Table Of ContentExchange bias of a ferromagnetic semiconductor by a ferromagnetic metal
K. Olejnik,1,2 P. Wadley,3 J. Haigh,3 K. W. Edmonds,3 R. P. Campion,3 A. W. Rushforth,3 B. L. Gallagher,3
C. T. Foxon,3 T. Jungwirth,2,3 J. Wunderlich,1,2 S. S. Dhesi,4 S. Cavill,4 G. van der Laan,4 and E. Arenholz5
1Hitachi Cambridge Laboratory, Cambridge CB3 0HE, United Kingdom
2Institute of Physics ASCR, v.v.i., Cukrovarnicka 10, 16253 Praha 6, Czech Republic
3School of Physics and Astronomy, University of Nottingham, Nottingham NG7 2RD, United Kingdom
4Diamond Light Source, Harwell Science and Innovation Campus,
Didcot, Oxfordshire, OX11 0DE, United Kingdom
5Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA
0
1 (Dated: January 14, 2010)
0
Wedemonstrateanexchangebiasin(Ga,Mn)Asinducedbyantiferromagnetic couplingtoathin
2
overlayer of Fe. Bias fields of up to 240 Oe are observed. Using element-specific x-ray magnetic
n circular dichroism measurements, we distinguish a strongly exchange coupled (Ga,Mn)As interface
a layer in addition to the biassed bulk of the (Ga,Mn)As film. The interface layer remains polarized
J at room temperature.
4
1 PACSnumbers: 75.70.Cn,75.50.Pp,75.50.Bb
]
ci Ferromagnetic(FM)semiconductorsoffertheprospect which may further disrupt the interface order. The ori-
s of combining high-density storage and gate-controlled ginoftheinterfacemagnetismthenhadtobeinferredby
- logic in a single material. The realization of spin-valve comparisontoaseriesofreferencesamples7. Demonstra-
l
r devices from FM semiconductors requires the controlled tion of coupling between the bulk of the layers, i.e., an
t
m switching of magnetization in adjacent layers between exchangebiaseffect,wouldprovidedirectevidenceofthe
. antiferromagnetic (AFM) and FM configurations. This interfacemagneticorder. Moreover,suchcouplingwould
t
a has motivated several theoretical investigations of inter- offer new means of manipulating the FM semiconductor
m layer coupling in all-semiconductor devices1, and AFM spin state and utilizing the proximity polarization effect
- coupling has recently been demonstrated in (Ga,Mn)As in a spintronic device.
d multilayers separated by p-type non-magnetic spacers2. Here, we demonstrate an antiferromagnetic coupling
n
However, the Curie temperature T of (Ga,Mn)As is and exchange bias in Fe/(Ga,Mn)As bilayer films, by
C
o
currently limited to 185 K in single layers3, and is combining element-specific XMCD measurements and
c
[ typically much lower for layers embedded within a bulk-sensitive superconducting quantuminterference de-
heterostructure2, which is an obstacle to the practical vice (SQUID) magnetometry. As with previous studies
1 implementation of semiconductor spintronics. of FM metal/FM semiconductor bilayers4,5 (and in con-
v
ThedevelopmentofFMmetal/FMsemiconductorhet- trasttoAFMcoupledFMmetal/FMmetalexchangebias
9
erostructures has the potential to bring together the structures10,11) the layers are in direct contact without
4
4 benefits of metal and semiconductor based spintron- a non-magnetic spacer in between. We distinguish in-
2 ics, offering access to new functionalities and physi- terface and bulk (Ga,Mn)As layers that are respectively
. cal phenomena. Recent studies of MnAs/(Ga,Mn)As stronglyandweaklyantiferromagneticallycoupledtothe
1
0 and NiFe/(Ga,Mn)As bilayer films have shown FM in- Feoverlayer. InagreementwithRef.7,theinterfacelayer
0 terlayer coupling and independent magnetization be- remains polarized at room temperature.
