhD.
Chairman, Electrical Engineering Department
University of Texas at Arlington
Arlington, Texas 76019, USA
Lawrence H. Luessen
Head, Directed Energy Branch
Naval Surface Weapons Center
Dahlgren, Virginia 22448, USA
Editorial Committee:
Anthony K. Hyder, Jr., PhD.
Associate Vice President for Research
Auburn University, Auburn, Alabama, USA
Millard F. Rose, PhD.
Director, Space Power Institute
Auburn University, Auburn, Alabama, USA
Magna Kristiansen, PhD.
PW. Horn Professor of Electrical Engineering
Texas Tech University, Lubbock, Texas, USA
Susie M. Anderson
EG&G Washington Analytical Services
Dahlgren, Virginia, USA
1986 Springer-Science+Business Media, B.V.
Proceedings of the NATO Advanced Study Institute on Fast Electrical and Optical
Diagnostic Principles and Techniques, II Ciocco, Castelvecchio Pascoli, Italy, July
10-24, 1983
Library of Congress Cataloging in Publication Data
NATO Advanced Study Institute on Fast Electrical
and Optical Diagnostic Principles and Techniques
(1983 : Castelvecchio Pascoli, Italy)
Fast electrical and optical measurements.
(NATO AS! series. Series E, Applied sciences
108-109)
"Proceedings of the NATO Advanced Study Institute
on Fast Electrical and Optical Diagnostic Principles
and Techniques, II Ciocco, Castelvecchio Pascoli,
Italy, July 10-24, 1983"--T-.p. verso.
"Published in cooperation with NATO Scientific
Affairs Division."
Includes index.
1. Electric measurements--Congresses. 2. Optical
measurements--Congresses. I. Thompson, James E.
I I. Luessen, Lawrence H. I I I. North At lant ic Treaty
Organization. Scientific Affairs Division. IV. Title.
V. Series.
TK277.N37 1983 621.37 86-700
ISBN 978-94-017-0447-2 ISBN 978-94-017-0445-8 (eBook)
DOI 10.1007/978-94-017-0445-8
Ail rights reserved. No part of this publication may be reproduced, stored in a
retrieval system, or transmitted, in any form or by any means, mechanical,
photocopying, recording, or otherwise, without the prior written permission of the
publishers,
Copyright © 1986 by Springer Science+Business Media Dordrecht
Originally published by Martinus Nijhoff Publisher, Dordrecht in 1986.
Softcover reprint of the hardcover 1st edition 1986
v
PREFACE
An Advanced Study Institute on Fast Electrical and Optical
Diagnostic Principles and Techniques was held at II Ciocco,
Castelvecchio Pascoli, Italy, 10-24 July 1983. This publication
is the Proceedings from that Institute.
The Institute was attended by ninety-seven participants
representing the United States, West Germany, the United Kingdom,
Switzerland, Norway, the Netherlands, Italy, and France.
The objective of the Institute was to provide a broad but
comprehensive presentation of the various measurement and analy
sis techniques that can be employed to investigate fast physical
events, nominally in the sub-microsecond regime. This requires
both an understanding of the basic principles underlying the
diagnostic employed and its limitations, and a knowledge of the
practical techniques available to obtain reliable and repeatable
data. This Institute was thus structured to begin tutorially,
followed by more practical techniques, demonstrations, and
discussions.
The Institute was divided into the following major sections:
(1) Overview of Applications and Needs; (2) Voltage and Current
Measurements; (3) Data Acquisition; (4) Grounding and Shield
ing; (5) Fast Photography; (6) Refractive Index Measurements;
(7) X-ray Diagnostics; (8) Spectroscopy; and (9) Active Opti
cal Techniques. This Proceeding has been divided into two
separate volumes. Volume 1, Current and Voltage Measurements,
includes Sections (1) through (4) above; Volume 2, Optical Meas
urements, includes Sections (5) through (9).
In addition, three sessions were made up of presentations
contributed by participants which summarized various research
efforts employing high-speed diagnostics; these presentations
have not been included in this Proceedings. Several companies
also displayed and demonstrated high-speed diagnostic equipment.
We are grateful to a number of organizations for providing
the financial assistance that made this Institute possible.
Foremost is the NATO Scientific Affairs Division, which provided
the single most major contribution for the Institute. In addi
tion, the following US sources made contributions: the Naval
VI
Surface Weapons Center, Air Force Office of Scientific Research,
Office of Naval Research, Air Force Wright Aeronautical Labora
tories, Army Electronics Research and Development Command, and
Naval Research Laboratory.
We would also like to thank the staff of II Ciocco, partic
ularly GianPiero Giannotti, its manager, and Bruno Giannasi, the
Hotel's Conference Coordinator and the main reason for the on
site success of the Institute. The phrase "Ask Bruno" is now
firmly imbedded in the memory of all in attendance for those
two wonderful weeks in Tuscany. Our thanks to Dr. Mario di Lullo
and Dr. Craig Sinclair, the present Directors of the NATO ASI
Program, and Dr. Tilo Kester and his wife Barbara, of the
Publications Coordination Office, for their suggestions, patience,
and overall help.
