Table Of ContentConference Proceedings of the Society for Experimental Mechanics Series
Ming-Tzer Lin · Cosme Furlong · Chi-Hung Hwang ·
Mohammad Naraghi · Frank DelRio Editors
Advancements in Optical
Methods, Digital Image
Correlation & Micro-and
Nanomechanics, Volume 4
Proceedings of the 2022 Annual Conference
on Experimental and Applied Mechanics
Conference Proceedings of the Society for Experimental Mechanics
Series
Series Editors
Kristin B. Zimmerman
Society for Experimental Mechanics, Inc.,
Bethel, CT, USA
The Conference Proceedings of the Society for Experimental Mechanics Series presents early findings and case studies from
a wide range of fundamental and applied work across the broad range of fields that comprise Experimental Mechanics. Series
volumes follow the principle tracks or focus topics featured in each of the Society's two annual conferences: IMAC, A
Conference and Exposition on Structural Dynamics, and the Society's Annual Conference & Exposition and will address
critical areas of interest to researchers and design engineers working in all areas of Structural Dynamics, Solid Mechanics
and Materials Research.
Ming-Tzer Lin • Cosme Furlong • Chi-Hung Hwang
Mohammad Naraghi • Frank DelRio
Editors
Advancements in Optical Methods, Digital
Image Correlation & Micro-and
Nanomechanics, Volume 4
Proceedings of the 2022 Annual Conference on Experimental
and Applied Mechanics
Editors
Ming-Tzer Lin Cosme Furlong
National Chung Hsing University Department of Mechanical Engineering
Taichung, Taiwan Worcester Polytechnic Institute
Worcester, MA, USA
Chi-Hung Hwang
National Applied Research Laboratories Mohammad Naraghi
Taiwan Instrument Technology Institute Texas A&M University
Hsinchu, Taiwan College Station, TX, USA
Frank DelRio
National Institute of Standards & Technology
Gaithersburg, MD, USA
ISSN 2191-5644 ISSN 2191-5652 (electronic)
Conference Proceedings of the Society for Experimental Mechanics Series
ISBN 978-3-031-17470-4 ISBN 978-3-031-17471-1 (eBook)
https://doi.org/10.1007/978-3-031-17471-1
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Preface
Advancement in Optical Methods, Digital Image Correlation & Micro-and Nanomechanics represents one of six volumes of
technical papers to be presented at the SEM 2022 SEM Annual Conference & Exposition on Experimental and Applied
Mechanics organized by the Society for Experimental Mechanics scheduled to be held during June 13–16, 2022. The com-
plete Proceedings also includes volumes on: dynamic behavior of materials; challenges in mechanics of time-dependent
materials and mechanics of biological systems and materials; fracture, fatigue, failure, and damage evolution; mechanics of
composite, hybrid, and multifunctional materials; and thermomechanics and infrared imaging, inverse problem methodolo-
gies, and mechanics of additive and advanced manufactured materials.
Each collection presents early findings from experimental and computational investigations on an important area within
experimental mechanics, optical methods and digital image correlation (DIC) being important areas.
With the advancement in imaging instrumentation, lighting resources, computational power, and data storage, optical
methods have gained wide applications across the experimental mechanics society during the past decades. These methods
have been applied for measurements over a wide range of spatial domain and temporal resolution. Optical methods have
utilized a full-range of wavelengths from X-Ray to visible lights and infrared. They have been developed not only to make
two-dimensional and three-dimensional deformation measurements on the surface but also to make volumetric measure-
ments throughout the interior of a material body.
The area of digital image correlation has been an integral track within the SEM Annual Conference spearheaded by
Professor Michael Sutton from the University of South Carolina. The contributed papers within this section of the volume
span technical aspects of DIC.
The micro- and nanomechanics segment of this volume focuses on specialized scientific areas that involve miniaturizing
conventional scale components and systems to take advantage of reduced size and weight and/or enhanced performance or
novel functionality. These fields also encompass the application of principles ranging from the micron scale down to indi-
vidual atoms. Sometimes these principles borrow from conventional scale laws but often involve new physical and/or chemi-
cal phenomena that require new behavioral laws and impart new properties to exploit. Studying how mechanical loads
interact with components of these scales is important in developing new applications, as well as assessing their reliability and
functionality. Establishing this symposium at the Annual Meeting of the Society for Experimental Mechanics provides a
venue where state-of-the-art experimental methods can be leveraged in these endeavors.
