DOCUMENT RESUME ED 224 826 TM 830 012 TITLE Development of USES Specific Aptitude ...

29 Pages·2007·0.48 MB·English

DOCUMENT RESUME
TM 830 012
ED 224 826
Development of USES Specific Aptitude Test Battery
TITLE
for Semiconductor Occupations: Electronics Inspector
(Electronics) II, 726.684-022; Electronics Tester
(Electronics) II, 726.684-026; Semiconductor
Processor (Electronics), 590.684-122. Analysis and
Report.
Employment and Training Administration (DOL),
INSTITUTION
Washington, D.C.
USES-S-471R81
REPORT NO
PUB DATE
81
29p.; Appendix 2 marginally legible due to small
NOTE
print. Developed by Southern Test Development Field
Center, Raleigh, NC, in cooperation with the Texas
State Employment Service.
Reports - Research/Technical (143)
PUB TYPE
MF01/PCO2 Plus Postage.
EDRS PRICE
*Aptitude Tests; *Electronics; Electronic
DESCRIPTORS
Technicians; *Occupational Tests; Personnel
Evaluation; Predictive Measurement; *Test
Construction; Test Use; *Test Validity; *Vocational
Aptitude
Test Batteries; *USES Specific Aptitude Test
IDENTIFIERS
Battery
ABSTRACT
The United States Employment Service (USES) Specific
Aptitude Test Battery (SATB) for Semiconductor Occupations is
evaluated from three points of view: (1) technical adequacy of the
research, (2) fairness to minorities, and (3) usefulness of the
in
battery to United States Employment Service staff and employers
selecting individuals for training in Semiconductor Occupations.
Research demonstrated a statistically significant and useful
relationship between proficiency in these Semiconductor Occupations
increase
and the SATB. The SATB can be expected to produce to useful
in the proportion of highly proficient workers. When the SATB was
applied to the validation sample, composed of individuals who were
employed and therefore could be considered competent, an increase
from 66 percent to 74 percent in the proportion of highly proficient
workers was found. A greater increase can be expected when the
battery is used with applicants, as the range of relevant abilities
is wider among applicants than among employed workers. The report
includes: (1) research summary; (2) procedure; (3) analysis; and, (4)
validity of the battery. Descriptive statistics for subgroups of the
validation sample; descriptive rating scale; and job description are
contained in the appendices. (Author/PM)
***********************************************************************
*
Reproductions supplied by EDRS are the best that can be made
*
*
from the original document.
*
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Development of USES
S-471R81
Specific Aptitude Test Battery
Semiconductor Occupations
(electronics)
U.S. Department of Labor
U.S. DEPARTMENT OF EDUCATION
Employment and Training Administration
NATIONAL INSTITUTE OF EDUCATION
EDUCA TIONAL RESOURCES INFORMATION
U.S. Employment Service
CENTER (ERIC)
1981
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DEVELOPMENT OF USES SPECIFIC APTITUDE TEST BATTERY
for
SEMICONDUCTOR OCCUPATIONS:
726.684-022
ELECTRONICS INSPECTOR (electronics) II
[Semiconductor Inspector (electronics)]
726.684-026
ELECTRONICS TESTER (electronics) II
590.684-022
SEMICONDUCTOR PROCESSOR (electronics)
[Chemical-Etch Operator (electronics)]
590.684-022
SEMICONDUCTOR PROCESSOR (electronics)
[Photoresist Printer (electronics) I]
S-471R81
Analysis and Report
by
Southern Test Development Field Center
Raleigh, North CProlina
Developed in Cooperation with the
Texas State Employment Service
U.S. DEPARTMENT OF LABOR
Employment and Training Administration
United States Employment Service
1981
ACKNOWLEDGMENT
The United States Depantment of Labor and affiliated State Employment Service
Agencies express their sincere gratitude to Texas Instruments Company, Dallas
and Houston, Texas,for cooperating in this research.
TABLE OF CONTENTS
PAGE
ACKNOWLEDGMENT
SUMMARY
1
2
PROCEDURE
2
Job Analysis
Experimental Test Battery
3
Validation Sample Description
3
Criteria for Validation Study
3
6
ANALYSIS
7
VALIDITY OF THE BATTERY
7
Criterion Related Validity
9
Effectiveness of the Battery
9
Subgroup Analysis
APPENDIX 1
Descriptive Statistics for Black, Spanish Surnamed, and
Nonminority Subgroups of Validation Sample
11
APPENDIX 2
13
Descriptive Rating Scale
APPENDIX 3
17
Mixed Standard Rating Scale
.
