Dynamic Characterisation of Analogue-to-Digital Converters (Kluwer international series in engineering and computer science, Volume 860)

291 Pages·2005·4.82 MB·English

by  Dominique Dallet

DYNAMICCHARACTERISATIONOF
ANALOGUE-TO-DIGITALCONVERTERS
tekst
THE KLUWER INTERNATIONAL SERIES IN ENGINEERING AND
COMPUTER SCIENCE
ANALOG CIRCUITS AND SIGNAL PROCESSING
Consulting Editor: Mohammed Ismail. Ohio State University
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DYNAMIC
CHARACTERISATION OF
ANALOGUE-TO-DIGITAL
CONVERTERS
by
Dominique Dallet
Laboratoire IXL-ENSEIRB,
Bordeaux, France
and
José Machado da Silva
Universidade do Porto,
INESC-Porto, Portugal
AC.I.P. Catalogue record for this book is available from the Library of Congress.
ISBN-10 0-387-25902-3 (HB)
ISBN-13 978-0-387-25902-4 (HB)
ISBN-10 0-387-25903-1 (e-book)
ISBN-13 978-0-387-25903-1 (e-book)
Published by Kluwer Academic Publishers,
P.O. Box 17, 3300 AADordrecht, The Netherlands.
www.springeronline.com
Printed on acid-free paper
All Rights Reserved
© 2005 Springer
No part of this work may be reproduced, stored in a retrieval system, or transmitted
in any form or by any means, electronic, mechanical, photocopying, microfilming, recording
or otherwise, without written permission from the Publisher, with the exception
of any material supplied specifically for the purpose of being entered
and executed on a computer system, for exclusive use by the purchaser of the work.
Printed in the Netherlands.
Contents
Preface ix
ContributingAuthors xi
Introduction xv
Jose´ MachadodaSilva
Glossary xvii
PartI ADCCharacterisationBasedonSinewaveAnalysis
1
ADCApplications,ArchitecturesandTerminology 3
Jose´ MachadodaSilva,HHHe´lioMendonça
1. Introduction 3
2. ADCs’applications 5
3. ADCs’architectures 10
4. Terminology 15
5. QuantisationandA/Dconversion 20
6. Outputcoding 27
7. Errors,non-linearity,noise,anddistortion 31
8. Dataacquisitionandprocessing 40
9. Inputcharacteristics 43
2
SinewaveTestSetup 47
Pierre-YvesRoy,JacquesDurand
1. TestSetupdescription 47
2. Specificationoftheclockandinputsignal 49
3. Exampleoffilterspecification 56
4. Filterselection 57
5. Takingarecordofdata 59
3
Time-DomainDataAnalysis 61
DominiqueDallettt,DjamelHaddadi,PhilippeMarchegay
1. Introduction 61
2. Calculationofthedynamicparameters 62
3. Definitions 62
vi ADCDYNAMICCHARACTERISATION
4. Thefixed-frequencymethod 63
5. Thefour-parametermethod 65
6. DefinitionsofTHDandSNR 70
7. Themulti-harmonicsine-wavefittingmethod 71
8. Estimationofthenormalisedangularfrequency 73
9. Estimationofthelinearparameters 74
10. OntherankofEP 75
11. Thealgorithm 76
12. Multitonetesttocircumventsignalpurityproblems 77
4
Frequency-DomainDataAnalysis 85
Pierre-YvesRoy,JacquesDurand
1. DiscreteFourierTransformandFastFourierTransform 85
2. Choiceofinputandclockfrequencies 86
3. Windowing 86
4. Commentontheaccuracyoftheinputfrequency 88
5. Recordsize 90
6. CalculationofADCdynamicparametersinthefrequencydomain 92
5
CodeHistogramTest 105
GiovanniChiorboli,CarloMorandi
1. Introduction 105
2. The sampplingg strategggyy and its contribution to count variance and
measurementuncertainty 108
3. Additionalcontributionstocountuncertainty: additivenoiseand
jitter 115
4. Factorsaffectingthep.d.f. oftheinputsignal 122
5. Reqquired record lenggth and number of records, expression of mea-
surementuncertainty 133
6. Choiceofthecoveragefactor 139
7. Compparingggthenumberofsamplesrequiredbyrandomandbysyn-
chronoussampling. 141
8. Determiningthetransfercharacteristic 142
9. Offseterrorandgain 143
10. Linearityerrors 147
11. Appendix 148
6
ComparativeStudyofADCSinewaveTestMethods 157
Jose´MachadodaSilva,HHHe´lioMendonça,SarrraMazoleni
1. Introduction 157
2. Generalconsiderations 159
3. Simulationresults 174
4. ATEImplementation 187
5. Conclusions 213
PartII MeasurementofAdditionalParameters
Contents vii
7
JitterMeasurement 219
Pierre-YvesRoy,JacquesDurand
1. Introduction 219
2. Thedoublebeattechnique 220
