Table Of Content

(cid:2) AGuidetoNoiseinMicrowaveCircuits (cid:2) (cid:2) (cid:2) (cid:2) IEEEPress 445HoesLane Piscataway,NJ08854 IEEEPressEditorialBoard EkramHossain,EditorinChief JónAtliBenediktsson XiaoouLi JeffreyReed AnjanBose LianYong DiomidisSpinellis DavidAlanGrier AndreasMolisch SarahSpurgeon ElyaB.Joffe SaeidNahavandi AhmetMuratTekalp (cid:2) (cid:2) (cid:2) (cid:2) A Guide to Noise in Microwave Circuits Devices, Circuits, and Measurement Peter Heymann (cid:2) Matthias Rudolph (cid:2) (cid:2) (cid:2) Copyright©2022byTheInstituteofElectricalandElectronicsEngineers,Inc.Allrights reserved. PublishedbyJohnWiley&Sons,Inc.,Hoboken,NewJersey. PublishedsimultaneouslyinCanada. Nopartofthispublicationmaybereproduced,storedinaretrievalsystem,ortransmittedinany formorbyanymeans,electronic,mechanical,photocopying,recording,scanning,orotherwise, exceptaspermittedunderSection107or108ofthe1976UnitedStatesCopyrightAct,without eitherthepriorwrittenpermissionofthePublisher,orauthorizationthroughpaymentofthe appropriateper-copyfeetotheCopyrightClearanceCenter,Inc.,222RosewoodDrive,Danvers, MA01923,(978)750-8400,fax(978)750-4470,oronthewebatwww.copyright.com.Requeststo thePublisherforpermissionshouldbeaddressedtothePermissionsDepartment,JohnWiley& Sons,Inc.,111RiverStreet,Hoboken,NJ07030,(201)748-6011,fax(201)748-6008,oronlineat http://www.wiley.com/go/permission. LimitofLiability/DisclaimerofWarranty:Whilethepublisherandauthorhaveusedtheirbest (cid:2) effortsinpreparingthisbook,theymakenorepresentationsorwarrantieswithrespecttothe (cid:2) accuracyorcompletenessofthecontentsofthisbookandspecificallydisclaimanyimplied warrantiesofmerchantabilityorfitnessforaparticularpurpose.Nowarrantymaybecreatedor extendedbysalesrepresentativesorwrittensalesmaterials.Theadviceandstrategiescontained hereinmaynotbesuitableforyoursituation.Youshouldconsultwithaprofessionalwhere appropriate.Neitherthepublishernorauthorshallbeliableforanylossofprofitoranyother commercialdamages,includingbutnotlimitedtospecial,incidental,consequential,orother damages. Forgeneralinformationonourotherproductsandservicesorfortechnicalsupport,please contactourCustomerCareDepartmentwithintheUnitedStatesat(800)762-2974,outsidethe UnitedStatesat(317)572-3993orfax(317)572-4002. Wileyalsopublishesitsbooksinavarietyofelectronicformats.Somecontentthatappearsin printmaynotbeavailableinelectronicformats.FormoreinformationaboutWileyproducts, visitourwebsiteatwww.wiley.com. LibraryofCongressCataloging-in-PublicationDataappliedfor: ISBN:9781119859369 CoverdesignbyWiley Coverimage©agsandrew/Shutterstock Setin9.5/12.5ptSTIXTwoTextbyStraive,Chennai,India 10 9 8 7 6 5 4 3 2 1 (cid:2) (cid:2) v Contents AuthorBiographies xiii Preface xv 1 Introduction 1 PreliminaryRemarks 1 History 6 References 7 (cid:2) (cid:2) 2 BasicTerms 9 AverageValues 9 AmplitudeDistribution 10 Autocorrelation 12 Cross-Correlation 15 NoiseSpectra 18 AutocorrelationFunctionandSpectralPowerDensity 19 Band-LimitedNoiseontheSpectrumAnalyzer 20 References 22 3 NoiseSources 23 ThermalNoise 23 NyquistFormulaandThermalRadiation 24 ValidityandExperimentalConfirmationoftheNyquistFormula 27 ThermalNoiseUnderExtremeConditions 28 ShotNoise 29 PlasmaNoise 33 CurrentNoiseofResistorsandContacts 34 TechnicalResistors 34 ResistorsConsistingofSemiconductorMaterial 36 ContactNoise 37 (cid:2) (cid:2) vi Contents Generation–RecombinationNoise 38 LFNoisefromTransistors 40 References 42 4 NoiseandLinearNetworks 45 NarrowbandNoise 45 CalculatingwithPhasors 