1 havior, respectively4,5. Of particular interest is the The Fe and (Ga,Mn)As layers of the present study
: Fe/(Ga,Mn)As system, since the growth of epitaxial werebothgrownby molecularbeamepitaxy inthe same
v
i Fe/GaAs(001) films is well-established6. Remarkably, a ultra-high vacuum system, in order to ensure a clean in-
X
recent x-ray magnetic circular dichroism(XMCD) study terfacebetweenthem. The(Ga,Mn)Aslayerofthickness
r has shown that Fe may induce a proximity polariza- 10 to 50 nm was deposited on a GaAs(001) substrate
a ◦
tion in the near-surface region of (Ga,Mn)As, antipar- at a temperature of 260 C, using previously established
allel to the Fe moment and persisting even above room methods3,8. A low Mn concentration of x ≈ 0.03 was
temperature7. Devices incorporating Fe/(Ga,Mn)As chosen in order to avoid the formation of compensating
therefore offer the prospect of obtaining non-volatile Mn interstitials. The substrate temperature was then
◦
room temperature spin-polarization in a semiconductor. reduced to ∼0 C, before depositing a 2 nm Fe layer,
Untilnow,noinformationhasbeenrevealedaboutthe plus a 2 nm Al capping layer. In-situ reflection high
coupling of Fe to (Ga,Mn)As layers away from the near- energy electron diffraction and ex-situ x-ray reflectivity
surfaceregion. Atthe surface,the (Ga,Mn)As layermay and diffraction measurements confirmed that the layers
behighlynon-stoichiometricandMn-rich,duetoitsnon- are single-crystalline with sub-nm interface roughness.
equilibrium nature8,9. Previously, Fe/(Ga,Mn)As layers SQUIDmagnetometrymeasurementswereperformedus-
wereproducedbyaprocessincludingexposuretoairfol- ing a Quantum Design Magnetic Property Measurement
lowedbysputteringandannealingpriortoFedeposition, System. Mn and Fe L x-ray absorption and XMCD
2,3
2
measurements were performed on beamline I06 at the L absorptionedgesinordertodeterminethemagnetic
2,3
DiamondLightSource,andonbeamline4.0.2attheAd- responseoftheindividualelements. InL XMCD,elec-
2,3
vanced Light Source. Total-electron yield (TEY) and trons are excited from a 2p core level to the unoccupied
fluorescence yield (FY) were monitored simultaneously 3d valence states of the element of interest by circularly
usingthesampledraincurrentandthephotocurrentofa polarized x-rays at the resonance energies of the transi-
◦
diode mountedat90 tothe incidentbeam,respectively. tions. The differencein absorptionforopposite polariza-
SQUID magnetometry measurements were tions gives a direct and element-specific measurement of
first performed on control Fe/GaAs(001) and the projection of the 3d magnetic moment along the x-
(Ga,Mn)As/GaAs(001) samples, grown under the ray polarization vector. The absorption cross-section is
same conditions as the bilayers, to determine the conventionallyobtainedbymeasuringthedecayproducts
magnetic anisotropies of the individual layers and the – either fluorescent x-rays or electrons – of the photoex-
Curie temperature of the (Ga,Mn)As layer. The Fe film cited core hole. The type of decay product measured
has a uniaxial magnetic anisotropy with easy axis along determines the probing depth of the technique. For Mn
the [110] orientation, similar to previous studies6. For L absorption,theprobingdepths forFYandTEYde-
2,3
the (Ga,Mn)As control sample, there is a competition tection are λ ≈ 100 nm and λ ≈ 3 nm. In the
FY TEY
between cubic and uniaxial magnetic anisotropies, with current experiment, the Mn XMCD measured using FY
the former dominant at low temperatures and favoring andTEYarethussensitivetothebulkofthe(Ga,Mn)As
easy axes along the in-plane h100i orientations, and the film and the near-interface layers, respectively.
latter dominant close to T (∼35 K) giving an easy axis Figure2(a)-(c)showsthemagneticfielddependenceof
C
along the [1¯10] orientation. Figure 1 shows [110]magne- XMCD asymmetry, defined as (I −I )/(I +I ) where
l r l r
tization versus temperature curves and low temperature I istheabsorptionforleft-(right-)circularlypolarized
l(r)
hysteresis loops for a bilayer film containing a 20 nm x-rays. ThisismeasuredattheFeandMnL absorption
3
thick (Ga,Mn)As layer. The total remnant moment of peaksfora Fe(2 nm)/(Ga,Mn)As(10nm) sampleat2K.
