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About Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: the system on chip approach
This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits and systems in a single source. The book contains eleven chapters written by leading researchers world-wide. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of these areas. A complete range of circuit components are covered and test issues are also addressed from the SoC perspective. A must-have reference companion to researchers and engineers in mixed-signal testing, the book can also be used as a text for postgraduate and senior undergraduate students.
Detailed Information
| Author: | Y. Sun, Yichuang Sun |
|---|---|
| Publication Year: | 2007 |
| ISBN: | 9780863417450 |
| Pages: | 411 |
| Language: | English |
| File Size: | 3.271 |
| Format: | |
| Price: | FREE |
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