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The Physics of Si: O2 and its Interfaces. Proceedings of the International Topical Conference on the Physics of Si: O2 and Its Interfaces Held at the IBM Thomas J. Waston Research Center, Yorktown Heights, New York, March 22–24, 1978 PDF

493 Pages·1978·13.969 MB·English
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Download The Physics of Si: O2 and its Interfaces. Proceedings of the International Topical Conference on the Physics of Si: O2 and Its Interfaces Held at the IBM Thomas J. Waston Research Center, Yorktown Heights, New York, March 22–24, 1978 PDF Free - Full Version

by Sokrates T. Pantelides (Eds.)| 1978| 493 pages| 13.969| English

About The Physics of Si: O2 and its Interfaces. Proceedings of the International Topical Conference on the Physics of Si: O2 and Its Interfaces Held at the IBM Thomas J. Waston Research Center, Yorktown Heights, New York, March 22–24, 1978

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Author:Sokrates T. Pantelides (Eds.)
Publication Year:1978
Pages:493
Language:English
File Size:13.969
Format:PDF
Price:FREE
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