thebilayerfilmdecreasesoncoolingunderzeromagnetic The external field is applied along the photon incidence
◦
field below the T of the (Ga,Mn)As, indicating that direction, which is at 70 to the surface normal with
C
this layer aligns antiparallel to the Fe magnetization an in-plane projection along the [110] axis. The XMCD
at zero field. The hysteresis curve shows a two-step data show that the Fe film displays a square hysteresis
magnetization reversal, indicating different behavior of loop with a single magnetization switch, as expected for
the Fe and (Ga,Mn)As layers, with the smaller loop a monocrystalline Fe film with strong uniaxial magnetic
attributed to the dilute moment (Ga,Mn)As film. The anisotropy. The Mn XMCD shows a more complicated
minor hysteresis loop shown in Fig. 1 clearly shows a loopduetotheeffectoftheinterlayercoupling. Thepro-
shift from zero field by a bias field H , indicating that jected Mn moment aligns antiparallel to the Fe moment
E
the Fe layer induces an exchange bias in the magnetic atremanence,andundergoesamagnetizationreversalof
semiconductor. The shape and size of the minor loop opposite sign to the Fe. With further increase of the ex-
is in agreement with the hysteresis loop for the control ternal magnetic field, the Mn moment gradually rotates
(Ga,Mn)As sample, also shown in Fig. 1. This strongly away from antiparallel alignment with the Fe layer, and
indicates that the exchange bias affects the whole of the into the field direction. Qualitatively similar behavior
(Ga,Mn)As layer in the bilayer sample. is observed for the Fe(2 nm)/(Ga,Mn)As(20 nm) sam-
Similar behavior is observed for bilayer samples con- ple: the (Ga,Mn)As layer is aligned antiparallel to the
taining a 10 nm or 50 nm (Ga,Mn)As layer, with a Fe layer at zero field, although the bias field is lower by
bias field which is approximately inversely proportional approximately a factor of two.
to the thickness d of the ferromagnetic semiconductor Cleardifferencesareobservedbetweenthe MnXMCD
layer (Fig. 1, inset). This 1/d dependence of H was hysteresis loops obtained using TEY and FY detection
E
found previously for MnAs/(Ga,Mn)As bilayers4, and modes. For FY the magnitude of the XMCD is similar
is generally observed in exchanged-biased thin films12. (but of opposite sign) at remanence and at high mag-
From this dependence it is possible to describe the ex- netic fields, whereas for TEY at remanence it is approx-
changebiasintermsofaninterfaceenergyperunitarea, imately a factor of two larger than at 1000 Oe. The
∆E = M H d = 0.003 erg/cm2. This value is rather Mn L XMCD spectra recorded at remanence and at
FS E 2,3
small compared to typical exchange bias systems12, re- 1000 Oe, shown in Fig. 3, confirm this result. At re-
flecting the low moment density M of the diluted manence the FY and TEY detected XMCD have similar
FS
FM semiconductor layer. However, the bias field for a magnitudes. However, under a large external field the
given (Ga,Mn)As thickness is larger than is observedfor XMCD is substantially smallerin TEYthanin FY, con-
MnO/(Ga,Mn)As structures13, while the reproducibility firming that the net magnetization of the Mn ions near
and flexibility of the present structures is much higher the interface is significantly less than in the bulk of the
due to the single-crystalline ferromagnetic nature of the (Ga,Mn)As film. This is the case even up to the high-
Fe layer. est field applied (20 kOe). By applying the XMCD sum
To confirm the presence of AFM interlayer coupling, rules14totheTEYdata,andbycomparingthespectrato
we performed XMCD measurements at the Mn and Fe previousmeasurementsonwell-characterized(Ga,Mn)As
3
samples15, the projected Mn 3d magnetic moments are monolayers, assuming a uniform distribution of Mn ions
obtained as −1.4 µ and +0.8 µ per ion at remanence and magnetic moments throughout the (Ga,Mn)As film.
B B
and 1000 Oe, respectively. This is around a factor of three thinner than in Ref.7,
Thedifferencebetweenthesevaluescanbeunderstood whichcouldbe duetothe lowerMnconcentrationorthe
as being due to an interface layer which is strongly anti- different preparation method of the present samples.
