Analysis and Deformulation of Polymeric Materials: Paints, Plastics, Adhesives, and Inks (Topics in Applied Chemistry)

353 Pages·1997·3.94 MB·English

by  Jan W. Gooch

Analysis and Deformulation
of Polymeric Materials
Paints, Plastics, Adhesives, and Inks
TOPICS IN APPLIED CHEMISTRY
Series Editors: Alan R. Katritzky, FRS
Kenan Professor ofChemistry
University of Florida, Gainesville, Florida
Gebran J. Sabongi
Laboratory Manager, Encapsulation Technology Center
3M Company, St. Paul, Minnesota
Current volumes in theseries:
ANALYSISANDDEFORMULATION OF
POLYMERIC MATERIALS
Paints, Plastics, Adhesives, and Inks
Jan W. Gooch
CHEMISTRY AND APPLICATIONS OF LEUCO DYES
Edited by Ramaiah Muthyala
FROM CHEMICAL TOPOLOGY TO THREE-DIMENSIONAL
GEOMETRY
Edited by Alexandru T. Balaban
LEAD-BASED PAINT HANDBOOK
Jan W. Gooch
ORGANOFLUORINE CHEMISTRY
Principles and Commercial Applications
Edited by R. E. Banks, B. E. Smart, and J. C. Tatlow
PHOSPHATE FIBERS
Edward J. Griffith
POLY(ETHYLENE GLYCOL) CHEMISTRY
Biotechnical and Biomedical Applications
Edited by J. Milton Harris
RADIATION CURING
Science and Technology
Edited by S. Peter Pappas
RESORCINOL
Its Uses and Derivatives
Hans Dressler
TARGET SITES FOR HERBICIDE ACTION
Edited by Ralph C. Kirkwood
AContinuation Order Planisavailable for this series. Acontinuationorderwill bring delivery ofeachnew
volumeimmediatelyupon publication. Volumesarebilled only upon actualshipment.For further informa-
tion please contactthe publisher.
Analysis and Deformulation
of Polymeric Materials
Paints, Plastics, Adhesives, and Inks
Jan W. Gooch
Polymers and Coatings Consultant
Atlanta. Georgia
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eBook ISBN: 0-306--46908-1
Print ISBN: 0-306-45541-2
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Print ©1997 Kluwer Academic / Plenum Publishers
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Preface
This book is designed for the chemist, formulator, student, teacher, forensic
scientist, or others who wish to investigate the composition of polymeric materials.
Theinformationwithinthesepagesisintendedtoarmthereaderwiththenecessary
workingknowledgetoanalyze,characterize,anddeformulatematerials.
ThestructureoftheContentsisintendedtoassistthereaderinquicklylocating
the subject ofinterestand proceed to it witha minimum ofexpended time and effort.
The Contentsprovides an outlineofmajortopics andrelevantmaterials charac-
terizedforthereader’sconvenience.Anintroductiontoanalysisanddeformulation
isprovidedinChapter1 toacquaintthereaderwithanalyticalmethodsandtheir
applications. Extensive references are provided as additional sources ofinforma-
tion.AlltablesarelocatedintheAppendix,beginningonp.235.
GUIDE FOR USE
Thisis apracticalbookstructuredtoefficientlyusethereader’s timewitha
minimumeffortofsearchingforentriesandinformationbyfollowingthesebrief
instructions:
1. SearchtheContentsand/orIndexforasubjectwithinthetext.
2. Analysis/deformulation principles are discussed at the outset to familiarize
the reader with analysis methods and instruments; followed byformula-
tions, materials,andanalysisofpaint,plastics,adhesives,andinks; and
finallyreformulation methods totesttheresultsofanalysis.
3. Materials and a wide assortment of formulations are discussed within the
text by chapter/section number.
4. Materials are referredtobyvarious names (trivial, trade, andscientific),
and these are listed intablesandcross-referencedto aid thereader.
v
vi Preface
ACKNOWLEDGMENTS
I wish to thank the following people for their contributions to this book: Lisa
Detter-Hoskin; Garth Freeman; John Sparrow; Joseph Schork; Gary Poehlein, Kash
Mittal; John Muzzy; Paul Hawley; Ad Hofland; Tor Aasrum; James Johnson; Linda,
Sonja, Luther, and LottieGooch.
Contents
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
List of Figures xvii
.
1 DeformulationPrinciples
1.1. Introduction ......................................
1
1.2. Characterization of Materials .......................... 2
1.3. Formulation andDeformulation ........................ 2
.
2 SurfaceAnalysis
2.1. LightMicroscopy(LM) .............................. 7
2.1.1. Fundamentals ................................ 7
2.1.2. Equipment.................................... 12
2.1.3. Applications .................................. 12
2.2. ElectronMicroscopy(EM) ............................ 13
2.2.1. Fundamentals ............................... 13
2.2.2. Equipment.................................. 17
2.2.3. Applications .................................. 18
2.3. Energy-DispersiveX-RayAnalysis(EDXRA) .............. 19
2.3.1. Fundamentals ............................... 19
2.3.2. Equipment ................................... 21
2.3.3, Applications ................................ 21
2.4. ElectronProbeMicroanalysis(EPM) .................... 21
2.4.1. Fundamentals . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
2.4.2. Equipment . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
2.4.3. Applications ................................. 22
2.5. AugerSpectroscopy(AES)........................... 24