The 2022 International Symposium on Micro-and Nanomechanics (ISMAN) is the 23rd in the series and addresses perti-
nent issues relating to design, analysis, fabrication, testing, optimization, and applications of micro-and nanomechanics,
especially as these issues relate to experimental mechanics of microscale and nanoscale structures.
The conference organizers thank the authors, presenters, and session chairs for their participation, support, and contribu-
tion to this very exciting area of experimental mechanics.
Taichung, Taiwan Ming-Tzer Lin
Worcester, MA, USA Cosme Furlong
Hsinchu, Taiwan Chi-Hung Hwang
College Station, TX, USA Mohammad Naraghi
Gaithersburg, MD, USA Frank DelRio
v
Contents
1 Innovations in Super-Resolution Microscopy. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
C. A. Sciammarella, L. Lamberti, L. Santoro, F. M. Sciammarella, and E. Sciammarella
2 Measuring Strain Distribution Around Inclusions and Matrix Interface
Using Global Digital Image Correlation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .11
Yuki Tsujii, Natsuha Iketa, Keisuke Iizuka, and Satoru Yoneyama
3 Evaluation of Stress State and Fracture Strain of High-Strength Steel
Using Stereo Image Correction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .15
Ryo Sugimoto, Sota Ikoma, Keisuke Iizuka, Satoru Yoneyama, Kuniharu Ushijima,
and Shota Chinzei
4 Bistability and Irregular Oscillations in Pairs of Opto-Thermal Micro-Oscillators . . . . . . . . . . . . . . . . . . . . . . .19
Aditya Bhaskar, Mark Walth, Richard H. Rand, and Alan T. Zehnder
5 Tympanic Membrane Shape Measurement by Miniaturized High- Speed Fringe
Projection Shape Measurement Using MEMS Scanning Mirror . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .25
Haimi Tang, John Rosowski, Cosme Furlong, and Jeffrey Tao Cheng
6 High-Speed Optical Extensometer for Uniaxial Kolsky Bar Experiments . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .31
Richard Leonard III and Wilburn Whittington
7 On the Miura Ori Modal Response: A Look Throughout the Experimental Side . . . . . . . . . . . . . . . . . . . . . . . . .37
Antonio Baldi, Pietro Maria Santucci, Giorgio Carta, Michele Brun, Gianluca Marongiu,
and Daniele Lai
8 Using Digital Image Correlation to Characterize the Static and Dynamic
Behavior of Structures: Industrial Applications and Lessons Learned . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .43
Simone Manzato, Davide Mastrodicasa, Emilio Di Lorenzo, Guven Ogus,
and Pascal Lava
9 Enabling Digital Image Correlation with High-Resolution Microscopic Optics
via Working Distance Automation: Advancing Resolution and Accuracy Limits. . . . . . . . . . . . . . . . . . . . . . . . . .49
Olcay Türkoğlu and C. Can Aydıner
10 Characterization of Bioengineered Tissues by Digital Holographic Vibrometry
and 3D Shape Deep Learning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .57
Colin Hiscox, Juanyong Li, Ziyang Gao, Dmitry Korkin, Cosme Furlong, and Kristen Billiar
11 Coordinated Twinning Bands in Magnesium at the Existence of Stress Raisers
via In Situ Microscopic Image Correlation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .63
S. Can Erman and C. Can Aydıner
12 Determining the Onset of Transverse Cracking in a Woven Composite
Using Digital Image Correlation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .71
Christopher S. Meyer, Bradley D. Lawrence, and Bazle Z. Haque
vii
Chapter 1
Innovations in Super-Resolution Microscopy
C. A. Sciammarella, L. Lamberti, L. Santoro, F. M. Sciammarella, and E. Sciammarella
Abstract Viruses are organisms that invade cells of living beings to reproduce. They consist of nucleic acids, RNA, underly-
ing proteins, and a protective membrane. Their life cycle comprises three main stages: (1) penetration of a cell, (2) introduc-
tion of their genome generating new viruses, and (3) release of replicated viruses to the external cellular space for further
infection propagation. Imaging techniques provide an important tool for understanding these mechanisms. Transmission
electron microscopy (TEM) is one of the main tools utilized for this purpose. TEM investigations impose environmental
limitations on the observation conditions. To get images of viruses, a TEM requires freezing the virus at extremely low tem-
peratures. The bulk of TEM images are limited to 2D; for 3D images, TEM holography is available but poses additional
difficulties and costs. A nano-microscope is being developed by the authors with resolution limits in the same range as a
TEM. The nano-microscope can be utilized to observe viruses under environmental conditions in the range of biological
entities and enables 3D dynamic observations.
Keywords Nano Microscopy · Super resolution · Sub-wavelength observations at the scale of one nanometer · Metrology
of nano crystals · Metrology of spherical nano objects · Application to the observation of viruses
1.1 Introduction
The word holography was coined by D. Gabor to label an imaging technique with the capacity of encoding 3D spatial infor-
mation in 2D by recording both the light intensity and the phase of the captured wavefront. Moiré-Holography was intro-
duced as a method that records intensity and phase utilizing the moiré technique [1].
This chapter presents a nano-microscope using moiré-holography as the tool to encode spatial information in the nanomet-
ric range. Gratings are introduced in the optical system to produce moiré patterns that contain the in-plane and the out- of-
plane information. In [2], a methodology to obtain images of viruses with spatial resolutions in the same order of magnitude
as TEM, utilizing light in the range of frequencies that go from violet to visible red (i.e., wavelengths from 475 nm up to
632.8 nm), was introduced. Figure 1.1 shows the device that supports the proposed methodology. The nano-microscope con-
sists of (1) digital microscope, (2) illumination and light conditioning system, (3) desktop processor, and (4) display monitor.
The digital microscope is connected to a desktop processor that contains the software required to do (1) image acquisition,
(2) image preprocessing, (3) artificial intelligence neural network to classify images, and enables the (4) presentation of the
results.
The illumination system consists of a laser diode that will generate evanescent illumination wavefronts, a prism that will
steer the beam to produce evanescent wavefronts. The observed objects are contained in depression well slides utilized in
biosciences. The illumination system contains two important components. A grating that is at the top of the prism and sup-
ports the depression well slide, and a ball lens that forms part of the microscope optical circuit as shown in Fig. 1.1.
C. A. Sciammarella (*)
Department of Mechanical, Materials and Aerospace Engineering, Illinois Institute of Technology, Chicago, IL, USA
e-mail: [email protected]
L. Lamberti · L. Santoro
Dipartimento Meccanica, Matematica e Management, Politecnico di Bari, Bari, Italy
F. M. Sciammarella
MXD Corporation, Chicago, IL, USA
E. Sciammarella
General Stress Optics Corporation, San Diego, CA, USA
© The Author(s), under exclusive license to Springer Nature Switzerland AG 2023 1
M.-T. Lin et al. (eds.), Advancements in Optical Methods, Digital Image Correlation & Micro-and Nanomechanics, Volume 4,
Conference Proceedings of the Society for Experimental Mechanics Series, https://doi.org/10.1007/978-3-031-17471-1_1
2 C. A. Sciammarella et al.
Fig. 1.1 Schematic representation of the nano-microscope setup proposed in this research
Figure 1.2a shows the ball lens that forms part of the microscope circuit. In the experiments leading to the design of the
microscope, the ball lens was a polystyrene sphere of diameter 6 microns. The ball lens was fixed to the microscope slide
surface to ensure that it will not move. The ball lens has a dual role in the microscope; it captures the wavefronts emitted by
the observed object and at the same time generates Bessel wavefronts. The Bessel wavefronts propagate through the optical
circuit to the image plane without experiencing diffraction, which enables observing the near optical field in the far field. The
grating indicated in Figs. 1.1 and 1.2 encodes the metrological information in the formed images.
Figure 1.2a shows an expanded view of the region of the microscope that contains the observed objects. Figure 1.2b (1)
shows a prismatic nanocrystal; Fig. 1.2b (2) shows wavefronts entering and emerging from the ball lens acting as a relay lens;
Fig. 1.2b (3) shows wavefronts arriving at the focal plane of the spherical lens; and Fig. 1.2b (4) shows the wavefronts arriv-
ing at the image plane of the CCD.
In [2], the basic foundations of the data gathering, and processing of the nano-microscope were outlined and illustrated
with examples of the work done by the authors in previous papers utilizing prismatic nanocrystals and nanospheres. In the
following sections, important additional information is introduced, providing a broader and more comprehensive informa-
tion on the proposed methodology.
1.2 Methodologies that Make the Nano-Microscope Operation Feasible
When holographic moiré is utilized for metrological purposes, the phase distribution of a wavefront that goes through an
object is made to interfere with a reference wavefront. The interferogram displays the change of optical phase of the transmit-
ted beam with the reference wavefront. In our earlier work [3–6] we developed a super-resolution methodology that for
objects of nano-dimensions arrived to interferograms with spatial resolutions of sub-nanometric sensitivity.
To increase the sensitivity of holographic moiré, two phenomena were utilized: (1) the self-emission of light by nano-
objects due to the acoustic-optic effect [7] and (2) Bessel wavefronts’ evanescent diffraction orders of gratings [8]. The
observed objects’ geometry is encoded by the Bessel beams’ wavefronts.
To clarify the role of each of these phenomena in the metrology of nano–objects, let us consider the phase change of the
interfering wavefronts, reference wavefront, and modulated wavefront:
(1.1)
δ (z)=∫h(x,y)[n −n ]dz
op 0 i o
1 Innovations in Super-Resolution Microscopy 3
Fig. 1.2 (a) Expanded view of the region of the microscope that contains the observed objects; (b) schematic representation of the optical circuit
forming the image
In Eq. (1.1), h(x,y) is the depth of an object with respect to a reference plane, optically represented by a plane wavefront.
In Eq. (1), the coordinates x, y are in the reference plane, and z is of the direction of the normal to the reference plane. In Eq.
(1.1), n is the index of refraction in the region where the object is not present and is a constant. The index of refraction of
o
the object is a constant n, the same for all the values of x of the object. From Eq. (1.1),
i
h(x,y) h(x,y)
δ (z)= ∫ ndz− ∫ n dz (1.2)
op i 0
0 0
Equation (1.2), as a consequence of the fact that n and n are constants, becomes.
o i
δ (h(x,y)=n h(x,y)−n h(x,y)) (1.3)
op i o
Converting the difference of optical path into a phase difference,
2π 2π
∆φh(x,y)= p h(x,y)− p h(x,y)=φm −φr (1.4)
m r
In Eq. (1.4), ϕ is the modulated phase of the wavefront going through the object, ϕ is the phase of the reference wave-
m r
front, p is the pitch of the modulated carrier, and p is the pitch of the reference carrier. From this equation, we can get h(x,y).
m r
An example illustrating this procedure is shown in Fig. 1.3.
In Fig. 1.3, the pitches of the reference and modulated carriers are constants, which means that they are plane wavefronts;
the upper surface of the crystal is a plane. Experimentally it is difficult to get the face of the crystal parallel to the sensor, and
phase corrections are introduced to compensate for this problem. The example of Fig. 1.3 involves two fundamental steps:
(1) selection of the pitch p and determination of p , and (2) application of gradient filters to determine Lo and Wo. In a more
r m
general case, h(x,y) is a variable quantity and the shape of the observed object can be obtained from the display of contour
lines of the surface. It is possible to display the phase difference in steps of the selected values, thus getting all the dimensions
of the crystal in one single display. Figure 1.4 is an example of this approach; it shows a region of the image displaying
contour lines of the deposits of sodium chloride. The blue background corresponds to the reference surface, and the steps of
the contours are 2.82 nm that correspond to 5 atoms. The image of Fig. 1.3 was extracted from a region of 1153 × 1153 nm
from the same area as Fig. 1.4. The higher resolution obtained in the image analysis brings details that were not visible in
Fig. 1.3. It is interesting to notice that the deposits of sodium chloride that have prismatic shapes are few compared to the
total deposited mass.
Figure 1.5 shows a crystal of Lo = 10.15 nm, Wo = 5.64 nm, Ho = 5.64 that is adjacent to a sodium chloride deposit
22.5 nm in depth. The emission of light by the observed objects is a necessary condition arising from the super-resolution
requirement of the proposed methodology. However, in Eq. 1.4, the wavelength of the light is not explicitly included. This
means that monochromatic images can be utilized in processing of data recorded by the nano-microscope.