Particular thanks to our Associate Editors who willingly
volunteered to assist us in reviewing and editing the manu
scripts: Anthony Hyder of Auburn University, Kris Kristiansen
of Texas Tech University, and Frank Rose, formerly of the Naval
Surface Weapons Center, and now keeping Dr. Hyder company at
Auburn University. To our Organizing Committee, lecturers, and
participants - we couldn't have done it without you. And a
special thanks to our wives Lynn L. and Elizabeth T., for their
assistance during the Institute; and to Linda Maynard of the
Universtiy of South Carolina's Office of Continuing Engineering
Education, for her efforts before, during, and following the
Institute.
And finally, our appreciation to those most responsible
for the actual production of this Proceedings. First, to the
EG&G Washington Analytical Services Center Office at Dahlgren,
Virginia, which had the task of centrally retyping every lec
turer's manuscript and producing a camera-ready document for
delivery to the publisher. To Susie M. Anderson, the Supervisor
for Word Processing, and Christie K. Wood - thank you for a job
well done. Second, to Martinus Nijhoff Publishers, especially
Henny Hoogervorst, who had to contend with numerous delays in the
delivery of the final manuscript, but never lost her sense of
purpose or humor during the past two years.
Lawrence H. Luessen
Naval Surface Weapons Center
Dahlgren, Virginia
James E. Thompson
University of Texas
Arlington, Texas
September 1985
VII
CONTENTS
VOLUME 1: CURRENT AND VOLTAGE MEASUREMENTS
OVERVIEW OF APPLICATIONS AND NEEDS
Overview of Applications and Needs . . . . 1
M. F. Rose, A. K. Hyder, M. Kristiansen
VOLTAGE AND CURRENT MEASUREMENTS
Electro-Optical Measurement Techniques . . . . 5
R. Hebner
Electro-Optical and Magneto-Optical Studies of
Cold Cathode Electron Beam Gun Discharges 27
M. Hugenschmidt
Fiber Optic Magnetic Field and Current Sensors . . . . .. 41
G. Chandler
An Electro-Optical Technique for Measuring High
Frequency Free-Space Electric Fields . . . 57
J. Chang and C. N. Vittitoe
Electromagnetic Sensors and Measurement Techniques 73
C. E. Baum
Ultrafast Electral Voltage and Current Monitors 145
W. Pfeiffer
High Speed Electric Field and Voltage Measurements . . .. 175
M. S. DiCapua
High Speed Magnetic Field and Current Measurements . . .. 223
M. S. DiCapua
VIII CONTENTS
Nuclear Reaction Diagnostics for Intense Particle
Beam Measurements . . . • • . . . • 263
R. J. Leeper
Particle Analyzer Diagnostics for Intense Particle
Beam Measurements . • • . . • . . . . 317
R. J. Leeper, J. R. Lee, L. Wissell, D. J. Johnson,
and W. A. Stygar
DATA ACQUISITION
Software Correction of Measured Pulse Data 351
N. J. Nahman
Fiber Optic Links for Data Acquisition, Communication,
and Control . . . . . . . . . . . . . . . . . . 419
G. Chandler
A High Speed Multi-Channel Data Recorder 437
J. Chang, J. Foesch, and C. Martinez
An Iterative Deconvolution Algorithm for the
Reconstruction of High-Voltage Impulses
Distorted by the Measuring System 445
K. Schon
Test Methods for the Dynamic Performance of Fast
Digital Recorders . . . . . . . . . . 453
K. Schon
GROUNDING AND SHIELDING
Electromagnetic Topology for the Analysis and Design
of Complex Electromagnetic Systems . • .. .... 467
C. E. Baum
Basic Principles of Grounding and Shielding with
Respect to Equivalent Circuits . . . . . . 549
J. Wiesinger
System Design: Practical Shielding and Gounding
Techniques Based on Electromagnetic Topology 567
W. Graf
A Systematic, Practical Approach to the Design of
Shielded Enclosures for ,Data Acquisition and
Control ................. . 585
G. Chandler
CONTENTS IX
VOLUME 2: OPTICAL MEASUREMENTS
FAST PHOTOGRAPHY
Advances in High Speed Photography: 1972 - 1982 595
J. S. Courtney-Pratt
Recent Techniques for High-Speed Photography and
Low-Level Image Recording . . . . . . . . 609
W. Pfeiffer
Laser Photographic and Cinematographic Applications
to the Investigation of Transient Phenomena 643
M. Hugenschmidt
REFRACTIVE INDEX MEASUREMENTS
Concepts and Illustrations of Optical Probing
Diagnostics for Laser-Produced Plasmas . 691
J. A. Stamper, E. A. McLean, S. P. Okenschain,
and B. H. Ripin
Sub-Nanosecond, Four-Frame, Holographic Interferometry
Diagnostics . . . . . . . . . . . . . . . . 729
G. Allen, H. P. Davis, L. P. Mix, and J. Chang
Laser Interferometry: Streaked Shadowgraphy and
Schlieren Imaging . . . . . . . . . 743
C. Popovics and R. Benattar
Moire-Schlieren, Time-Differential Interferometry,
and Enhanced Sensitivity of Faraday Rotation
Measurements 771
P. R. Forman
Twenty-Picosecond Pulsed UV Holographic Interferometry
of Laser-Induced Plasmas . . . . . . . . . . . . 789
G. E. Busch
X-RAY DIAGNOSTICS
Nondispersive X-Ray Diagnostics of Short-Lived
Plasmas . . . . . . . . . . . . . . . . 795
R. H. Day
High Energy X-Ray Diagnostics of Short-Lived Plasmas . .. 827
R. H. Day