3. Thejointprobabilitytechnique 230
4. Conclusion 233
8
DifferentialGainandPhaseTesting 235
Jose´MachadodaSilva,HHHe´lioMendonça
1. Introduction 235
2. Testsetupandhardwarerequirements 236
3. Analysis 237
4. Testresults 240
5. Calculationofdifferentialgainandphasefromthetestresults 241
9
StepandTransientResponseMeasurement 243
GiovanniChiorboli,CarloMorandi
1. Introduction 243
2. Settlingtimeandtransitiondurationofstepresponse 245
3. Frequencyresponsemeasurement 249
10
HysteresisMeasurement 255
GiovanniChiorboli,CarloMorandi
1. Introduction 255
2. Testconditions 256
3. Apracticalcase 257
4. CollectionofsamplesinHHHC↑andHHHC↓ 258
5. Somewarning 260
References 265
Index 279
Preface
ThepresentbookisoneoftheoutcomesoftheprojectDYNAD-Methods
andDraftStandardsfortheDynamicCharacterizationandTestingofAnalogue-
to-Digital Converters. This project was held between 1997 and 2000, sup-
ported by the European Commission under the Standards, Measurements and
Testing Programme, reference SMT4-CT98 2214, within the Framework IV
activities. ItsconsortiumcomprisedtheUniversityofParma-Italy, theÉcole
Nationale Superieure d’Electronique, Informatique & Radiocommunications
de Bordeaux - France, Thales (former TTM-Thomson CSF) - France, Italtel
Spa - Italy, Infineon Technologies-Development Center Villach - Austria, and
INESC-Porto - Portugal. Besides the authors of the different chapters of this
book, other people contributed with their work to the start and success of the
initiative. We acknowledge the efforts of Hubert Pernull, Otto Wiedenbauer,
andAndreasBertlfromInfineon,RobertoScottifromItaltel,JorgeDuarteand
JoseMatosfromINESC-Porto, M.HeuberandM.ZirnheldfromThales, and
C.RebaifromENSEIRB.
A state of the art overview of the methods and procedures employed for
characterisingthedynamicperformancebehaviourofanalogue-to-digitalcon-
verters using sinusoidal stimuli, is presented in this book. The three classical
methods — histogram, sine wave fitting, and spectral analysis — are thor-
oughly described, and new approaches are proposed to circumvent some of
theirlimitations.
Thisisamust-havecompendium,whichcanbeusedbybothacademicsand
testprofessionals,tounderstandthefundamentalmathematicsunderliningthe
algorithmsofADCtesting,andasahandbooktohelptheengineerinthemost
importantandcriticaldetailsfortheirimplementation.
DOMINIQUEDALLET,JOS´EMACHADODASILVA
Contributing Authors
CHIORBOLI, Giovanni graduated in Electronic Engineering from the Uni-
versity of Bologna, Italy, in 1987. Until 1990, he was with the University of
Bologna. Since 1990, he has been with the University of Parma, Italy, where
heiscurrentlyanAssociateProfessorofElectronicMeasurements. Hisscien-
tificinterestsareinthefieldofelectronicinstrumentation,analogue-to-digital
and digital-to-analogue modelling and testing, and electrical characterization
ofsemiconductordevicesandmaterialsformicroelectronics.
DALLET, Dominique was born in Rochefort/Mer, France, on July 3, 1964.
HeobtainedhisPhDdegreeinElectricalEngineeringin1995fromtheUniver-
sityofBordeaux1,whereheiscurrentlyaprofessorattheElectronicEngineer-
ingSchoolofBordeaux(ENSEIRB).Hismainresearchactivities, carried-out
at the IXL laboratory, focus on mixed-signal circuit design and testing, digi-
tal and analogue signal processing, and programmable devices’ applications.
His interests include also digital design and its application in BIST structures
for the characterization of embedded A/D converters, as well as, digital sig-
nal processing applied to nondestructive techniques based on time-frequency
representation.
HADDADI, Djamel was born in 1971. He received the Engineer degree in
physics and the Master degree in signal processing in 1996 from the Institut
National Polytechnique de Grenoble, and the PhD degree in Electronics from
the Universit´e Bordeaux 1. He is a product responsible at STMicroelectron-
ics since 2000. His main interests include ATE test and qualification of high
performanceanalogueandmixed-signalICs.