ferromagnetically coupled to the Fe layer. At zero field, In summary, we have demonstrated antiferromagnetic
both the interfacialandbulk Mn are alignedantiparallel coupling between Fe and (Ga,Mn)As layers in bilayer
totheFelayer. Athighfields,thebulkofthe(Ga,Mn)As structures. A markedlydifferent couplingis observedfor
layerawayfromtheinterfaceisre-orientedintotheexter- the bulk of the (Ga,Mn)As layer and for Mn moments
nal field direction. However, the interfacial Mn remains in the near-interface region. A thickness-dependent ex-
antiparallel to the Fe layer and thus partially compen- change bias field is observed to affect the whole of the
satesthe XMCDsignalfromthe bulkofthe (Ga,Mn)As. bulk (Ga,Mn)As layer, which aligns antiparallel to the
From the size of the remanent and 1000 Oe magnetic Fe layer at low fields, and switches to parallel when the
moments,it canbe estimatedthataround25-30%ofthe external field is large enough to overcome the bias field
TEYXMCDsignalcanbe ascribedtotheinterfacialMn andthemagnetocrystallineanisotropyfields. Incontrast,
which is strongly coupled to the Fe moments. the interfacial Mn moments remain aligned antiparallel
The interfacial Mn moments are ascribed to the prox- to the Fe layer even at 20 kOe, the largest field studied,
imity polarization of the (Ga,Mn)As interface by the Fe and are polarized at temperatures well above the T of
C
layer,suchaswasshownpreviouslybyXMCD aswellas the bulk (Ga,Mn)As layer. The latter observation con-
ab initiotheory7. Evidenceforthiscanbeobservedfrom firms the recently reported result of Ref. 7, in which
measurement of the Mn L XMCD signal at tempera- the Fe/(Ga,Mn)As bilayers were produced by a different
2,3
tures above the (Ga,Mn)As T . Similar to the previous method but showed qualitatively similar behavior of the
C
study7, we observe a small but not negligible signal at interfacial moments. Our results shed new light on the
room temperature (Fig. 3), with opposite sign to the Fe magnetic coupling inFe/(Ga,Mn)As hybridlayerswhich
L XMCD.Itsspectralshapeischaracteristicofalocal- are of potential interest for room temperature spintron-
2,3
ized electronic configuration close to d5, similar to bulk ics, and also offer a means of controlling the spin orien-
(Ga,Mn)As7,9,15 but in contrast to Mn in more metallic tation in a FM semiconductor.
environments such as MnxFe1−x7 or MnAs16. A slight We acknowledge support from EU grants
broadening is observedon the low energy side of the Mn SemiSpinNet-215368 and NAMASTE-214499, and
L peak, whichmay be due to the different screeningin- STFC studentship grant CMPC07100. The Advanced
3
duced by proximity to the Fe layer. Since the measured Light Source is supported by the U.S. Department of
intensity is attenuated with distance z from the surface Energy under Contract No. DE-AC02-05CH11231.
as I = I exp(−z/λ ), the thickness of the strongly We thank Leigh Shelford for help during the Diamond
0 TEY
coupledinterfacelayeris estimatedto be ∼0.7nmor2-3 beamtime.
1 T.Jungwirth,W.A.Atkinson,B.H.Lee,andA.H.Mac- Polesya, H. Ebert, U. Wurstbauer, M. Hochstrasser, G.
Donald, Phys. Rev. B 59, 9818 (1999); P. Sankowski and Rossi, G. Woltersdorf, W. Wegscheider, and C. H. Back,
P. Kacman, Phys. Rev. B 71, 201303(R) (2005); A. D. Phys. Rev.Lett. 101, 267201 (2008).
Giddings, T. Jungwirth, and B. L. Gallagher, Phys. Rev. 8 R.P.Campion,K.W.Edmonds,L.X.Zhao,K.Y.Wang,
B78,165312(2008);K.SzalowskiandT.Balcerzak,Phys. C.T.Foxon,B.L.Gallagher, andC.R.Staddon,J.Crys-
Rev.B 79, 214430 (2009). tal Growth 247, 42 (2003).
2 J.-H. Chung, S. J. Chung, S. Lee, B. J. Kirby, J. A. 9 F.Maccherozzi,G.Panaccione,G.Rossi,M.Hochstrasser,
Borchers, Y. J. Cho, X. Liu, and J. K. Furdyna, Phys. M. Sperl, M. Reinwald, G. Woltersdorf, W. Wegscheider,
Rev.Lett. 101, 237202 (2008). and C. H.Back, Phys.Rev.B 74, 104421 (2006).
3 M. Wang, R. P. Campion, A. W. Rushforth, K. W. Ed- 10 Ch. Binek, S. Polisetty, X. He and A. Berger, Phys. Rev.
monds,C.T.Foxon,andR.P.Campion,Appl.Phys.Lett. Lett. 96, 067201 (2006).
93, 132103 (2008). 11 C. Won,Y.Z. Wu,E. Arenholz, J. Choi, J. Wu,and Z.Q.
