Book of Abstracts - European X-ray Spectrometry Association

371 Pages·2012·28.01 MB·English

by  Dieter Ingerle

EXRS2012,
 June
 18
 -­‐
 22,
 Vienna,
 Austria

European
 Conference
 on
 X-­‐ray

Spectrometry

Organized
 by:

  Atominstitut,
 Vienna
 University
 of
 Technology,
 Vienna,
 Austria

hosted
 by:

  International
 Atomic
 Energy
 Agency,
 Vienna,
 Austria

under
 the
 patronage
 of

the
 Austrian
 Federal
 Ministry
 for
 Science
 and
 Research,
 Vienna,
 Austria

Program,
 General
 Information

and
 Book
 of
 Abstracts
Impressum

Offenlegung
 gemäß
 §
 25
 Mediengesetz:

Atominstitut,
 Vienna
 University
 of
 Technology

1020
 Wien

Radiation
 Physics
 Department

Ao.
 Univ.-­‐Prof.
 DI
 Dr.
 Christina
 Streli

Nutzungsrechte

Copyright
 ©
 by

Technische
 Universität
 Wien

Atominstitut

Stadionallee
 2

A-­‐1020
 Wien

Tel.:
 +43
 1
 58801
 141330

Druck:
 www.grafischeszentrum.com
Welcome

The
 Local
 Organizing
 Committee
 of
 the
 15
 th
 European
 Conference
 on
 X-­‐ray

Spectrometry

 2012
 is
 pleased
 to
 welcome
 all
 participants
 of
 this
 conference.
 About

300
 participants
 from
 61
 countries
 will
 share
 opportunity
 to
 exchange
 ideas
 and

knowledge
 related
 to
 X-­‐ray
 Spectrometry
 ,
 including
 fundamental
 aspects,

technological
 developments,
 traditional
 and
 novel
 areas
 of
 applications
 and

interdisciplinary
 research.

We
 are
 grateful
 to
 our
 sponsors
 and
 all
 people
 that
 helped
 us
 during
 the

organization
 of
 this
 event.
 We
 hope
 you
 will
 enjoy
 the
 conference
 in
 a

 stimulating

and
 friendly
 atmosphere
 .

Christina
 Streli
 and
 Andrzej
 Markowicz

Chair

 and
 co-­‐chair
 of
 the
 local
 organizing
 committee

Local
 Organizing
 committee

• Christina
 Streli
 -­‐
 ATI,
 TU
 Wien
 -­‐
 Chair

• Andrzej
 Markowicz
 -­‐
 IAEA
 -­‐
 Co-­‐chair

• Martina
 Griesser
 -­‐
 KHM,
 Vienna

• Andreas
 Karydas
 -­‐
 IAEA

• Michael
 Mantler
 -­‐
 Vienna

• János
 Osán
 -­‐
 KFKI-­‐AEKI,
 Budapest,
 Hungary

• Roman
 Padilla-­‐Alvarez
 -­‐
 IAEA

• Giancarlo
 Pepponi
 -­‐
 FBK,
 Trento,
 Italy

• Manfred
 Schreiner
 -­‐
 Academy
 of
 Fine
 Arts,
 Vienna

• Peter
 Wobrauschek
 -­‐
 ATI,
 TU
 Wien

International
 Advisory
 Board

• Burkhard
 Beckhoff,
 Germany

• Maria
 Luisa
 Carvalho,
 Portugal

• Roberto
 Cesareo,
 Italy

• Stjepko
 Fazinić,
 Croatia

• Jorge
 E.
 Fernandez,
 Italy

• René
 Van
 Grieken,
 Belgium

• Yohichi
 Gohshi,
 Japan

• Marie-­‐Christine
 Lepy,
 France

• Jorge
 Sanchez,
 Argentina

• Szabina
 Török,
 Hungary

• Peter
 Wobrauschek,
 Austria

Conference
 secretary:

EXRS-­‐2012
 Secretariat

Atominstitut
 TU
 Wien

Stadionallee
 2

1020
 Wien,
 Austria

e-­‐mail:
 [email protected]
Scientific
 program

The
 European
 Conference
 on
 X-­‐Ray
 Spectrometry
 (EXRS)
 is
 a
 biennial
 conference

series
 which
 started
 in
 Copenhagen
 and
 Göteborg
 (1984,
 1986)
 and
 continued
 in

Vienna,
 Antwerp,
 Myconos,
 Budapest,
 Lisbon,
 Bologna,
 Krakow,
 Berlin,
 Alghero,

Paris,
 Dubrovnik

 and
 Figueira
 da
 Foz.