2.5.1. Fundamentals . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
2.5.2. Equipment. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
vii
viii Contents
2.5.3. Applications .................................. 25
2.6. ScanningIonMassSpectroscopy(SIMS) .................. 27
2.6.1. Fundamentals ................................. 27
2.6.2. Equipment ................................... 27
2.6.3. Applications .................................. 29
2.7. ElectronSpectroscopyChemicalAnalysis(ESCA) ........... 29
2.7.1. Fundamentals ................................ 29
2.7.2. Equipment ................................... 31
2.7.3. Applications ................................ 31
.
2.8. InfraredSpectroscopy(IR)forSurfaceAnalysis ............. 31
2.8.1. Fundamentals ................................ 31
2.8.2. Equipment .................................... 40
2.8.3. Applications ................................. 40
2.9. SurfaceEnergyandContactAngleMeasurement ............ 42
2.9.1. Fundamentals ................................ 42
2.9.2. Equipment ................................... 44
2.9.3. Applications ................................. 44
3. BulkAnalysis
3.1. AtomicSpectroscopy(AS) ............................. 45
3.1.1. Fundamentals . . . . . . . . . . . . . . . . . . . . . . . . . 45
3.1.2. Equipment .................................. 49
3.1.3. Applications ................................ 49
3.2. InfraredSpectroscopy(IR)forBulkAnalysis ............... 49
3.2.1. Fundamentals ................................. 49
3.2.2. Equipment .................................. 51
3.3. X-RayDiffraction(XRD) .............................. 58
3.3.1. Fundamentals . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58
3.3.2. Equipment .................................. 63
3.3.3. Applications ................................. 63
3.4. GelPermeation(GPC),High-pressureLiquid(HPLC),and
GasChromatography(GC) ............................ 65
3.4.1. Fundamentals ................................ 65
3.4.2. Equipment ................................. 66
3.4.3. Applications .................................. 66
3.5. NuclearMagnetic ResonanceSpectroscopy(NMR)........... 70
3.5.1. Fundamentals ................................ 70
3.5.2. Equipment ................................... 77
3.5.3. Applications ................................ 77
3.6. ThermalAnalysis .................................. 77
Contents ix
3.6.1. Fundamentals . . . . . . . . . . . . . . . . . . . . . . . . 77
3.6.2. Equipment . . . . . . . . . . . . . . . . . . . . . . . . . . 77
3.6.3. Applications . . . . . . . . . . . . . . . . . . . . . . . . . 79
3.7. ViscometricAnalysis . . . . . . . . . . . . . . . . . . . . . . . . 85
3.7.1. Fundamentals . . . . . . . . . . . . . . . . . . . . . . . . 85
3.7.2. Equipment . . . . . . . . . . . . . . . . . . . . . . . . . . 88
3.7.3. Applications . . . . . . . . . . . . . . . . . . . . . . . . . 88
3.8. X-RayMicroscopy . . . . . . . . . . . . . . . . . . . . . . . . . 89
3.8.1. Fundamentals . . . . . . . . . . . . . . . . . . . . . . . . 89
3.8.2. Equipment . . . . . . . . . . . . . . . . . . . . . . . . . . 90
3.8.3. Applications . . . . . . . . . . . . . . . . . . . . . . . . . 91
3.9. Mass Spectroscopy . . . . . . . . . . . . . . . . . . . . . . . . . 92
3.9.1. Fundamentals . . . . . . . . . . . . . . . . . . . . . . . . 92
3.9.2. Equipment . . . . . . . . . . . . . . . . . . . . . . . . . . 92
3.9.3. Applications . . . . . . . . . . . . . . . . . . . . . . . . . 92
3.10.Ultraviolet Spectroscopy . . . . . . . . . . . . . . . . . . . . . . 92
3.10.1. Fundamentals . . . . . . . . . . . . . . . . . . . . . . . . 92
3.10.2. Equipment . . . . . . . . . . . . . . . . . . . . . . . . . 96
3.10.3. Applications . . . . . . . . . . . . . . . . . . . . . . . . 96
4. PaintFormulations
4.1. General . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 97
4.1.1. ThePaintFormula . . . . . . . . . . . . . . . . . . . . . . 97
4.1.2. Functions ofPaintandCoatings . . . . . . . . . . . . . . . 98
4.1.3. Classification . . . . . . . . . . . . . . . . . . . . . . . . 98
4.2. SolventSystems . . . . . . . . . . . . . . . . . . . . . . . . . . . 101
4.3. WaterborneSystems . . . . . . . . . . . . . . . . . . . . . . . . . 101
4.4. PowderSystems . . . . . . . . . . . . . . . . . . . . . . . . . . . 101
4.5. Electrodeposition Systems . . . . . . . . . . . . . . . . . . . . . 101
4.5.1. AnionicElectrodeposition Coatings . . . . . . . . . . . . . 102
4.5.2. Cationic Electrodeposition Coatings . . . . . . . . . . . . 103
4.6. Thermal SprayPowderCoatings . . . . . . . . . . . . . . . . . . 104
4.7. PlasmaSprayCoatings . . . . . . . . . . . . . . . . . . . . . . . 105
4.7.1. PrinciplesofOperation . . . . . . . . . . . . . . . . . . . 105
4.7.2. PlasmaSprayableThermoplasticPolymers . . . . . . . . . 106
4.7.3. AdvantagesofPlasmaSprayedCoatings . . . . . . . . . . 106
4.8. Fluidized BedCoatings . . . . . . . . . . . . . . . . . . . . . . . 106
4.9. VaporDeposition Coatings . . . . . . . . . . . . . . . . . . . . . 106
4.10. PlasmaPolymerized Coatings . . . . . . . . . . . . . . . . . . . 106