4 M. Zhu, M. J. Wilson, B. L. Sheu, P. Mitra, P. Schiffer, Qiu, Phys.Rev.Lett. 99, 077203 (2007).
and N. Samarth, Appl. Phys. Lett. 91, 192503 (2007); M. 12 J.NoguesandI.K.Schuller,J.Magn.Magn.Mater.192,
Zhu, M. J. Wilson, P. Mitra, P. Schiffer, and N. Samarth, 203 (1999).
Phys. Rev.B 78, 195307 (2008). 13 K.F.Eid,M.B.Stone,K.C.Ku,O.Maksimov,P.Schiffer,
5 S. Mark, C. Gould, K. Pappert, J. Wenisch, K. Brunner, N.Samarth,T.C.ShihandC.J.Palmstrom,Appl.Phys.
G.Schmidt,andL.W.Molenkamp,Phys.Rev.Lett.103, Lett. 85, 1556 (2004).
017204 (2009). 14 B. T. Thole, P. Carra, F. Sette, and G. van der Laan,
6 G. Wastlbauer and J.A.C. Bland, Adv. Phys. 54, 137 Phys. Rev. Lett. 68, 1943 (1992); P. Carra, B. T. Thole,
(2005). M.Altarelli,andX.Wang,Phys.Rev.Lett.70,694(1993).
7 F. Maccherozzi, M. Sperl, G. Panaccione, J. Minar, S. 15 T. Jungwirth, J. Masek, K. Y. Wang, K. W. Edmonds,
4
M. Sawicki, M. Polini, J. Sinova, A. H. MacDonald, R. P.
5 Campion,L.X.Zhao,N.R.S.Farley,T.K.Johal,G.van
H = 0.5 kOe derLaan,C.T.Foxon,andB.L.Gallagher, Phys.Rev.B
4 73, 165205 (2006).
16 K. W. Edmonds, A. A. Freeman, N. R. S. Farley, K. Y.
)
mu H = 0 Wang, R. P. Campion, B. L. Gallagher, C. T. Foxon, G.
e 2 vanderLaan,andE.Arenholz,J.Appl.Phys.102,023902
-5 0 40 40 80 (2007).
1 T (K)
(
nt 0 300
e
m e)
o O200
M -2 H (E
100
0
-4 0 20 40
d (nm)
-1000 0 1000
Applied field (Oe)
FIG. 1. (color) Main figure: Major (red/black) and minor
(green) hysteresis loops along the [110] axis at 5 K, for a
Fe (2 nm)/(Ga,Mn)As (20 nm) film, and the hysteresis loop
for a control (Ga,Mn)As (20 nm) film along the same axis
(blue). Left inset: Magnetization versus temperature for the
Fe/(Ga,Mn)Asfilmatremanence(black)andundera500Oe
applied field (red). Right inset: Exchange bias field versus
thickness d of the (Ga,Mn)As film (points) and fit showing
1/d dependence(dashed line).
5
0.2
0.1
0.0
-0.1
-0.2 (a) Fe TEY
y
r
et 0.004
m
m
y
s
a
D 0.000
C
M
X
-0.004 (b) Mn TEY
0.004
0.000
(c) Mn FY
-0.004
-250 0 250 500 750 1000
Field (Oe)
FIG.2. (coloronline)XMCDasymmetryversusappliedfield
along the [110] axis at 2 K, for a Fe (2 nm)/(Ga,Mn)As
(10 nm) film. (a) Fe L3, total electron yield; (b) Mn L3,
total electron yield; (c) Mn L3, fluorescent yield. Black and
redpointsaredataforincreasinganddecreasingfieldsrespec-
tively; lines are to guide theeye.
6
(a) absorption
1.0
)
s
nit
u
b. )
r s
on (a (b) H = 0, T = 2K b. unit
pti ar
r (
so D
b C
a
ay (c) H = 1 kOe, T = 2K XM
r
-
X
0.9
(d) H = 2 kOe, T = 300K
640 650
X-ray energy (eV)
FIG.3. (coloronline)(a)Polarization-averagedMnL2,3spec-
trumfor aFe/(Ga,Mn)As film;(b)XMCD spectrameasured
in remanence at 2 K; (c) XMCD spectra measured under a
1000 Oeapplied field at 2 K;(d)XMCD spectrum measured
under a 2000 Oe applied field at 300 K. XMCD spectra are
obtainedusingTEY(thickredlines)andFY(thinbluelines)
detection.
