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Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability (Frontiers in Electronic Testing) (Frontiers in Electronic Testing) PDF

421 Pages·2007·7.323 MB·English
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by Mohammad Tehranipoor| 2007| 421 pages| 7.323| English

About Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability (Frontiers in Electronic Testing) (Frontiers in Electronic Testing)

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality. Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.

Detailed Information

Author:Mohammad Tehranipoor
Publication Year:2007
ISBN:9780387747460
Pages:421
Language:English
File Size:7.323
Format:PDF
Price:FREE
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