APPENDIX 4
23
Job Duties
GATB Study No. 3056
DEVELOPMENT OF USES SPECIFIC APTITUDE TEST BATTERY S-471R81
for
SEMICONDUCTOR OCCUPATIONS:
726.684-022
ELECTRONICS INSPECTOR (electronics) II
[Semiconductor Inspector (electronics)] *
726.684-026
ELECTRONICS TESTER (electronics) II
590.b84-022
SEMICONDUCTOR PROCESSOR (electronics)
[Chemical-Etch Operator (electronics)] *
590.684-022
SEMICONDUCTOR PROCESSOR (electronics)
EPhotoresist Printer (electronics) I] *
SUMMARY
evaluate the
This report is designed to provide the information required to
from
Specific Aptitude Test Battery (SATB) for the Semiconductor Occupations
(1) technical adequacy of the research, (2) fairness to
three points of view:
and
minorities, and (3) usefulness of the battery to Employment Service staff
Occupations.
employers in selecting individuals for training in Semiconductor
relationship
Research demonstrated a statistically significant and useful
the following Specific
between proficiency in these Semiconductor Occupations and
Aptitude Test Battery:
Cutting Scores
Aptitudes
70
N - Numerical Aptitude
85
Motor Coordination
k
75
Finger Dexterity
F
90
M - Manual Dexterity
developed, consisted of 644 employed
The validation sample, on which the SATB was
(including 321 blacks, 95 Spanish
workers in the four Semiconductor Occupations
Americans]
1 Puerto Rican, and 18 Spanish
Cuban,
Surnamed [includes 75 -Mexicans,
,
1
Data were collected during
nonminorities).
2 American Indians, 7 Oriental, and 219
Aptitude Test Battery (GATB)
The tests used were those of the General
1979.
of ratings by the supervisors.
Form B-1002B; job proficiency was measured by means
blacks and nonminorities was found; the
No evidence of differences in validity for
using several definitions of
SATB was found to be fair to blacks and nonminorities
the Battery
Additional information may be found in the Validity of
fairness.
section and Appendix 1.
of Occupational
*Undefined related titles as found in the Dictionary
Titles, 4th Edition
-2-
The SATB can be expected to produce a useful increase in the proportion of highly
proficient workers.
When the SATB was applied to the validation sample, composed
of individuals who were employed and therefore could be considered competent, an
increase from 66% to 74% fn the proportion of highly proficient workers was found.
A greater increase can be expected when the battery is used with applicants, as
the range of relevant abilities is wider among applicants than among employed
workers.
PROCEDURE
A concurrent design was used for the validation study; test data were collected
from March through June 199; criterion data were collected from June through
November 1979.
Job Analysis
A job analysis was performed by observing the workers
performance on the job and
by consulting with the workers' supervisors.
On the basis of the job analysis,
job descriptions were prepared which were used to select an experimental sample of
workers in the four Semiconductor Occupations and choose an appropriate criterion
The job descriptions shown in Appendix 4 are the
or measure of job performance.
result of this process and may be used to provide information on the applicability
Each job duty was rated for
of the test battery resulting from this research.
frequency of performance, percentage of time spent, and level of difficulty as
Critical job duties were identified on the basis of
part of the job analysis.
these ratings.
The four jobs were combined into one battery based on the following evidence:
similar
- The job descriptions were
- The aptitude ratings were almost
identical
differences between aptitude-criterion
- There were no significant
correlations
The means and standard deviations of the aptitudes were similar.
The aptitudes were rated as irrelevant, important, or critical to the performance
These ratings were done for each of the four jobs (Electronics
of the job duties.
Inspector II; Electronics Tester II; Semiconductor Processor ahemical-Etch
Operator] ; and Semiconductor Processor [Photoresist Printer Ij and were almost
A synthesis of these ratings and Weir rationale follows:
identical.
Required to align slice with probe points
P - Form Perception
and to properly adjust inker filament; to
align mask under microscope to print
electronic circuits on silicon slices; to
align pattern on mask with pattern on slice;
and to inspect slices for flaws and defects.
Required to accurately read traveler (work
Q - Clerical Perception
order), meters and computer printouts;
to report results of probe tests and
number of slices processed to traveler; to
verify stock number on mask with stock
number shown on traveler; to post information
-3-
to production control inspection sheet to
indicate number and reasons for slices
rejected.
Required to coordinate eyes and hands or
K - Motor Coordination
fingers to adjust equipment controls and
align slice with probes or mask under
microscope; to coordinate eye-hand movement
to move slices under microscope.
