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Safety regulations and naval class II : 23-24 November 2005

Royal Institution of Naval Architects
·383 Pages
·2005
·22.364 MB

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Electronics For You Express – Vol. 4, Issue 13, November 2024

Electronics For You Express
·84 Pages
·66 MB

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Secondary Ion Mass Spectrometry SIMS IV: Proceedings of the Fourth International Conference, Osaka, Japan, November 13–19, 1983

P. Sigmund (auth.), Professor Dr. A. Benninghoven, Professor Dr. J. Okano, Professor Dr. R. Shimizu, Dr. H. W. Werner (eds.)
·517 Pages
·1984
·12.652 MB

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