The
 15th
 EXRS
 conference
 is
 devoted
 to
 the
 exchange
 of
 information
 and
 experience

on
 the
 emerging
 and
 innovative
 techniques
 in
 the
 field
 of
 X-­‐ray
 spectrometry
 and

related
 areas.
 The
 conference
 will
 provide
 a
 framework
 in
 which
 scientists
 of
 various

research
 areas
 will
 be
 able
 to
 convene
 and
 discuss
 X-­‐ray
 techniques
 and
 their

successful
 applications.
 A
 rich
 scientific
 and
 social
 program
 will
 allow
 experienced

experts,
 young
 scientists,
 and
 industrial
 exhibitors
 to
 exchange
 views
 and
 start
 new

collaborative
 projects.
 Contributions
 are
 devided
 into
 22
 invited
 lectures,
 93
 oral

presentations
 and
 210
 poster
 presentations.

Conference
 Sessions:

1

  Art
 &
 Cultural
 Heritage

2
  Interactions
 of
 X-­‐rays
 with
 matter
 and
 fundamental
 parameters

3

  PIXE
 &
 electron
 induced
 XRS

4

  Microbeam
 /
 Nanobeam

5

  TXRF,
 GIXRF
 and
 related
 techniques

6

  X-­‐ray
 imaging
 and
 tomography

7

  Mobile
 and
 portable
 XRF

8

  Synchrotron
 XRS,
 XAFS,
 RIXS
 and
 XES

9

  Recent

 developments
 by
 XRS

 manufactures

10

  High
 resolution
 X-­‐ray
 absorption
 and
 emission
 spectroscopy

11
  Advanced
 materials
 and
 nanoscience

12

  XRS
 Metrology,
 QC/QA

13

  XRS
 -­‐
 Instrumentation
 (X-­‐ray
 sources,
 optics
 and
 detectors)

14

  Quantification
 methodology

15

  Sample
 preparation
 and
 sampling
 strategies

16

  Industrial
 quality
 and
 process
 control

17

  Earth
 and
 environment
 sciences

18

  Education
 and
 data
 interpretation

19

  Life
 sciences
 and
 forencis
Conference
 Sponsors:

Social Program

Sunday
15:00-
19:00 Opening mixer (Arcotel-Kaiserwasser)
collection of ground passes and conference
registration at IAEA Gate 1

Wednesday
14:00- Conference excursion (Klosterneuburg
18:00 /Kahlenberg)
18:00 - Guided tour Academy of Fine Arts
20:00 Painting Gallery (free of charge)

Thursday
20:00 Heuriger Fuhrgasslhuber
partially sponsored by the Lord Major of
Vienna
Invited
 Speaker:

Joy
 Andrews
  Nanoscale
 chemical
 imaging
 of
 energy
 materials
 with
 full-­‐field

  transmission
 X-­‐ray
 microscopy

Samuel
 Bamford
  Challenges
 and
 Status
 in
 the
 Development
 of
 ICT-­‐Based
 Learning
 and

  Training
 Modules
 on
 Nuclear
 Instrumentation
 and
 Spectrometry

Artur
 Braun
  Application
 of
 x-­‐ray
 and
 electron
 spectroscopy
 to
 energy
 materials

Björn
 De
 Samber
  Synchrotron
 Radiation
 based
 Micro-­‐
 and
 Nanoanalysis
 applied
 to

  Biological
 Systems

Shinjiro
 Hayakawa
  Depth
 selective
 XAFS
 characterization
 using
 simultaneous
 detection
 of

  x-­‐ray
 fluorescence
 and
 conversion
 electrons

Joanna
 Hoszowska
  High-­‐resolution
 x-­‐ray
 emission
 spectroscopy
 for
 fundamental

  parameters
 determination

Yuying
 Huang
  Synchrotron
 radiation
 X-­‐ray
 micro/nanobeam
 XRF
 and
 XANES

  techniques:
 application
 in
 life
 science

Nikolaos
 Kallithrakas-­‐Kontos
  Selective
 membranes
 in
 X-­‐Ray
 Analysis:
 A
 preconcentration

  step
 or
 a
 sensor?

