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Applications and Metrology at Nanometer Scale, Volume 1: Smart Materials, Electromagnetic Waves and Uncertainties PDF

242 Pages·2021·9.33 MB·English
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Author:Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami
Publication Year:2021
ISBN:9781786306401
Pages:242
Language:English
File Size:9.33
Format:PDF
Price:FREE
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