Required to adjust microscope and to
F - Finger Dexterity
manipulate tweezers or fingers when picking
up slices.
Required to adjust equipment controls; to
M - Manual Dexterity
move controls to align slice with mask on
"X" and "Y" axes; to load carriers into
feed mechanism of equipment; to manipulate
controls on hood and to.pick up slices
with vacuum pencil to place carriers into
'various solutions and place carrier in oven;
to handle holding jigs and carriers of slices.
Experimental Test Battery
The experimental test battery for the validation sample consisted of all 12 tests
Information on the composition and developmental research
of the GATB, B-1002B.
of the GATB may be found in the Manual for the General Aptitude Test Battery,
Section III, Development, available from the Government Printing Office.
Validation Sample Description
-Occupations
The validation sample consisted of 644 workers in four Semiconductor
(20 males and 624 females) employed at Texas Instruments Company, Dallas and
A total of 425 were minority group members (321 blacks,
Houston, Texas.
Cuban, 1 Puerto Rican, and 18 Spanish
95 Spanish Surnamed [includes 75 Mexicans, 1
2 American Indians, and 7 Oriental) and 219 were nonminority group
Americans.]
,
of
The means and standard deviations for age, education, and experience
members.
No sample members weN test selected.
All
sample members are shown in Table 1.
their current job
workers had a total of at least three months of experience in
Appendix 4.
which has duties similar to those found in the job descriptions in
subgroups are
Descriptive statistics for black, Spanish Surnamed and nonminority
shown in Appendix 1.
Criteria for Validation Study
The
ratings.
The criteria for the validation sample consisted of supervisory
analysts who
ratings were obtained by means of personal visits of test development
Each worker was rated twice
explained the rating procedure to the supervisors.
rating scale with an
by a first line supervisor using a standard descriptive
Each worker was also rated
interval of at least two weeks between the ratings.
Since
standard rating scale.
once by a first line supervisor using a mixed
knowledge of
sample members' test scores are confidential, supervisors had no
(Appendix
The standard descriptive rating scale
the test scores of the workers.
Five of these items cover different aspects of job
2) consists of six items.
"all-around"
The sixth item is a global item on the workers'
performance.
different
Each item has five alternative responses corresponding to
ability.
9
-4-
degrees of job proficiency.
For the purpose of scoring the items, weights of
to 5 were assigned to the respon3es.
The total score on the rating scale
1
is the sum of the weights for the six items.
The possible range for each
rating is 6-30.
A review of the job descriptions indicated that the subjects covered by the
rating scale were directly related to important aspects of job performance:
A - Quantity of work:
Workers in the Semiconductor Occupations must be able
to maintain an acceptable production pace.
B - Quality of work:
Workers in the Semiconductor Occupations must be able
to maintain a high quality of work in order to avoid waste and rework
time.
Accuracy of work:
Workers in the Semiconductor Occupations should be
C
able to adjust equipment with accuracy.
D - Job knowledge:
Workers in the Semiconductor Occupations must have a
knowledge of the procedures and be able to use the equipment and materials
involved in processing silicon slices used in the electronics products.
E - Job versatility:
Workers in the Semiconductor Occupations should be able
to perform the variety of tasks included in the job.
F - "All-around" job ability:
Work in the Semiconductor Occupations involves
a combination of all aspects of job performance stated above which are
valued by the employer.
The mixed standard rating scale consisted of ten triads covering different aspects
of job performance.
A triad consists of three statements describing three levels
of job performance on a specific aspect of the job.
A rater describes the
ratee as performing better than, equal to, or worse than each statement.
A
triad has a score range of 1
to 7 points.
The total rating score is the sum of
The possible range for each rating is 7-70.
the triad scores.
A review of the job descriptions indicated that the subjects covered by the
mixed standard rating scale were directly related to important aspects of job
performance:
Workers in the Semiconductor Occupations must be
- Quantity of work:
Triad 1
able to maintain an acceptable pace.
Workers in the Semiconductor Occupations
Triad 2 - Keeping written records:
should know what production records are required and how to keep an
accurate count.
Workers in the Semiconductor Occupations must possess
Triad 3 - Finger dexterity:
finger dexterity to be able to manipulate small objects and hand tools.
Workers in the Semiconductor Occupations must possess
Triad 4 - V:nual dexterity:
manual dexterity to be able to manipulate equipment and work materials.
Workers in the Semiconductor Occupations should be
Triad 5 - Problem solving:
able to resolve operational problems with a minimum of supervision.
J.