Ioanna
 Mantouvalou
  Laser-­‐produced
 plasma
 sources
 for
 applied
 spectroscopy
 in
 the
 soft

  X-­‐ray
 region

Eva
 Margui
  Total
 reflection
 X-­‐ray
 fluorescence
 spectrometry
 in
 the
 environmental

  field:
 A
 review
 of
 some
 recent
 investigations
 and
 applications

Florian
 Meirer
  Application
 of
 grazing
 incidence
 x-­‐ray
 spectroscopy
 to
 the
 analysis
 of

  Arsenic
 doped
 Silicon
 produced
 by
 plasma
 immersion
 ion
 implantation

Beatrix
 Pollakowski
 Species
 depth
 profiling
 of
 deeply
 buried
 nanostructures

Phil
 Potts
  Provenance,
 Process
 and
 Propriety
 -­‐
 Portable
 XRF
 in
 cultural
 heritage

Martin
 Radtke

  The
 colour
 X-­‐ray
 camera:
 basics,
 applications
 and
 perspectives.

Miguel
 Reis
  PIXE
 in
 the
 slow
 collisions
 regime

Stefano
 Ridolfi
  EDXRF
 portable
 systems
 for
 Analysis
 of
 Works
 of
 Art

Volker
 Rössiger
  Standard
 Reference
 Material
 and
 Standardless
 XRFA

Rafal
 Sitko
  Influence
 coefficient
 algorithms
 in
 X-­‐ray
 fluorescence
 analysis
 of
 thick

  and
 intermediate-­‐thickness
 samples

Andrea
 Somogyi
  Scanning
 hard
 X-­‐ray
 nanobeam
 techniques
 at
 the
 Nanoscopium

  beamline
 of
 Synchrotron
 Soleil

João
 Veloso
  EDXRF
 Imaging
 with
 2D
 detectors

Charalambos
 Zarkadas
 Quality
 improvements
 of
 EDXRF
 instruments
 with
 close
 coupled

  geometries
 by
 means
 of
 Monte
 Carlo
 simulations

Janina
 Zieba-­‐Palus
  Examination
 of
 forensic
 traces
 by
 the
 use
 of
 X-­‐ray
 spectrometry
Instructions
 for
 conference
 proceedings

The
 conference
 proceedings
 will
 be
 available
 for
 downloading
 by
 the
 participants
 after
 the

conference.
 The
 conference
 proceedings
 will
 contain
 the
 submitted
 manuscripts
 in
 pdf

format.
 Contributions
 transmitted
 to
 the
 Conference
 Secretariat
 before
 July
 1st,
 2012
 will
 be

automatically
  included,
  without
  any
  reviewing
  procedure.
  Here
  there
  are
  no
  specific

instructions
 about
 size
 and
 shape:
 the
 manuscript
 will
 be
 included
 such
 as
 the
 authors
 will

have
 prepared
 it,
 under
 their
 own
 responsibility.

Authors
 of
 accepted
 contributions
 are
 invited
 to
 submit
 one
 manuscript
 for
 publication
 in
 a

special
 issue
 of
 X-­‐Ray
 Spectrometry
 (Wiley
 Interscience).
 Manuscripts
 should
 be
 prepared
 in

a
 strict
 format
 of
 the
 XRS
 and
 will
 be
 reviewed
 by
 the
 program
 committee
 of
 the
 conference.

Manuscripts
 have
 to
 be
 submitted
 to
 the
 conference
 secretary
 before
 June
 15th.
 Authors

Instructions
 according
 to
 the
 rules
 of
 XRS.

http://onlinelibrary.wiley.com/journal/10.1002/(ISSN)10974539/homepage/ForAuthors.html.

Industrial

 exhibition:

Traditionally
 EXRS
 conferences
 include
 an
 Industrial
 Exhibition
 featuring
 companies

producing
 X-­‐ray
 related
 instruments.

The
 Industrial
 Exhibition
 stands
 will
 be
 located
 in
 the
 Rotunda,
 where
 also
 the
 coffee

in
 the
 coffee
 breaks
 is
 served.
 It
 will
 take
 place
 during
 the
 whole
 conference.

Industrial
 exhibitors
 and
 sponsors:

http://www.amptek.com/

http://www.bruker-­‐

axs.com/x_ray_spectrometry.html

http://www.e2v.com/
http://www.elvatech.com/en/

http://www.excillum.com/

http://www.helmut-­‐fischer.de

http://www.ifg-­‐adlershof.de/

http://www.i-­‐tech.si/

http://www.ketek.net/

http://www.moxtek.com/
MOXTEK®

http://www.pndetector.de/

http://www.pnsensor.de/

http://www.rigaku.com/

http://www.siintusa.com/

http://www.edax.com/ http://www.spectro.com
http://www.thermoscientific.com

http://www.toivel.com/

http://www.xglab.it/

http://www.xia.com/

http://www.xos.com
Conference
 site: