Advanced Instrumentation and Computer I/O Design: Defined Accuracy Decision, Control, and Process Applications

287 Pages·2013·19.751 MB·English

by  Patrick H. Garrett

I Advanced Instrumentation
I and Computer I/O Design
IEEE Press
445 Hoes Lane
Piscataway, NJ 08854
IEEE Press Editorial Board
John B. Anderson, Editor in Chief
Ramesh Abhari Bernhard M. Haemmerli Saeid Nahavandi
George W. Arnold David Jacobson Tariq Samad
Flavio Canavero Mary Lanzerotti George Zobrist
Dmitry Goldgof Om P. Malik
Kenneth Moore, Director of IEEE Book and Information Services (BIS)
Advanced Instrumentation
and Computer I/O Design
Defined Accuracy Decision and
I Control with Process Applications
Second Edition
Patrick H. Garrett
4IEEE
IEEE Press
©WILEY
A John Wiley & Sons, Inc., Publication
Copyright © 2013 by the Institute of Electrical and Electronics Engineers, Inc.
Published by John Wiley & Sons, Inc., Hoboken, New Jersey. All rights reserved.
Published simultaneously in Canada.
No part of this publication may be reproduced, stored in a retrieval system or transmitted in any form or by any
means, electronic, mechanical, photocopying, recording, scanning or otherwise, except as permitted under
Section 107 or 108 of the 1976 United States Copyright Act, without either the prior written permission of the
Publisher, or authorization through payment of the appropriate per-copy fee to the Copyright Clearance Center,
Inc., 222 Rosewood Drive, Danvers, MA 01923, [phone], fax [phone], or on the web at
www.copyright.com. Requests to the Publisher for permission should be addressed to the Permissions
Department, John Wiley & Sons, Inc., 111 River Street, Hoboken, NJ 07030, [phone], fax (201) 748-
6008, or online at http://www.wiley.com/go/permission.
Limit of Liability/Disclaimer of Warranty: While the publisher and author have used their best efforts in
preparing this book, they make no representation or warranties with respect to the accuracy or completeness of
the contents of this book and specifically disclaim any implied warranties of merchantability or fitness for a
particular purpose. No warranty may be created or extended by sales representatives or written sales materials.
The advice and strategies contained herein may not be suitable for your situation. You should consult with a
professional where appropriate. Neither the publisher nor author shall be liable for any loss of profit or any
other commercial damages, including but not limited to special, incidental, consequential, or other damages.
For general information on our other products and services please contact our Customer Care Department
within the United States at [phone], outside the United States at [phone] or fax [phone].
Wiley also publishes its books in a variety of electronic formats. Some content that appears in print, however,
may not be available in electronic formats. For more information about Wiley products, visit our web site at
www.wiley.com.
Library of Congress Cataloging-in-Publication Data:
Garrett, Patrick H.
Advanced instrumentation and computer I/O design : defined accuracy decision and control with process
applications / Patrick H. Garrett. — Second edition,
pages cm
ISBN 978-1 -118-31708-2 (pbk.)
1. Computer interfaces. 2. Computer input-output equipment—Design—Data processing. 3. Computer-aided
engineering. I. Title.
TK7887.5.G368 2013
621.39'81—dc23 2012030698
Printed in the United States of America.
10 9 8 7 6 5 4 3 21
Contents
Preface
1 Thermal, Mechanical, Quantum, and Analytical Sensors 1
1 -0 Introduction 1
1-1 Instrumentation Error Interpretation 1
1-2 Temperature Sensors 4
1-3 Mechanical Sensors 7
1-4 Quantum Sensors 13
1 -5 Analytical Sensors 18
Problems 25
Bibliography 27
2 Instrumentation Amplifiers and Parameter Errors 29
2-0 Introduction 29
2-1 Device Temperature Characteristics 30
2-2 Differential Amplifiers 31
2-3 Operational Amplifiers 35
2-4 Instrumentation Amplifiers 39
2-5 Amplifier Parameter Error Evaluation 47
Problems 50
Bibliography 51
v
vi Contents
3 Filters for Measurement Signals 53
3-0 Introduction 53
3-1 Bandlimiting Instrumentation Filters 53
3-2 Active Filter Design 58
3-3 Filter Error Evaluation 68
3-4 Bandpass Instrumentation Filters 73
Problems 82
Bibliography 83
4 Signal Conditioning Design and Instrumentation 85
Errors
4-0 Introduction 85
4-1 Low-Level Signal Acquisition 85
4-2 Signal Quality in Random And Coherent Interference 89
4-3 DC, Sinusoidal, and Harmonic Signal Conditioning 95
4-4 Analog Signal Processing 101
Problems 106
Bibliography 108
5 Data Conversion Devices and Parameters 109
5-0 Introduction 109
5-1 Analog Multiplexers 109
5-2 Sample Hold Devices 112
5-3 Digital-to-Analog Converters 115
5-4 Analog-to-Digital Converters 121
Problems 136
Bibliography 136
6 Sampled Data and Reconstruction with Intersample 139
Error
6-0 Introduction 139
6-1 Sampled Data Theory 140
6-2 Aliasing of Signal and Noise 144
6-3 Sampled Data Intersample and Aperture Errors 150
6-4 Output Signal Interpolation Functions 156
6-5 Video Sampling and Reconstruction 165
Problems 166
Bibliography 167
Contents vii
7 Instrumentation Analysis Suite, Error Propagation, 169
Sensor Fusion, and Interfaces
7-0 Introduction 169
7-1 Aerospace Computer I/O Design With Analysis Suite 169
7-2 Measurement Error Propagation in Example Airflow Process 183
7-3 Homogeneous and Heterogeneous Sensor Fusion 186
7-4 Instrumentation Integration and Interfaces 192
Problems 199
Bibliography 202
Appendix 203
8 Instrumented Processes Decision and Control 207
8-0 Introduction 207
8-1 Process Apparatus Controller Variability and Tuning 209
8-2 Model Reference to Remodeling Adaptive Control 220
8-3 Empirical to Intelligent Process Decision Systems 229
Problems 240
Bibliography 243
9 Process Automation Applications 245
9-0 Introduction 245
9-1 Ashby Map Guided Equiaxed Titanium Forging 246
9-2 Z-Fit Modeled Spectral Control of Exfoliated Nanocomposites 247
9-3 Superconductor Production with Adaptive Decision and Control 250
9-4 Neural Network Attenuated Steel Annealing Hardness Variance 259
9?5 Ultralinear Molecular Beam Epitaxy Flux Calibration 263
Bibliography 269
Index 271