45 NoiseSourcewithComplexInternalResistance 51 TheEquivalentNoiseBandwidth 52 NetworkComponentsatDifferentTemperatures 54 NoiseGeneratorandAttenuator 58 References 58 5 NonlinearNetworks 59 Mixing 59 Band-LimitedRFNoiseatInput 59 AmplitudeClipping 62 TheDetectorasaNonlinearNetwork 63 TheNoiseSpectrumBehindaQuadraticDetector 65 TheNoiseSpectrumBehindaLinearDetector 69 (cid:2) (cid:2) TheSensitivityLimit 70 NoisewithSignal 73 ThePhaseSensitiveRectifier 74 TraceAveraging 76 References 78 6 TheNoiseFactor 79 AmplifierandNoisePower 79 TheNoiseFactorF 80 CascadedAmplifiers 83 TheNoiseMeasureM 85 DefinitionsofGain 85 SourceandLoad 89 BroadbandandSpotNoiseFactor 91 NoiseFactorofaPassiveNetwork 92 AntennaTemperature 93 TheReferenceTemperatureT =290K 98 0 NoiseFactorandDetectionLimit 99 References 100 (cid:2) (cid:2) Contents vii 7 NoiseofLinearTwo-Ports 101 RepresentationofTwo-Ports 101 NoiseModelingUsingtheChainMatrix 102 References 108 8 CalculationMethodsforNoiseQuantities 109 NoiseVoltages,Currents,andSpectra 109 CalculatingwithCurrent,Voltage,andNoiseWaves 112 TheNoiseCorrelationMatrix 115 TheCorrelationMatrixofPassiveComponents 117 TheNoiseofSimplePassiveNetworks 119 TransformationofNoiseSourcesinDifferentNetwork Representations 128 CorrelationMatrixandIEEEElements 131 FET-LikeNetworkwiththeY-CorrelationMatrix 134 NoiseSourcesatInputwithABCDCorrelationMatrix 138 References 142 9 DiodesandBipolarTransistors 143 SemiconductorDiode 143 (cid:2) (cid:2) BipolarTransistor 145 Small-SignalEquivalentCircuit 147 HawkinsBJTNoiseModel 148 TwoApproachesfortheCollectorNoiseCurrentSource 155 BJTNoiseModelwithCorrelationMatrices 157 TheΠ-Model 157 TheT-ModelwithCorrelationMatrices 161 TransformationoftheY-SourcestotheInput 165 ModelingofaMicrowaveTransistorwithCorrelationMatrices 168 SimplestΠ-Model 174 ContourDiagram 177 TransistorintheCircuit 179 UsingtheContourDiagram 183 References 185 10 OperationalAmpliﬁer 187 OperationalAmplifierasCircuitElement 187 NoiseSourcesoftheOperationalAmplifier 188 Considerationof1/f Noise 193 (cid:2) (cid:2) viii Contents OperationalAmplifierasanActiveLow-PassFilter 195 References 198 11 FieldEffectTransistors 201 JFET 201 ModeofOperationoftheFET 201 TheChannelNoise 204 NoiseSourcesattheGate 205 TheCorrelation 206 TransformationtotheInput 206 SimpleApproximations 211 FieldEffectTransistorsfortheMicrowaveRange(MESFET, HFET) 214 ThePucelModel 215 ThePospieszalskimodel 218 DiscussionoftheResults 225 CriteriaforNoiseData 225 References 229 12 TheoryofNoiseMeasurement 231 (cid:2) (cid:2) MeasurementsofTwo-Ports 231 TheEquivalentNoiseResistance 234 VoltageandCurrentSource 235 VoltageandCurrentSourcewithCorrelation 237 3dBandY-Method 241 References 243 13 BasicsofMeasuringTechnique 245 PrinciplesoftheRF-Receiver 245 TheDetectionLimit 245 DiodeasRFReceiver(VideoDetector) 249 RFandMicrowaveRangeReceiver 254 DickeRadiometer 258 CorrelationRadiometerintheMicrowaveRange 261 NetworkAnalyzerasaNoiseMeasurementDevice 263 References 265 14 EquipmentandMeasurementMethods 267 NoiseMeasurementReceiver 267 SpectrumAnalyzer 269 TheY-Method 273 (cid:2)

A Guide to Noise in Microwave Circuits: Devices, Circuits and Measurement PDF

515 Pages·2021·35.934 MB·English

by Peter Heymann, Matthias Rudolph

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Author:	Peter Heymann, Matthias Rudolph
Publication Year:	2021
ISBN:	9781119859369
Pages:	515
Language:	English
File Size:	35.934
Format:	PDF
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