Top 1200 ion mihai editor PDF Book Page 39

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Secondary Ion Mass Spectrometry SIMS IV: Proceedings of the Fourth International Conference, Osaka, Japan, November 13–19, 1983

P. Sigmund (auth.), Professor Dr. A. Benninghoven, Professor Dr. J. Okano, Professor Dr. R. Shimizu, Dr. H. W. Werner (eds.)
·517 Pages
·1984
·12.652 MB

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Dynamic response of metals under high-intensity pulsed ion beam irradiation for surface modification

Zhu X.P., Zhang F.G., Tang Y., Xin J.P., Lei M.K.
·4 Pages
·0.457 MB

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Microscopy of Materials: Modern Imaging Methods Using Electron, X-ray and Ion Beams

D. K. Bowen, C. R. Hall (auth.)
·313 Pages
·1975
·32.962 MB

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