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Characterization Of Semiconductor Materials PDF

341 Pages·1989·16.525 MB·English
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by McGuire G. E. (ed.)| 1989| 341 pages| 16.525| English

About Characterization Of Semiconductor Materials

Characterization of semiconductor materials and methods used to characterize them will be described extensively in this new Noyes series. Written by experts in each subject area, the series will present the most up-to-date information available in this rapidly advancing field. Includes chapters on Electrical Characterization, Ion Mass Spectrometry, Photoelectron Spectroscopy, Ion/Solid Interactions and more.

Detailed Information

Author:McGuire G. E. (ed.)
Publication Year:1989
Pages:341
Language:English
File Size:16.525
Format:PDF
Price:FREE
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