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About Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials
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Detailed Information
| Author: | Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert |
|---|---|
| Publication Year: | 2018 |
| Pages: | 339 |
| Language: | English |
| File Size: | 12.412 |
| Format: | |
| Price: | FREE |
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